Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지
DOI QR코드

DOI QR Code

Vulnerability Analysis of Network Communication Device by Intentional Electromagnetic Interference Radiation

IEMI 복사에 의한 네트워크 통신 장비의 취약성 분석

  • Seo, Chang-Su (Department of Electrical Engineering, Inha University) ;
  • Huh, Chang-Su (Department of Electrical Engineering, Inha University) ;
  • Lee, Sung-Woo (Department of Electrical Engineering, Inha University) ;
  • Jin, In-Young (Department of Electrical Engineering, Inha University)
  • Received : 2017.10.10
  • Accepted : 2017.10.17
  • Published : 2018.01.01
Download PDF
⟨ Previous Next ⟩

Abstract

This study analyzed the Vulnerability of Network Communication devices when IEMI is coupled with the Network System. An Ultra Wide Band Generator (180 kV, 700 MHz) was used as the IEMI source. The EUTs are the Switch Hub and Workstation, which are used to configure the network system. The network system was monitored through the LAN system configuration, to confirm a malfunction of the network device. The results of the experiment indicate that a malfunction of the network occurs as the electric field increases. The data loss rate increases proportionally with increasing radiating time. In the case of the Switch Hub, the threshold electric field value was 10 kV/m for all conditions used in this experiment. The threshold point causing malfunction was influenced only by the electric field value. The correlation between the threshold point and pulse repetition rate was not found. However, in case of the Workstation, it was found that as the pulse repetition rate increases, the equipment responds weakly and the threshold value decreases. To verify the electrical coupling of the EUT by IEMI, current sensors were used to measure the PCB line inside the EUT and network line coupling current. As a result of the measurement, it can be inferred that when the coupling current due to IEMI exceeds the threshold value, it flows through the internal equipment line, causing a malfunction and subsequent failure. The results of this study can be applied to basic data for equipment protection, and effect analysis of intentional electromagnetic interference.

Keywords

References

  1. D. Nitsch, M. Camp, F. Sabath, J. L. ter Haseborg, and H. Garbe, IEEE Trans. Electromagn. Compat., 46, 380 (2004). [DOI: https://doi.org/10.1109/TEMC.2004.831842]
  2. IEC, IEC 61000-2-13: Electromagnetic compatibility (EMC) - Part 2-13: Environment - High-power electromagnetic (HPEM) environments - Radiated and conducted (IEC, Geneva, 2005) p. 27.
  3. M. Camp, H. Garbe, and D. Nitsch, Proc. 2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH37161) (IEEE, Montreal, Canada, 2001) p. 1015. [DOI: https://doi.org/10.1109/ISEMC.2001.950538]
  4. R. T. Tientcheu and D. Pouhe, Proc. 2015 International Conference on Electromagnetics in Advanced Applications (ICEAA) (IEEE, Turin, Italy, 2015) p. 1357. [DOI: https://doi.org/10.1109/ICEAA.2015.7297339]
  5. IEC, IEC 61000-4-36: Electromagnetic compatibility (EMC) - Part 4-36: Testing and measurement techniques - IEMI immunity test methods for equipment and systems (IEC, Geneva, 2014) p. 20.
  6. W. S. Cho, P. K. Kwak, C. Y. Park, J. K. Yang, and H. S. Geum, J. Korean Inst. Electromagn. Eng. Sci., 22, 220 (2011). [DOI: https://doi.org/10.5515/KJKIEES.2011.22.2.220]