Current Optics and Photonics

Optical Society of Korea (한국광학회)
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Environment-dependent Broadband Perfect Absorption of Metal-insulator-metal Metamaterial Systems

  • Feng Li (School of Communication and Information Engineering, Shanghai Technical Institute of Electronics & Information) ;
  • Yulong Tang (Key Laboratory for Laser Plasmas (MOE), School of Physics and Astronomy, Shanghai Jiao Tong University) ;
  • Qingsong Peng (School of Communication and Information Engineering, Shanghai Technical Institute of Electronics & Information) ;
  • Guosheng Hu (School of Communication and Information Engineering, Shanghai Technical Institute of Electronics & Information)
  • Received : 2022.12.26
  • Accepted : 2023.02.04
  • Published : 2023.04.25
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Abstract

Based on calculations using the macroscopic Maxwell's equations with mesoscopic boundary conditions, light absorption by a layered metal-insulator-metal (MIM) metamaterial system embedded in three different environments is investigated. Increasing the top metal thickness shifts the broad absorption band to lower dielectric-constant regions and longer wavelengths, for either TM or TE waves. Boosting the dielectric-layer thickness redshifts the broadband absorption to regions of larger dielectric constant. In air, for the dielectric-constant range of 0.86-3.40, the absorption of the system exceeds 98% across 680-1,033 nm. In seawater with optimized dielectric constant, ≥94% light absorption over 400-1,200 nm can be achieved; particularly in the wavelength range of 480-960 nm and dielectric-constant range of 0.82-3.50, the absorption is greater than 98%. In an environment with even higher refractive index (1.74), ≥98% light absorption over 400-1,200 nm can be achieved, giving better performance. The influence of angle of incidence on light absorption of the MIM system is also analyzed, and the angle tolerance for ≥90% broadband absorption of a TM wave is up to 40° in an environment with large refractive index. While the incident-angle dependence of the absorption of a TE wave is nearly the same for different circumstances, the situation is different for a TM wave.

Keywords

Acknowledgement

Natural Science Foundation of Shanghai (China, No. 19ZR1427100); the National Natural Science Foundation of China (61306072, 61675129); the Technique Foundation of Shanghai Technical Institute of Electronics & Information (HX-22-TX034).

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