• Journal of Korean Institute of Industrial Engineers
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• v.38 no.4
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• pp.237-243
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• 2012

This paper proposes quantitative investment strategies for KOSPI200 index futures using VKOSPI and control chart. Stochastic control chart is employed to decide when to take a position as well as what position out of long and short should be taken by monitoring whether VKOSPI or difference of VKOSPI touches the control limit lines. The strategies include 4 approaches, which are traditional control chart and 2-Area control chart coupled with VKOSPI and its difference, respectively. Computational experiments using real KOSPI200 futures index for recent 3 years are conducted to show the excellence of the proposed investment strategies under control chart framework.

• Journal of Korean Society for Quality Management
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• v.36 no.3
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• pp.34-44
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• 2008

This research proposes a design method based on the statistical characteristics of the Shewhart control chart incorporated with 2 of 2 and 2 of 3 runs rules respectively. A Markov chain approach is employed in order to calculate the in-control and out-of-control average run lengths(ARL). Two different control limit coefficients for the Shewhart scheme and the runs rule scheme are derived simultaneously to minimize the out-of-control average run length subject to the reasonable in-control average run length. Numerical examples show that the statistical performance of the hybrid control scheme are superior to that of the original Shewhart control chart.

• Journal of the Korean Data and Information Science Society
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• v.15 no.2
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• pp.431-439
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• 2004

In this paper, we present an effective method for process control using the Demerit-EWMA control chart in the process where nonconforming units or nonconformities are occurred by various types. We compare performance of Demerit control chart, Demerit-CUSUM control chart and Demerit-EWMA control chart based on the average run length(ARL).

• Communications for Statistical Applications and Methods
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• v.5 no.2
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• pp.373-381
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• 1998

In this paper a new control chart which accounts for correlation between process subgroups will be proposed. We consider the case where the process fluctuations are autocorrelated by a stationary AR(1) time series and where n($\geq1$) items are sampled from the process at each sampling time. A simulation study is presented and shows that for correlated subgroups, the proposed control chart makes a significant improvement over the traditionally employed X-bar chart which ignores subgroup correlations. Finally, we illustrate the proposed chart by comparing the standardized residuals and X-bar chart on a data set of motor shaft diameters.

• Industrial Engineering and Management Systems
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• v.7 no.2
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• pp.101-112
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• 2008

As charts to monitor the process fraction defectives, P, in the high-yield processes, Mishima et al. (2002) discussed a synthetic chart, the Synthetic CS chart, which integrates the CS (Confirmation Sample)$_{CCC(\text{Cumulative Count of Conforming})-r}$ chart and the CCC-r chart. The Synthetic CS chart is designed to monitor quality characteristics in real-time. Recently, Kotani et al. (2005) presented the EWMA (Exponentially Weighted Moving-Average)$_{CCC-r}$ chart, which considers combining the quality characteristics monitored in the past with one monitored in real-time. In this paper, we present an alternative chart that is more superior to the $EWMA_{CCC-r}$ chart. It is an integration of the $EWMA_{CCC-r}$ chart and the CCC-r chart. In using the proposed chart, the quality characteristic is initially judged as either the in-control state or the out-of-control state, using the lower and upper control limits of the $EWMA_{CCC-r}$ chart. If the process is not judged as the in-control state by the $EWMA_{CCC-r}$ chart, the process is successively judged, using the $EWMA_{CCC-r}$ chart. We compare the ANOS (Average Number of Observations to Signal) of the proposed chart with those of the $EWMA_{CCC-r}$ chart and the Synthetic CS chart. From the numerical experiments, with the small size of inspection items, the proposed chart is the most sensitive to detect especially the small shifts in P among other charts.

• Asia-Pacific Journal of Business Venturing and Entrepreneurship
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• v.7 no.2
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• pp.151-156
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• 2012

In this paper, we gave 3 suitable modified control chart at the same time shows. First control chart is plot analysis control chart by sampling data, Second control chart is including Upper Spec and Lower Spec in first control chart. Third control chart is including target value and new calculated upper/lower control line by using known average and standard deviation of long term data. If 3 control charts are seen at the same time, there is advantage that can see problem of process at a look. We hope this method proposed in this treatise give many help in spot.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.33 no.2
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• pp.9-17
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• 2010

Complex products may present more than one type of defects and these defects are not always of equal severity. These defects are classified according to their seriousness and effect on product quality and performance. So, demerit systems are very effective systems to monitor the different types of defects. Recently, Kang et al.(2009) proposed the revised Demerit-CUSUM for the evaluation of the Demerit-CUSUM control chart performance exactly. In this paper, we present an advanced Demerit control chart using the double EWMA technique. The double EWMA technique is very efficient and strong method for process control where defects and nonconformities occur with various defect types. Moreover, we compare exact performance of Demerit-CUSUM, Demerit-EWMA and Demerit-DEWMA control chart according to changing sample size or mean shifts magnitude. By the result, we confirm that the performance of Demerit-DEWMA control chart is more than the performance of the Demerit-CUSUM and Demerit-EWMA control chart.

• Journal of Korean Society for Quality Management
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• v.32 no.4
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• pp.252-264
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• 2004

Variable sampling Interval (VSI) control charts vary the sampling interval according to value of the control statistic while the sample size is fixed. It is known that control charts with 2-state VSI scheme, which uses only two sampling intervals, give good statistical properties. Variable sample size (VSS) control charts vary the sample size according to value of the control statistic while the sampling interval is fixed. In the VSS scheme no optimal results are known for the number of sample sizes. It is also known that the variable sampling rate (VSR) $\bar{X}$ control chart with 2-state VSS and 2-state VSI scheme leads to large improvements In performance over the fixed sampling rate (FSR) $\bar{X}$ chart, but the optimal number of states for sample size Is not known. In this paper, the VSR Χ charts with multi-state VSS and 2-state VSI scheme are designed and compared to 2-state VSS and 2-state VSI scheme. The multi-state VSS scheme is considered to, achieve an additional improvement by switching from the 2-state VSS scheme. On the other hand, the multi-state VSI scheme is not considered because the 2-state scheme is known to be optimal. The 3-state VSS scheme improves substantially the sensitivity of the $\bar{X}$ chart especially for small and moderate mean shifts.

• Korean Management Science Review
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• v.31 no.3
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• pp.27-39
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• 2014

We derive a generalized statistic form of Q control chart, which is especially suitable for short run productions and start-up processes, for the detection of process mean shifts. The generalization means that the derived control chart statistic concurrently uses within lot variability and between lot variability to explain the process variability. The latter variability source is noticeably prevalent in lot type production processes including semiconductor wafer fabrications. We first obtain the generalized Q control chart statistic when both the process mean and process variance are unknown, which represents the case of implementing statistical process control charting for short run productions and start-up processes. Also, we provide the corresponding generalized Q control chart statistics for the rest of three cases of previous Q control chart statistics : (1) both the process mean and process variance are known (2) only the process mean is unknown and (3) only the process variance is unknown.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.23 no.56
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• pp.83-92
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• 2000

This paper presents a study on control schemes for gradual increases (drifts) in a process variance. A new control chart, the Drifting Variance Control Chart (DVCC) is designed using Likelihood Ratio Test (LRT), and the ARL performance of the chart is evaluated for different subgroup sizes. The performance of this chart is then compared to some of the popular control schemes for the process dispersion, like the Shewhart S$^2$chart, the CUSUM chart and the EWMA chart. Results are presented and discussed. Also included is a sensitivity analysis that investigates how the DVCC performs when applied to a stepped change in process variance.