한국전기전자재료학회논문지 (Journal of the Korean Institute of Electrical and Electronic Material Engineers)

  • 제37권5호
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  • Pages.476-485
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  • 2024
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  • 1226-7945(pISSN)
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  • 2288-3258(eISSN)
한국전기전자재료학회 (The Korean Institute of Electrical and Electronic Material Engineers)
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3차원 원자단층현미경을 활용한 기능성 재료의 구조-특성 관계 해석

Understanding the Structure-Property Relationship in Functional Materials Using 3D Atom Probe Tomography

  • 정찬원 (부경대학교 재료공학과)
  • Chanwon Jung (Department of Materials Science and Engineering, Pukyong National University)
  • 투고 : 2024.07.05
  • 심사 : 2024.07.22
  • 발행 : 2024.09.01
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초록

Understanding the structure-property relationship in functional materials is crucial as microstructural features such as nano-precipitates, phase boundary, grain boundary segregation, and grain boundary phases play a key role in their functional properties. Atom probe tomography (APT) is an advanced analytical technique that allows for the three-dimensional (3D) mapping of atomic distributions and the precise determination of local chemical compositions in materials. Moreover, it offers sub-nanometer spatial resolution and chemical sensitivity at the tens of parts per million (ppm) level. Owing to its unique capabilities, this technique has been employed to uncover the 3D elemental distributions in a wide range of materials, including alloys, semiconductors, nanomaterials, and even biomaterials. In this paper, various kinds of examples are introduced for elucidating structure-property relationships on functional materials by utilizing the atom probe tomography.

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과제정보

이 논문은 국립부경대학교 자율창의학술연구비(2024년)에 의하여 연구되었음.

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