• Journal of IKEEE
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• v.23 no.1
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• pp.326-329
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• 2019

Gallium nitride(GaN) has been a superior candidate for the next generation power electronics. As GaN-on-Si substrate technology is mature, there has been new demand for monolithic integration of GaN technology with Si CMOS devices. In this work, (110)Si CMOS process was developed and the fabricated devices were evaluated in order to confirm the feasibility of utilizing domestic foundry facility for monolithic integration of Si CMOS and GaN power devices.

• Korean Journal of Crystallography
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• v.6 no.1
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• pp.49-55
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• 1995

The oriented islands of cubic galium nitride are grown on the (0001) surface of hexagonal GaN epitaxial films by halide vapour phase epitaxial process. The mutual orientation of cubic β-GaN and hexagonal α-GaN phase was observed as : [110](111) β-GaN//[1120](0001) α-GaN. Trigonally faced islands of β-GaN occupy the twined positions in relation to (111) plane in parallel to the film surface. The band gap value for β-GaN determuned from photo and local catchodoluminescent measurments is estimated to be 3.18±0.30eV at room temperature.

• Journal of the Korean Vacuum Society
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• v.17 no.1
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• pp.40-45
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• 2008

We present the effect of Ga-doping on the electrical, structural and optical properties of ZnO layers with a thickness of ${\sim}500nm$ deposited on glass substrates. Polycrystalline ZnO and Ga-doped ZnO (GZO) layers were deposited by radio frequency (rf) magnetron sputtering at room temperature. Based on the X-ray diffraction (XRD) and transmission electron microscopy (TEM) data, the crystalline quality of Ga-doped ZnO film was improved and GZO film has a preferred orientation along with the (002) crystal direction. The transmittance of the GZO film was enhanced by 10% in the visible region from that of the ZnO film. From photoluminescence (PL) data, the ratio of intensity of near band edge (NBE) emission to deep level (DL) emission was as high as 2.65:1 and 1.27:1 in the GZO and ZnO films, respectively. The res istivities of GZO and ZnO films were measured to be 1.27 and 1.61 $\Omega{\cdot}cm$, respectively. The carrier concentrations of ZnO and GZO film were approximately 1018 and 1020 $cm^2$/Vs, respectively. Based on our experimental results, the Ga-doping improves the electrical, structural and optical properties of ZnO film with potential application.

• Journal of the Korean Electrochemical Society
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• v.12 no.2
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• pp.189-195
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• 2009

$\beta-Ga_{2}O_{3}$ nanorods were synthesized by chemical vapor deposition method using nickel-oxide nanoparticle as a catalyst and gallium metal powder as a source material. The average diameter of nanorods was around 160 nm and the average length was $4{\mu}m$. Also, we confirmed that the synthesis of nanorods follows the vapor-solid growth mechanism. From the results of X-ray diffraction and HR-TEM observation, it can be found that the synthesized nanorods consisted of a typical core-shell structure with single-crystalline $\beta-Ga_{2}O_{3}$ core with a monoclinic crystal structure and an outer amorphous gallium oxide layer. Li/$\beta-Ga_{2}O_{3}$ nanorods cell delivered capacity of 867 mAh/g-$\beta-Ga_{2}O_{3}$ at first discharge. Although the Li/$\beta-Ga_{2}O_{3}$ nanorods cell showed low coulombic efficiency at first cycle, the cell exhibited stable cycle life property after fifth cycle.

• Electrical & Electronic Materials
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• v.7 no.6
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• pp.490-495
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• 1994

We investigated photoreflectance of semi-insulating GaAs with respect to modulation sources, that is, modulation beam intensity, modulation frequency, temperature, and thickness of sample. PR spectra by each modulation source turned out to be signals of low electric field third differential, and band gap values of sample were fitted by least square root method for Aspnes' theoretical equation.

• Proceedings of the KSME Conference
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• 2007.05a
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• pp.518-520
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• 2007

Since all essential property of semiconductor materials are structure-sensitive, the understanding of the deformation mechanism and the deformed structure which can be formed in the nanometer-scale devices is very crucial. To investigate the deformation mechanism and the corresponding structures, nanometer-scale contact loading simulations are carried out using molecular dynamics in silicon and gallium-arsenide.

• Proceedings of the Korean Society of Marine Engineers Conference
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• 2005.06a
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• pp.401-405
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• 2005

This paper proposed a miniaturization passive element employing the multiple microstrip line. As a result of this method, we realized the transmission line miniaturized. The applying structure designed and evaluated a power divider on GaAS MMIC circuit. It draws a plan in a center Frequency as the observation could do good characteristic.

• Proceedings of the Korean Institute of Communication Sciences Conference
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• 1991.10a
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• pp.210-214
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• 1991

We briefly compared GaAs MESFET model and s셔요 on the method of parameter extraction for PSPICE simulation. The parameter determined from above method were substituded into a commercial version of PSPICE which supports the hyperbolic tangentent model. The result of simulation is reasonably good at the lower VGS and is significantly fitted overall by optimization.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2004.05a
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• pp.202-202
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• 2004

화합물 반도체는 초고속, 초고주파 디바이스에 적합한 재료인 갈큠비소(GaAs), 인듐-인산듐(InP) 등 2 개 이상의 원소로 구성되어 있고, 실리콘에 비해 결정내의 빠른 전자이동속도와 발광성, 고속동작, 고주파특성, 내열특성을 지니고 있어 발광 소자 (LED)와 이동통신(RE)소자의 개발 등에 다양하게 이용되고 있다. 이와 같이 화합물 반도체는 고부가가치의 첨단산업 부품들로 적용되는 만큼 생산제조 공정에 해당하는 연마, 본딩, 디본딩에 관한 방법과 기술에 대한 연구가 꾸준히 진행되고 있다.(중략)

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.296-296
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• 2011

기존에 디스플레이 적용을 위한 TFT의 채널 영역에 널리 이용되고 있는 산화물 반도체의 밴드갭은 약 3.3eV이다. 현재 밴드갭을 증가시키기 위한 연구가 널리 진행 중이며, Mg등의 도핑을 통해 증가시키는 방법이 있다. 기본 sputtering 공정을 이용한 Eg 증가에 대한 연구가 없지만, 이번 연구에서는 가스비, 파워 등의 기본 공정 가변을 통하여 밴드갭 증가와 이를 이용한 광학적 및 전기적 특성을 비교 분석하였다.