• 한국응용과학기술학회지
• /
• 제24권2호
• /
• pp.174-181
• /
• 2007

본 연구에서는 졸-겔 공법을 이용하여 가스 차단 특성을 갖는 $SiO_2/EVOH$(에틸렌 비닐알콜 공중합체) 하이브리드 물질을 제조하였다. 제조된 여러 조성의 하이브리드 졸을 표면 처리한 biaxially oriented polypropylene (BOPP) 기지재에 스핀 코팅 방식을 이용하여 코팅하였다. X선 회절 및 DSC 분석에 의해 하이브리드 내의 EVOH 상과 실리카 상 사이의 결합에 따른 결정화 거동의 변화를 조사하였다. 또한 $SiO_2/EVOH$ 하이브리드 겔의 모폴로지 관찰을 통하여, 100nm 이하의 실리카 입자들이 균열하게 분산된 매우 치밀한 상 미세구조를 갖는 하이브리드 물질을 제조하기 위해 필요한 Tetraethylorthosilicate (TEOS) 무기전구체의 최적 함량이 존재함을 알 수 있었다. 첨가된 TEOS 함량이 최적 함량보다 낮거나 높은 경우에는 큰 도메인의 입자 클러스터들이 형성되어 매우 불안정한 모폴로지를 나타내는 상분리 현상이 관찰되었다. 이러한 모폴로지 결과는 하이브리드 코팅 필름의 산소 투과도의 변화 결과와 일치하였는데, TEOS 함량이 0.01 - 0.02mol로 첨가되어 제조된 하이브리드로 코팅된 필름의 경우 매우 우수한 산소 차단 특성을 나타냈으며, 0.04mol 이상으로 첨가되었을 때는 상 분리 및 미세 균열 발생으로 인하여 그 차단 특성이 급격하게 감소하는 것으로 나타났다.

• 한국전기전자재료학회논문지
• /
• 제21권6호
• /
• pp.509-516
• /
• 2008

Multi-layer circuit card for semiconductor inspection was fabricated by LTCC technology. After a proper impedance design without electrical interference, ceramic tapes with the composition of $CaO-Al_2O_3-SiO_2-B_2O_3$ glass and $Al_2O_3$ were prepared. The electrode with silver paste printed on the tape. Printed ceramic sheets were then laminated and sintered. Densities and dielectric properties were measured. The microstructure, fracture surface of the region of via and matching state of substrate-electrode were observed. The durability of plated outside electrode were examined by hardness and scratch test.

• 한국결정성장학회지
• /
• 제30권2호
• /
• pp.66-72
• /
• 2020

본 연구에서는 CaO-Al₂O₃-SiO₂(CAS) 계 유리 벌크와 유리 분체를 알루미나 소결체 표면에 스프레이 코팅막 적용 시 내플라즈마 특성에 대하여 비교하였다. CAS 유리 벌크와 유리 코팅막을 CF₄/O₂/Ar 플라즈마 가스에 노출시켰을 때의 식각율과 표면의 미세구조 분석을 통해 내플라즈마 특성을 확인하였다. CAS 유리 소성막은 유리 벌크와 비교하여 에칭속도가 최대 25배 빠른 것을 확인하였다. 유리 소성막의 표면 조도 값과 식각율 간의 통계학적으로 높은 상관성을 도출하였고, 이에 따라 소성막의 높은 표면조도가 빠른 식각을 유발하는 것으로 판단하였다. 그리고 유리 소성막은 Ca 성분의 함량이 적고, Si 함량이 많은 크리스토발라이트(cristobalite) 결정의 형성으로 인하여 Ca과 Ca 불화물에 의한 내플라즈마 효과가 감소한 것으로 판단된다. 따라서 CAS 유리 소성막은 유리 벌크에 비해 낮은 내플라즈마 특성을 갖는 것으로 판단된다.

• Transactions on Electrical and Electronic Materials
• /
• 제4권2호
• /
• pp.20-23
• /
• 2003

Piezoelectric powder with the composition of PbTiO$_3$-PbZrO$_3$-Pb(Mn$\_$1/3/Nb$\_$2/3/)O$_3$ and small particle size of 0.3 $\mu\textrm{m}$ was investigated for low-temperature firing of PZT thick films. PbTiO$_3$-PbZrO$_3$-Pb(Mn$\_$1/3/Nb$\_$2/3)O$_3$ ceramics showed dense microstructure and superior piezoelectric properties, electromechanical coupling factor (k$\_$p/) of 0.501 and piezoelectric constant (d$\_$33/) of 224. The PZT paste was made of the powder and organic vehicles, and screen-printed on Pt(450nm)/YSZ(110nm)/SiO$_2$(300nm)/Si substrates and fired at 800∼900$^{\circ}C$. Any interface reaction between the PZT thick film and the bottom electrode was not observed in the PZT thick films. The PZT thick film fired at 800$^{\circ}C$ showed moderate electrical properties, the remanent polarization(p$\_$r/) of 16.0 ${\mu}$C/$\textrm{cm}^2$, the coercive field(E$\_$c/) of 36.7 ㎸/cm, and dielectric constant ($\varepsilon$$\_$r/) of 531. Low-temperature sinterable piezoelectric composition and high activity of fine particles reduced the sintering temperature of the thick film. This PZT thick film could be utilized for piezoelectric microactuators or microsensors that require Si micromachining technology.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2002년도 춘계학술대회 논문집 센서 박막재료 반도체재료 기술교육
• /
• pp.78-81
• /
• 2002

Ferroelectric thin film is a very attractive material for the tunable microwave device applications such as electronically tunable mixers, delay lines, filters and phase shifters. Thin films of $Pb_{x}Sr_{1-x}TiO3(PST)$ were fabricated onto Pt/Ti/SiO2/Si substrate by the sol-gel method. We have investigated the structural and dielectric properties of PST(50/50) thin films for tunable microwave device applications. The PST thin films show typical polycrystalline structure with a dense microstructure without secondary phase formation. Dielectric properties of PST films are strongly dependent on annealing temperature. The dielectric constants, loss and tunability of the PST (50/50) thin films were 404, 0.023 and 51.73 %, respectively.

• 대한전기학회논문지:전기물성ㆍ응용부문C
• /
• 제50권10호
• /
• pp.504-508
• /
• 2001

The$(Sr_{1-x}Ca_x)TiO_3$(SCT) thin films are deposited on Pt-coated electrode $(Pt-TiN /SiO_2Si)$ using RF sputtering method at various deposition temperature. The crystallinity of thin films was increased with increased of deposition temperature n the temperature range of 200~500 $[^{\circ}C]$. The capacitance changes almost linearly in temperature ranges of -80~+90$[^{\circ}C]$. All SCT thin films used in the study the phenomena of dielectric relaxation with the increase of frequency, and the relaxation frequency is observed above 200[kHz]. V-I characteristics of SCT thin films show the increasing leakage current with the increases of deposition temperature.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 1998년도 춘계학술대회 논문집
• /
• pp.379-382
• /
• 1998

(Ba, Sr)TiO$_3$[BST] thin films were fabricated on Pt/SiO$_2$/Si substrate by RF sputtering technique. The Mic개structure, dielectric and electrical properties of BST thin films were investigated with sputtering pressure. Dielectric constant and dielectric loss of the deposited thin film at sputtering pressure of 5 mTorr were about 91 and 1.9(%), respectively. Increasing sputtering pressure, leakage current was increased. It was found that leakage current of BST thin films was depended on the sputtering pressure.

• 전자공학회논문지A
• /
• 제30A권8호
• /
• pp.34-41
• /
• 1993

Effect of high temperature annealing conditions on Ta$_{2}O_{5}$ thin films was investigated. Ta$_{2}O_{5}$ thin films were deposited on P-type silicon substrates by plasma-enhanced chemical vapor deposition (PECVD) using tantalum ethylate. Ta(C$_{2}H_{5}O)_{5}$, and nitrous oxide. N$_{2}$O. The microstructure changed from amorphous to polycrystalline above 700.deg. C annealing temperature. The refractive index, dielectric onstant and leakage current of the film increased as annealing temperature increased. However, annealing in oxygen ambient reduced leakage currents and dielectric constant due to the formation of interfacial SiO$_{2}$ layer. By optimizing annealing temperature and ambient, leakage current lower than 10$^{-8}$ A/cm$^{2}$ and maximum capacitance of 9 fF/${\mu}m^{2}$ could be obtained.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2000년도 추계학술대회 논문집
• /
• pp.225-228
• /
• 2000

Addition effects of metal oxide on the characteristics of infrared radiator of porous cordierite have been investigated. The porosity was increased with adding the graphite for 2MgO $.$ 2A1$_2$O$_3$$.$5SiO$_2$. The microstructure and the spectral emissivity were investigated as a function of metal oxide additives. The prosity and the emissivity were decreased with increasing amounts of CuO additives. The prosity and the emissivity were increased with increasing amounts of CoO, MnO$_2$ additives. The infrared radiator of cordierite system which spectral emissivity was 0.927 and 0.928 at from 5$\mu\textrm{m}$ to 20$\mu\textrm{m}$ wavelength as a 9wt% of CoO and MnO$_2$ additives.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2000년도 하계학술대회 논문집
• /
• pp.94-98
• /
• 2000

Polycrystalline SBTN ferroelectric thin films were prepared by sol-gel method with various Nb mole ratios on Pt/ $SiO_2$/Si (100) substrates. The films were annealed at different temperatures and characterized in terms of phase and microstructure. Relatively a well saturated hysteresis pattern was obtained at x =0.2 in S $r_{0.8}$B $i_{2.3}$(T $a_{1-x}$ N $b_{x}$)$_2$ $O_{9+}$$\alpha$/ thin films. At an applied voltage of 5V, the dielectric constant ($\varepsilon$$_{r}$) and dissipation factor (tan $\delta$) of typical S $r_{0.8}$B $i_{2.3}$(T $a_{1-x}$ N $b_{x}$)$_2$ $O_{9+}$$\alpha$/ thin film (x=0.2) were about 236.2 and 0.034. Measured remanent polarization (2Pr) and coercive field (Ec) were 4.28C/c $m_2$, and 38.88kv/cm respectively. No fatigue was observed up to 6$\times$10$_{10}$ switching cycles at 5V and the normalized polarization reduced by a factor of only 4%.%. 4%.%. 4%.%.%.%.%.