• Title/Summary/Keyword: $Bi_O_3$

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Comparison of microstructures in T1-1223/Ag tapes with different chemical compositions and J$_c$'s

  • Jeong, D.Y.;Kim, H.K.;Lee, H.Y.;Cha, M.K.;Ha, H.S.;Oh, S.S.;Tsuruta, T.;Horiuchi, S.
    • 한국초전도학회:학술대회논문집
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    • v.9
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    • pp.280-290
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    • 1999
  • The microstructures of a Tl$_{0.8}Pb_{0.2}Bi_{0.2}Sr_{1.6}Ca_2Cu_3O_{9+{\delta}}$/Ag tape (tape I ) with J$_c$ of 17,600 A/cm$^2$ at 77 K and 0 T and three Tl$_{0.8}Pb_{0.2}Bi_{0.2}Sr_{1.8}Ba_{0.2}Ca_{2.2}Cu_3O_{9+{\delta}}$/Ag tapes with J$_c$'s of 9,300 (tape II), 16,700 (tape III) and 25,200 A/cm$^2$ (tape IV)prepared using the powder-in-tube method and an in-situ reaction method, were investigated using scanning electron microscopy and high-resolution transmission electron microscopy, and compared each other. ln the tape preparation, an intermediate rolling process was incorporated during final heat-treatment for the last tape, but not for the rest of the tapes. The microstructural analysis revealed clear differences in grain-texturing, crystallographic defects and impurity phases, depending on the chemical composition of the tape. Tendency of directional grain-alignment increased in an order of tapes I, II III and IV. In tape IV, T1-1223 grains are textured, at least in local regions. In crystallographic defects, while stacking faults were prevalent in the former composition, dislocations and voids were frequently observed in the latter. Also impurity phases were appeared to be more abundant in the former than in the latter. The relationship between 1,and the microstructure in the tapes was attempted to explain in a term of grain-linking.

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Suppression of Dielectric Loss at High Temperature in (Bi1/2Na1/2)TiO3 Ceramic by Controlling A-site Cation Deficiency and Heat Treatment

  • Lee, Ju-Hyeon;Lee, Geon-Ju;Pham, Thuy-Linh;Lee, Jong-Sook;Jo, Wook
    • Journal of Sensor Science and Technology
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    • v.29 no.1
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    • pp.7-13
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    • 2020
  • Dielectric capacitors are integral components in electronic devices that protect the electric circuit by providing modulated steady voltage. Explosive growth of the electric automobile market has resulted in an increasing demand for dielectric capacitors that can operate at temperatures as high as 400 ℃. To surpass the operation temperature limit of currently available commercial capacitors that operate in temperatures up to 125 ℃, Bi1/2Na1/2TiO3 (BNT), which has a large temperature-insensitive dielectric response with a maximum dielectric permittivity temperature of 300 ℃, was selected. By introducing an intentional A-site cation deficiency and post-heat treatment, we successfully manage to control the dielectric properties of BNT to use it for high-temperature applications. The key feature of this new BNT is remarkable reduction in dielectric loss (0.36 to 0.018) at high temperature (300 ℃). Structural, dielectric, and electrical properties of this newly developed BNT were systematically investigated to understand the underlying mechanism.

Microwave Dielectric Properties of CaZr(BO3)2 Ceramics (CaZr(BO3)2 세라믹스의 마이크로웨이브 유전특성)

  • Nam, Myung-Hwa;Kim, Hyo-Tae;Kim, Jong-Hee;Nahm, Sahn
    • Journal of the Korean Ceramic Society
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    • v.44 no.5 s.300
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    • pp.173-178
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    • 2007
  • The microstructure and microwave dielectric properties of dolomite type borates, $CaZr(BO_3)_2$ ceramics prepared by conventional mixed oxide method were explored. The sintering temperature of $CaZr(BO_3)_2$ ceramics could be reduced from $1150^{\circ}C\;to\;925^{\circ}C$ with little amount of sintering additives. Microwave dielectric properties of 3 wt% $Bi_2O_3-CuO$ added $CaZr(BO_3)_2$ ceramics sintered at $925^{\circ}C$ were $K{\approx}10.4,\;Q{\times}f{\approx}80,000GHz\;and\;TCF{\approx}+2ppm/^{\circ}C$. Thus obtained LTCC tape was co-fired with Ag paste for compatibility test and revealed no sign of Ag reaction with the ceramics. Therefore, $CaZr(BO_3)_2$ ceramics is considered as a possible candidate material for low temperature co-fired multilayer devices.

Ellipsometric study of Mn-doped $Bi_4Ti_3O_{12}$ thin films

  • Yoon, Jae-Jin;Ghong, Tae-Ho;Jung, Yong-Woo;Kim, Young-Dong;Seong, Tae-Geun;Kang, Lee-Seung;Nahm, Sahn
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.173-173
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    • 2010
  • $Bi_4Ti_3O_{12}$ ($B_4T_3$) is a unique ferroelectric material that has a relatively high dielectric constant, high Curie temperature, high breakdown strength, and large spontaneous polarization. As a result this material has been widely studied for many applications, including nonvolatile ferroelectric random memories, microelectronic mechanical systems, and nonlinear-optical devices. Several reports have appeared on the use of Mn dopants to improve the electrical properties of $B_4T_3$ thin films. Mn ions have frequently been used for this purpose in thin films and multilayer capacitors in situations where intrinsic oxygen vacancies are the major defects. However, no systematic study of the optical properties of $B_4T_3$ films has appeared to date. Here, we report optical data for these films, determined by spectroscopic ellipsometry (SE). We also report the effects of thermal annealing and Mn doping on the optical properties. The SE data were analyzed using a multilayer model that is consistent with the original sample structure, specifically surface roughness/$B_4T_3$ film/Pt/Ti/$SiO_2$/c-Si). The data are well described by the Tauc-Lorentz dispersion function, which can therefore be used to model the optical properties of these materials. Parameters for reconstructing the dielectric functions of these films are also reported. The SE data show that thermal annealing crystallizes $B_4T_3$ films, as confirmed by the appearance of $B_4T_3$ peaks in X-ray diffraction patterns. The bandgap of $B_4T_3$ red-shifts with increasing Mn concentration. We interpret this as evidence of the existence deep levels generated by the Mn transition-metal d states. These results will be useful in a number of contexts, including more detailed studies of the optical properties of these materials for engineering high-speed devices.

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Dielectric and Piezoelectric Properties of Low Temperature Sintering PCW-PMN-PZT Ceramics according to MnO2 Addition (MnO2 첨가에 따른 저온소결 PCW-PMN-PZT세라믹스의 유전 및 압전특성)

  • Chung, Kwang-Hyun;Lee, Duck-Chool;Lee, Chang-Bae;Lee, Sang-Ho;Yoo, Ju-Hyun;Lee, Hyeung-Gyu;Kang, Hyung-Won
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.18 no.2
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    • pp.136-141
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    • 2005
  • In this study, in order to develop the low temperature sintering ceramics for multilayer piezoelectric transformer, PCW-PMN-PZT ceramics using Li$_2$CO$_3$, Bi$_2$O$_3$, and CuO as sintering aids were manufactured according to the amount of MnO$_2$ addition. Their microstructural, dielectric and piezoelectric properties were investigated. When the sintering aids were added, specimens could be sintered below 95$0^{\circ}C$, but mechanical qualify factor decreased. Therefore, MnO$_2$ was added excessively to the PCW-PMN-PZT ceramics to increase mechanical quality factor. At the sintering temperature of 95$0^{\circ}C$, the density, dielectric constant($\varepsilon$$_{r}$), electromechanical coupling factor(k$_{p}$), mechanical quality factor(Q$_{m}$) and Curie temperature(T$_{c}$) of 0.1 wt% MnO$_2$ added specimen showed the optimal values of 7.75 g/㎤, 1503, 0.57, 1502, and 337, respectively, for multilayer piezoelectric transformer application.ation.n.

Electrical properties of PZT/BFO/PZT thin film deposited with various temperature (증착 온도에 따른 PZT/BFO 박막의 전기적 특성)

  • Kim, Dae-Young;Nam, Sung-Pill;Noh, Hyun-Ji;Jo, Seo-Hyeon;Lee, Tae-Ho;Lee, Sung-Gap;Lee, Young-Hi
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.197-197
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    • 2010
  • Pb(Zr,Ti)O3/BiFeO3/(PZT/BFO) multilayer thin films were coated on Pt/Ti/SiO2/Si substrates by chemical solution deposition. With increasing the annealing temperature, the dielectric and leakage current density properties of multilayered PZT/BFO/PZT thin films were improved. The current density of the PZT/BFO/PZT filmannealing at $600^{\circ}C$ was about 189.39(x10-9A/cm2) at 10V. The relative dielectric constant and the dielectric loss of the PZT/BFO/PZT thin film annealing at $600^{\circ}C$ were about 318 and 0.161%, respectively.

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Photoelectrochemical Water Oxidation and $CO_2$ Conversion for Artificial Photosynthesis

  • Park, Hyunwoong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.08a
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    • pp.70-70
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    • 2013
  • As the costs of carbon-footprinetd fuels grow continuously and simultaneously atmospheric carbon dioxide concentration increases, solar fuels are receiving growing attention as alternative clean energy carriers. These fuels include molecular hydrogen and hydrogen peroxide produced from water, and hydrocarbons converted from carbon dioxide. For high efficiency solar fuel production, not only light absorbers (oxide semiconductors, Si, inorganic complexes, etc) should absorb most sunlight, but also charge separation and interfacial charge transfers need to occur efficiently. With this in mind, this talk will introduce the fundamentals of solar fuel production and artificial photosynthesis, and then discuss in detail on photoelectrochemical (PEC) water splitting and CO2 conversion. This talk largely divides into two section: PEC water oxidation and PEC CO2 reduction. The former is very important for proton-coupled electron transfer to CO2. For this oxidation, a variety of oxide semiconductors have been tested including TiO2, ZnO, WO3, BiVO4, and Fe2O3. Although they are essentially capable of oxidizing water into molecular oxygen, the efficiency is very low primarily because of high overpotentials and slow kinetics. This challenge has been overcome by coupling with oxygen evolving catalysts (OECs) and/or doping donor elements. In the latter, surface-modified p-Si electrodes are fabricated to absorb visible light and catalyze the CO2 reduction. For modification, metal nanoparticles are electrodeposited on the p-Si and their PEC performance is compared.

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Lithogeochemistry and Gold Content of Plutonic (고흥 미복산 부근에 분포하는 심성암류의 암석지구화학과 금함량)

  • 윤정한
    • Economic and Environmental Geology
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    • v.32 no.6
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    • pp.585-597
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    • 1999
  • Plutomic rocks of the Mabogsan, located in the southestern part of the Koheung Eup are composed of granite gneiss, diorite, biotite grantie and granophyre. On the basis of Rb-Ba-Sr diagram, the diorires are plotted from granodiorite to quartz diortie, the biotite granites from granodiortie to anomalous granite and the granophyres in normal granite filed. The plutonic rocks tend to show the I-type characteristics in terns of ACF diagram, $K_2O-Na_2O$ diagram and $Al_2O_3/Na_2O+K_2O+CaO$ diafram, while have values of ilmenite series in magnetic subseptibility. The plutons could have formed in the tectonic environment of VAG+COLG+ORG based on the silica vs. trace element diagrams. Gold contents with major and trace elements have been determined for 21 granophyres, 13 biotite granites and 4 diorites are; (1) for the diorite, the rangs is 0.508~1.73 ppb with an average of 0.5ppb;(2) for the biotite granites, the range is 0.449~13.5ppb with an average of 3 ppb;(3)for the granphyres, the range is 0.508~23.1ppb with an average of 4.5ppb. The gold content of the studied plutons tends to increase from mafic to felsic rocks. Gold contents tend to show positive correlations with those of Ag and Zn, negative correlations with those of As, Ba and Rb. The copper contents of the plutons are comparatively high. Average copper contents of diorite, biotite granite and granophyre are 710ppm, 587ppm and 484ppm, respectively. The copper contents of the plutons tend to have good correlations with those of Ag, Bi and Pb.

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Polarization Characteristics of SBN Thin Film by RF Magnetron Sputtering (RF 마그네트론 스퍼터링법에 의한 SBN 박막의 분극특성)

  • Kim, Jin-Sa
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.60 no.6
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    • pp.1175-1177
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    • 2011
  • The SBN thin films were deposited on Pt/Ti/$SiO_2$/Si and p-type Si(100) substrate by rf magnetron sputtering method using $Sr_{0.7}Bi_{2.3}Nb_2O_9$ ceramic target. SBN thin films deposited were annealed at 600~800[$^{\circ}C$] by furnace in oxygen atmosphere during 40min. The polarization characteristics have been investigated to confirm the possibility of the SBN thin films for the application to destructive read out ferroelectric random access memory. The maximum remanent polarization and the coercive voltage are 0.6[${\mu}C/cm^2$], 1.2[V] respectively at annealing temperature of 800[$^{\circ}C$]. The leakage current density was the $2.57{\times}10^{-6}[A/cm^2]$ at an applied voltage of 5[V] at annealing temperature of 650[$^{\circ}C$]. Also, the fatigue characteristics of SBN thin films did not change up to $10^8$ switching cycles.

RF 스퍼터링법에 의한 SBN 박막의 미세구조 특성

  • Kim, Jin-Sa;Song, Min-Jong;Choe, Un-Sik;Park, Geon-Ho;Jo, Chun-Nam;Kim, Chung-Hyeok
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.03b
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    • pp.6-6
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    • 2010
  • The $Sr_{0.7}Bi_{2.3}Nb_2O_9$(SBN) thin films are deposited on Pt-coated electrode (Pt/Ti/$SiO_2$/Si) using RF sputtering method at various deposition temperature. The crystallinity of SBN thin films were increased with increase of deposition temperature in the temperature range of 100~400[$^{\circ}C$]. The surface roughness of deposition temperature($300^{\circ}C$) showed about 4.33[nm]. The grain and crystallinity of SBN thin films were increased with the increase of annealing temperature.

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