• Journal of the Korean Solar Energy Society
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• v.37 no.5
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• pp.65-75
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• 2017

In this study, the change of heat loss due to the degree of deterioration of the XPS insulation in KEPCO's office buildings is analyzed. The acceleration aging test of the XPS insulation was carried out according to the test method A of KS M ISO 11561: 2009. The performance of the insulation was analyzed by applying it to the three - dimensional steady state heat transfer analysis program. The acceleration aging test of the XPS insulation, show that the thermal resistance performance decreased by 1.44% at the A regional headquarters, 0.85% at the B regional headquarters, 6.41% at the C branch office, 7.76% at the D regional headquarters, 8.51% at the E branch office, and by 8.54% at the F branch office respectively. Using simulation, we determined that the thermal resistance value of E branch office decreased by 8.04%, while its heat loss increased by 8.52%. At A regional headquarters, the thermal resistance decreased by 1.38%, and the heat loss increased by 1.51%. At D regional headquarters, these value are 6.82% and 7.17%, respectively.

• Journal of KIISE:Computer Systems and Theory
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• v.34 no.1
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• pp.10-18
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• 2007

Mobile communication devices such as PDAs, cellular phones, etc., need to perform several kinds of computation-intensive functions including H.264 encoding/decoding and 3D graphics processing. In this paper, new reconfigurable architecture is described, which can perform either motion estimation for H.264 or rendering for 3D graphics. The proposed motion estimation techniques use new efficient SAD computation ordering, DAU, and FDVS algorithms. The new approach can reduce the computation by 70% on the average than that of JM 8.2, without affecting the quality. In 3D rendering, midline traversal algorithm is used for parallel processing to increase throughput. Memories are partitioned into 8 blocks so that 2.4Mbits (47%) of memory is shared and selective power shutdown is possible during motion estimation and 3D graphics rendering. Processing elements are also shared to further reduce the chip area by 7%.

• Journal of Conservation Science
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• v.37 no.6
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• pp.648-658
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• 2021

In this study, we aimed to analyze the chemical changes that occur in Korean paper in an accelerated deterioration environment of 105℃. We selected the Korean paper produced with different types of cooking agents (plant lye, Na₂CO₃) and during different manufacturing seasons (winter, summer). The degree of deterioration of the Korean paper was confirmed by measuring the brightness, yellowness, and pH level, and the degree of change in each vibrational region of cellulose as deterioration progressed through infrared (FT-IR) spectroscopy. The FT-IR analysis showed that, as deterioration progressed, the absorbance of the amorphous region in cellulose decreased, whereas the absorbance of the crystalline region slightly increased. X-Ray diffraction (XRD) analysis and Raman spectroscopy were performed to verify the changes in the crystalline and amorphous regions in cellulose indicated by the FT-IR results. Furthermore, the crystallinity index (CI) was calculated; it showed a slight increase after deterioration; therefore, CI was confirmed to follow the same trend as that observed for absorbance in the FT-IR results. In addition, as a result of Raman spectroscopic analysis, the degree of decomposition of the amorphous region in the cellulose under the manufacturing conditions was confirmed by the fluorescence measured after the deterioration.

• Proceedings of the KIEE Conference
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• 2008.05a
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• pp.129-130
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• 2008

송전선로에 설취된 애자들은 지속적인 전기적 기계적 스트레스에 노출되어 있기 때문에 여러 환경적 요인으로 인해 애자 표변의 열화가 가속된다. 이와 같은 애자의 표면 열화는 dryband를 형성하게 되고 지속적인 애자 표면상의 dryband와 누설 전류 증가의 상호 작용은 애자의 섬락를 일으키는 원인이 된다.[1][2] 이러한 연구의 결과 고전압용 애자로 유입되는 누설 전류는 애자 열화의 정도를 평가할 수 있는 매우 중요한 parameter임을 알 수 있다. 따라서 고전압용 애자의 누설전류를 분석하고 취득하여 애자의 열화 평가 및 이로 인해 발생할 수 있는 결함 애자의 검출에 대한 연구가 절실히 요구되고 있다, 본 논문에서는 고전압용 애자 중 자기애자의 누설전류 특성을 조사하기 위해 자체 제작한 실험 챔버, AC 내전압기, 전류센서r, 오실로스코프, PC등으로 구성된 실험 시스템을 구축하였고, 데이터 분석을 위한 S/W로서 LabView를 사용하였다. 그에 따른 실험 결과로서 정상 애자련과 결함 애자를 포함한 애자련의 누설전류 데이터를 취득하여 본 연구에서 제시한 알고리즘을 통해 분석함으로써 정상 애자 내의 결함 애자 포함 여부를 판별할 수 있었다.

• Korean Chemical Engineering Research
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• v.52 no.5
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• pp.558-563
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• 2014

To study the effects of fabrication methods on the performance and durability of polymer electrolyte membrane fuel cells (PEMFCs), membrane-electrode assemblies (MEAs) were fabricated using a Dr blade method, a spray method, screen print method and screen print + spray method. The performance of single cells assembled with the prepared MEAs were initially measured and compared. Electrode accelerated stress testing (AST) involving a potentiostatic step-wave with 10 s at 0.6 V followed by 30 s at 0.9 V was applied to test durability of MEAs. Before and after 6,000cycles of the AST, I-V curves, impedance spectra, cyclic voltammograms, linear sweep voltammetry (LSV) and transmission electron microscope (TEM) were measured. Under the operating conditions, the Dr Blde MEA exhibited the highest initial performance. After electrode accelerated stress testing, screen print + spray MEA showed lowest degradation rate.

• Journal of the Korea Institute of Military Science and Technology
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• v.21 no.2
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• pp.173-179
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• 2018

Estimating reliability of a non-repairable system using the degradation data, variance assumption such as homogeneity (constant) or heteroscedasticity (time-variant) could affect accuracy of reliability estimation. This paper showed reliability estimation and comparison results under normal conditions using accelerated degradation data obtained from destructive measurements, according to variance assumption of the data at each measurement time. Degradation data from three accelerated conditions with stress factors of temperature and humidity were used to estimate reliability. The $B_{10}$ lifetime was estimated as 1243.8 years by constant variance assumption, and 18.9 years by time-variant variance. And variance assumption provided different analysis results of important stresses to reliability. Thus, accurate assumption of variance at each measurement time is required when estimating reliability using degradation data of a non-repairable system.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.4 no.4
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• pp.793-801
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• 2000

This paper presents the effect of lightning impulse current on ZnO varistors(390[V], 6.5[kA]) used in low-voltage AC mains as a protective device against transient overvoltages. The electrical characteristics of ZnO varistors are deteriorated by overtime impulse current, and a deteriorated ZnO varistor is brought to a thermal runaway and finally destroyed even in normal operating voltage. Therefore, it is important to estimate the changes of the electrical characteristics of ZnO varistors. A lightning impulse current standardized in IEC 61000-4-5 is applied to the varistors to accelerate deterioration, and the energy applied to the varistor at each time is about 12 [J]. In the experiment, various parameters such as leakage current, reference voltage are measured with the number of applied impulse current. Also, micro-structure changes of the varistors after applying the lightning impulse current of 200 times are compared. The electrical characteristics of the varistors are degraded by overtime impulse current, showing increase in leakage current and decrease in reference voltage.

• Journal of the Korean Society for Nondestructive Testing
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• v.30 no.4
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• pp.295-301
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• 2010

Flow accelerated corrosion(FAC) of carbon steel pipes in nuclear power plants has been known as one of the major degradation mechanisms. It could have bad influence on the plant reliability and safety. Also detection of FAC is a significant cost to the nuclear power plant because of the need to remove and replace insulation. Recently, the interest of the guided wave testing(GWT) has grown because it allows long range inspection without removing insulation of the pipe except at the probe position. If GWT can be applied to detection of FAC damages, it will can significantly reduce the cost for the inspection of the pipes. The objective of this study was to determine the capability of GWT to identify location of FAC damages. In this paper, three kinds of techniques were used to measure the amplitude ratio between the first and the second welds at the elbow area of mock-ups that contain real FAC damages. As a result, optimal inspection technique and minimum detectability to detect FAC damages drew a conclusion.

• Korean Chemical Engineering Research
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• v.47 no.4
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• pp.441-445
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• 2009

Effect of temperature on membrane degradation in PEMFCs was studied. After cell operation at different temperatures($60{\sim}90^{\circ}C$) under accelerating degradation conditions(OCV, anode dry, cathode RH 65%) for 144 h, cell performance decreased from 12 to 35%. The results of FER in effluent water showed that this decrease in cell performance was caused by membrane degradation by the attack of $H_2O_2$ or oxygen radicals(${\cdot}OH$, $HO_2{\cdot}$) and that resulted in increase in gas crossover for radical formation. Radical formation on the electrode was confirmed by ESR. Activation energy of 66.2 kJ/mol was obtained by Arrhenius plot used to analyze the effect of temperature on membrane degradation. Increase of cell temperature enhanced gas crossover rate, radical formation rate and membrane degradation rate.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.16 no.4
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• pp.180-186
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• 2023

Positive bias temperature instability (PBTI) degradation of n⁺ and p⁺ poly-Si gate high-voltage(HV) SiO2 dielectric nMOSFETs was investigated. Unlike the expectation that degradation of n⁺/nMOSFET will be greater than p⁺/nMOSFET owing to the oxide electric field caused by the gate material difference, the magnitude of the PBTI degradation was greater for the p⁺/nMOSFET than for the n⁺/nMOSFET. To analyze the cause, the interface state and oxide charge were extracted for each case, respectively. Also, the carrier injection and trapping mechanism were analyzed using the carrier separation method. As a result, it has been verified that hole injection and trapping by the p⁺ poly-Si gate accelerates the degradation of p⁺/nMOSFET. The carrier injection and trapping processes of the n⁺ and p⁺ poly-Si gate high-voltage nMOSFETs in PBTI are detailed in this paper.