전자공학회논문지 (Journal of the Institute of Electronics and Information Engineers)

  • 제53권1호
  • /
  • Pages.107-117
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  • 2016
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  • 2287-5026(pISSN)
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  • 2288-159X(eISSN)
대한전자공학회 (The Institute of Electronics and Information Engineers)
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액정 표시 장치 표면 영상에서 히스토그램 비대칭도 기반의 적응적 결함 검출

Adaptive Defect Detection Method based on Skewness of the Histogram in LCD Image

  • Gu, Eunhye (Graduate School of Electronics Engineering, Kyungpook National University) ;
  • Park, Kil-Houm (Graduate School of Electronics Engineering, Kyungpook National University)
  • 투고 : 2015.06.24
  • 심사 : 2015.12.24
  • 발행 : 2016.01.25
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초록

TFT-LCD 영상에서 평균과 표준편차를 이용한 STD 결함 검출 방법은 실제 많은 검사 시스템에 활용되고 있다. STD방법은 문턱 값에 따라 검출 결과가 매우 의존적인 문제가 있다. 본 논문에서는 신뢰도 높은 결함 검출을 위해 영상에 따른 적응적 문턱 값을 사용한 STD 방법을 제안한다. 제안 방법에서는 문턱 값을 영상의 휘도 분포와 정규 분포의 유사도를 나타내는 비대칭도(Skewness)를 이용하여 적응적으로 결정한다. 실험을 통해 적응적 문턱 값을 사용한 STD 방법은 다양한 결함을 포함한 영상에 대해 일관성 있는 검출 결과를 나타내어 제안한 방법의 타당성을 확인할 수 있었다.

STD method using a mean and standard deviation is widely used in various inspection systems. The result of detection using the STD method is very dependent on the threshold value. This paper proposes an adaptive defect detection algorithm to with a precise detection of an ultimate defect. The proposed method is determined threshold value adaptively using a skewness that indicates a similarity of intensity and normal distribution of image. In the experiment, we used a various TFT-LCD images for a quantitative evaluation of defect detection performance evaluation result to prove the performance of the proposed algorithm.

키워드

참고문헌

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