Acknowledgement
This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (2020R1A6A1A03038697) and This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (2021R1I1A3052426).
References
- Y. Tokura, J. Appl. Phys., 79, 5288 (1996). [DOI: https://doi.org/10.1063/1.361353]
- M. P. de Jong, I. Bergenti, V. A. Dediu, M. Fahlman, M. Marsi, and C. Taliani, Phys. Rev. B, 71, 014434 (2005). [DOI: https://doi.org/10.1103/PhysRevB.71.014434]
- K. Tanaka, S. Okamura, and T. Shiosaki, Jpn. J. Appl. Phys., 40, 6821 (2001). [DOI: https://doi.org/10.1143/JJAP.40.6821]
- C. Zener, Phys. Rev., 82, 403 (1951). [DOI: https://doi.org/10.1103/PhysRev.82.403]
- A. Elghoul, A. Krichene, N. C. Boudjada, and W. Boujelben, Ceram. Int., 44, 12723 (2018). [DOI: https://doi.org/10.1016/j.ceramint.2018.04.075]
- J.A.M. van Roosmalen, P. van Vlaanderen, E.H.P. Cordfunke, W. L. Ijdo, and D.J.W. Ijdo, J. Solid State Chem., 114, 516 (1995). [DOI: https://doi.org/10.1006/jssc.1995.1078]
- M. M. Shokrieh, Residual Stresses in Composite Materials (Woodhead Publishing, Oxford, 2014) p. 256.
- H. W. Nesbitt and D. Banerjee, Am. Mineral., 83, 305 (1998). [DOI: https://doi.org/10.2138/am-1998-3-414]
- K. M. Kim, S. G. Lee, and M. S. Kwon, Trans. Electr. Electron. Mater., 18, 330 (2017). [DOI: https://doi.org/10.4313/TEEM.2017.18.6.330]
- J. Inoue and S. Maekawa, Phys. Rev. B, 53, R11927 (1996). [DOI: https://doi.org/10.1103/PhysRevB.53.R11927]
- S. Sahoo, Trans. Electr. Electron. Mater., 21, 482 (2020). [DOI: https://doi.org/10.1007/s42341-020-00214-y]
- M. Uehara, S. Mori, C. H. Chen, and S. W. Cheng, Nature, 399, 560 (1999). [DOI: https://doi.org/10.1038/21142]
- E. D. Macklen, Thermistors (Electrochemical Publications Ltd. Scotland, 1979) p. 33.