• Journal of the Korean Ceramic Society
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• v.35 no.1
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• pp.88-96
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• 1998

The structural and electrical properties of titanium dioxide(TiO2) thin films deposited on p-type (100) si and 4$^{\circ}$off(100) Si substartes by metalorganic chemical vapor deposition (MOCVD) have been studied with post rapid thermal annealing. TiO2 thin films of anatase phase were grown at 300-500$^{\circ}C$ using titanium post rapid thermal annealing at a temperature of 800$^{\circ}C$ for 30sec. rutile phase was observed in the condition of the deposition temperature over 350$^{\circ}C$ in the ambient air atmosphere and at 500$^{\circ}C$ in cacuu,. SEM and AFM study show-ed surface roughness were increased slightly from 40${\AA}$to 55${\AA}$ after annealing due to grain growth and phase transformation. From capacitane-voltage measurement of Al/TiO2./p-Si structure after annealing we obtained ideal capacitance-voltage characteristics of MOS structure with dielectric constant of 16-22 in case of (100) Si and about 30- in case of 4$^{\circ}$off(100) Si but showed the higher leakage current.

• Applied Chemistry for Engineering
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• v.28 no.5
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• pp.521-528
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• 2017

To find a recycling method for waste liquid crystal display (LCD) panel glasses, we investigated the synthesis process of zeolite with an ion exchange ability by hydrothermal reaction using waste LCD panel glass as a raw material. It was shown that the waste LCD panel glass can be used as a raw material for the production of zeolites having the ion exchange ability. Following conditions for the synthesis of the zeolite with an ion exchange ability were required : the molar ratio of Si to Al components of the waste LCD glass needs to be 2.0 to 2.8, and the temperature of $100^{\circ}C$ and reaction time of 12 hours are needed for the hydrothermal reaction. Based on the required conditions previously mentioned, the A type zeolite was synthesized when the molar ratio of the Si to Al component was 2.0, and the P type zeolite was produced when the molar ratio was 2.8. The type A zeolite synthesized by using the waste LCD panel glass showed a good ion exchange ability and heavy metal adsorption ability. Also, an excellent ion exchange capacity was observed as the crystal phase grows stably in a cubic phase.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.08a
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• pp.218-218
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• 2010

유기물과 무기물이 결합한 유기물/무기물 나노복합체는 차세대 전자 소자 제작에 있어 저전력 및 높은 생산성으로 인해 유용한 소재로 각광받고 있다. 유기물/무기물 나노복합체에 사용되는 물질 중에서 코어-쉘 구조의 나노 입자를 사용한 나노복합체는 나노 입자의 쉘에 의한 메모리 특성의 변화로 인해 차세대 메모리 소자에 응용하려는 연구가 활발히 진행되고 있다. 그러나 코어-쉘 나노 입자가 분산되어 삽입된 고분자 박막 구조를 사용한 비휘발성 메모리의 쉘에 의한 메모리 특성 변화에 대한 연구는 비교적 미미하다. 본 연구에서는 CdTe-CdSe 나노 입자가 Poly(9-vinylcarbazol) (PVK) 박막에 분산된 구조를 기억층으로 사용하는 비휘발성 메모리 소자의 제작과 CdSe 쉘 층에 의한 메모리 특성의 변화에 대한 관찰을 수행하였다. 코어-쉘 나노입자에서 쉘의 역할을 알기 위하여 CdTe-CdSe 나노 입자와 CdTe 나노 입자를 각각 PVK에 톨루엔을 사용하여 녹여 나노 입자가 분산된 용액들을 제작하였다. 두 용액을 p-Si 기판 위에 스핀 코팅으로 도포한 후에 열을 가해 나노복합체를 형성하고 Al을 게이트 전극으로 증착한다. 제작된 두 가지 Al/CdTe-CdSe나노 입자＋PVK/p-Si 소자와 Al/CdTe나노 입자＋PVK/p-Si 소자는 정전용량-전압 (C-V) 측정 결과 히스테리시스 특성이 관찰되었다. CdTe-CdSe 나노 입자를 포함한 소자의 C-V 곡선의 flatband voltage shift는 0.5 V이고, CdTe 나노입자를 포함한 소자의 C-V 곡선의 flatband voltage shift는 1.1 V이다. CdTe-CdSe 나노 입자가 포함된 소자와 CdTe 나노 입자가 포함된 소자의 flatband voltage shift의 차이가 나타나는 원인에 대하여 에너지 밴드 대역도를 사용하여 설명하였다. 본 연구결과는 코어-쉘 나노 입자를 사용하는 비휘발성 메모리 소자에서 쉘에 의한 메모리 특성 변화에 대한 정보를 제공할 것이다.

• Journal of the Korean Ceramic Society
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• v.30 no.10
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• pp.829-837
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• 1993

Chemically and geometrically homogeneous mixing of Si3N4 powders with sintering additives(YAG, 3Y2O3$.$5Al2O3) was attempted via coprecipitation method. X-ray dot maps for the additive elements(Al and Y) showed that the additives are evenly distributed in the powder mixture prepared by coprecipitation method(CP). TEM observation of the coprecipittion-treated Si3N4 powders revealed that they are covered with extremely fine crystallites of additive. The shift in isoelectric point(IEP) of Si3N4 powders from pH 6.7 to pH 7.9 after coprecipitation mixing gave another evidence for coating of Si3N4 powders with YAG additives. SIMS analysis for composition on the surface and in the matrix of mixed powders showed that the YAG additives are highly enriched on the surface of coprecipitation-treated Si3N4 powders. Especially when a small amount of additive was used, the effect of homogeneous additive distribution on densification was preceptible: After pressureless-sintering of powder compacts containing 5 mol% YAG at 1800$^{\circ}C$ for 0.5h, a sintered density of 96.5% theoretical was obtained from the specimens prepared bycoprecipitation in comparison with 93.8% from the mechanically-mixed one.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.16 no.7
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• pp.557-563
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• 2003

SiC has been an useful material for the high voltage, high temperature, and high frequency devices, however, the required high process temperature to activate the implanted p-type dopants has hindered further developments. In this study, we report, for the first time, on the laser activation of implanted Al and non-alloyed Mo ohmic contacts and its application to MOSFET fabrication. The contact and sheet resistance measured from CTLM patterns have decreased by increasing laser power, and the lowest values are 3.9 $K\Omega$/$\square$ and 1.3 $\times$ 10$^{-3}$ $\Omega$-cm$^2$, respectively, at the power density of 1.45 J/cm$^2$ The n-MOSFETs fabricated on laser activated p-well exhibit well-behaved I-V characteristics and threshold voltage reduction by reverse body voltage. These results prove that the laser process for implant activation is an alternative low temperature technology applicable to SiC devices.

• Proceedings of the KIEE Conference
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• 1995.11a
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• pp.338-341
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• 1995

The surface properties after plasma etching of Al(Si, Cu) solutions using the chemistries of chlorinated and fluorinated gases with varying the etching time have been investigated using X-ray Photoelectron Spectroscopy. Impurities of C, Cl, F and O etc are observed on the etched Al(Si, Cu) films. After 95% etching, aluminum and silicon show metallic states and oxized (partially chlorinated) states, copper shows Cu metallic states and Cu-Clx(x$CuCl_x$ (x$CuCl_x$ (1

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.07a
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• pp.22-25
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• 2002

In this paper, we deposited MgO buffer layer on p-type (100)Si substrate in the condition of substrate temperature 400$^{\circ}C$, working gas ratio Ar:O$_2$=80:20, RF Power 50W, working pressure 10mtorr, and the thickness of the film was about 300${\AA}$. Then we deposited Ba$\sub$0.5/Sr$\sub$0.5/TiO$_3$ thin film using RF Magnetron sputtering method on the MgO/Si substrate in various RF power of 25W, 50W, 75W. The film deposited in 50W showed the best crystalline from the XRD measurement. To know the electrical properties of the film, we manufactured Al/BSTMgO(300${\AA}$)/Si/Al structure capacitor. In the result of I-V measurement, The leakage current density of the capacitor was lower than 10$\^$-7/A/$\textrm{cm}^2$ at the range of ${\pm}$150kV/cm. From C-V characteristics of the capacitor, can calculate the dielectric constant and it was 305. Finally we deposited BST thin film on bare Si substrate and (100)MgO substrate in the same deposition condition. From the comparate of the properties of these samples, we found the properties of BST thin film which deposited on MgO/Si substrate were better than on bare Si substrate and similar to on MgO substrate.

• Proceedings of the Korean Society for Technology of Plasticity Conference
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• 1999.03b
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• pp.176-179
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• 1999

The high temperature deformation behaviour of 15vol% SiCp/A16061 composites has been studied in the temperature range of 300-50$0^{\circ}C$ and the strain rate range of 0.1-3.0/sec by torsion test. On he basis of the flow stress data the strain rate sensitivity(m) of the material is evaluated and used for calculating the deformation efficiency(η) [η=2m/(m+1)] A domain of dynamic recrystallization(DRX) could be identified in these maps by using the deformation efficiency. The characteristicvs of these results has been investigated with the help of determining the region of optimum hot working condition.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.06a
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• pp.68-69
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• 2007

We have prepared p-type ZnO:Al films in pure oxygen ambient on n-type Si (100) and homo buffer layers by RF magnetron sputtering system. Hall effect measurement shows that the film annealed at $600^{\circ}C$ possesses p-type conductivity and the film annealed $800^{\circ}C$ does not. PL spectra show different properties of p- and n-type ZnO film. The corresponding peaks of PL spectra of p- and n-type show at about same positions. The intensities of high photon energy of n-type film on buffer shows decreasing tendency.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.11a
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• pp.431-432
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• 2008

HIT Solar Cell은 단결정 실리콘 웨이퍼가 초박막 amorphos 실리콘 층으로 싸여있는 구조이다. HIT Solar Cell에서 amorphos 실리콘의 두께와 도핑 농도는 태양전지의 효율을 결정하는 매우 중요한 요인이다. 본 논문에서는 높은 효율을 갖는 태양전지 설계를 위해 AFORS HET 프로그램을 이용하여 TCO_a-Si:H(p)_a-Si:H(i)_c-Si(n)_Al 구조를 설계했다. 후에 a-Si:H(p)의 두께와 a-Si:H(i) 의 두께를 가변하며 효율을 측정하였고, p-i-n 구조에서 n+ 층을 추가함에 따라 변하는 효율을 측정하였다. 최적화 한 결과 $V_{oc}$ = 693mV, $J_{sc}$ = 3891mA/$cm^{-2}$, FF = 8363%, $E_{ff}$ = 22.55% 의 고효율을 얻었다.