DOI QR코드

DOI QR Code

PMMA 보호막을 이용한 용액 공정 기반의 인듐-이티륨-산화물 트랜지스터에 관한 연구

Study on Solution Processed Indium-Yttrium-Oxide Thin-Film Transistors Using Poly (Methyl Methacrylate) Passivation Layer

  • 김한상 (충북대학교 전자정보대학) ;
  • 김성진 (충북대학교 전자정보대학)
  • Kim, Han-Sang (College of Electrical and Computer Engineering, Chungbuk National University) ;
  • Kim, Sung-Jin (College of Electrical and Computer Engineering, Chungbuk National University)
  • 투고 : 2017.02.22
  • 심사 : 2017.04.23
  • 발행 : 2017.07.01

초록

We investigated solution-processed indium-yttrium-oxide (IYO) TFTs using apoly (methyl methacrylate) (PMMA) passivation layer. The IYO semiconductor solution was prepared with 0.1 M indium nitrate hydrate and 0.1 M yttrium acetate dehydrate as precursor solutions. The solution-processed IYO TFTs showed good performance: field-effect mobility of $13.13cm^2/Vs$, a threshold voltage of 8.2 V, a subthreshold slope of 0.93 V/dec, and a current on-to-off ratio of $7.2{\times}10^6$. Moreover, the PMMA passivation layers used to protectthe IYO active layer of the TFTs, did so without deteriorating their performance under ambient conditions; their operational stability and electrical properties also improved by decreasing leakage current.

키워드

참고문헌

  1. K. Nomura, H. Ohta, K. Ueda, T. Kamiya, M. Hirano, and H. Hosono, Science, 300, 1269 (2003). [DOI: https://doi.org/10.1126/science.1083212]
  2. H. Yabuta, M. Sano, K. Abe, T. Aiba, T. Den, H. Kumomi, K. Nomura, T. Kamiya, and H. Hosono, Appl. Phys. Lett., 89, 112123 (2006). [DOI: https://doi.org/10.1063/1.2353811]
  3. C. G. Van de Walle, Phys. Rev. Lett., 85, 1012 (2000). [DOI: https://doi.org/10.1103/PhysRevLett.85.1012]
  4. K. Nomura, H. Ohta, A. Takagi, T. Kamiya, M. Hirano, and H. Hosono, Nature, 432, 488 (2004). [DOI: https://doi.org/10.1038/nature03090]
  5. K. B. Park, J. B. Seon, G. H. Kim, M. Yang, B. Koo, H. J. Kim, M. K. Ryu, and S. Y. Lee, IEEE Electron Device Lett., 31, 311 (2010). [DOI: https://doi.org/10.1109/LED.2010.2040130]
  6. W. H. Jeong, G. H. Kim, H. S. Shin, B. D. Ahn, H. J. Kim, M. K. Ryu, K. B. Park, J. B. Seon, and S. Y. Lee, Appl. Phys. Lett., 96, 093503 (2010). [DOI: https://doi.org/10.1063/1.3340943]
  7. Y. S. Rim, H. S. Lim, and H. J. Kim, ACS Appl. Mater. Interfaces, 5, 3565 (2013). [DOI: https://doi.org/10.1021/am302722h]
  8. P. C. Chang, Z. Fan, C. J. Chien, D. Stichtenoth, C. Ronning, and J. G. Lu, Appl. Phys. Lett., 89, 133113 (2006). [DOI: https://doi.org/10.1063/1.2357013]
  9. S. H. Song, W. K. Hong, S. S. Kwon, and T. H. Lee, Appl. Phys. Lett., 92, 263109 (2008). [DOI: https://doi.org/10.1063/1.2955512]