참고문헌
- J. -Y. Ryu, B. C. Kim, S. -T. Kim, and V. Varadarajan 'Novel Defect Testing of RF Front End Using Input Matching Measurement,' 9th IEEE International Mixed-Signal Testing Workshop, vol. 9, pp. 31-34, June 2003
- K. C. Craig, S. P. Case, R. E. Neese and C. D. DePriest, 'Current and Future Trusting in Automated RF and Microwave Testing,' IEEE, pp. 183-, 1994
- D. Lupea,U. Pursche and H. -J. Jentschel, 'RF-BIST: Loopback Spectral Signature Analysis,' IEEE Proceedings of the 2003 DATE Conference and Exhibition, pp. 478-483, March 2003
- D. Lupea U. Pursche and H. -J. Jentschel, 'Spectral Signature Analysis-BIST for RF Front-Ends,' Advances in Radio Science, pp. 155-160, 2003 https://doi.org/10.5194/ars-1-155-2003
- J. Dabrowski, 'BiST Model for IC RF-Transceiver Front-End,' 2003 Proceedings of the 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 295-302, November 2003
- R. Voorakaranam, S. Cherubal and A. Chatterjee, 'A Signature Test Framework for Rapid Production Testing of RF Circuits,' Proceedings of the 2002 Design, Automation and Test in Europe Conference and Exhibition, pp. 186-191, March 2003 https://doi.org/10.1109/DATE.2002.998268
- B. R. Veillette and G. W. Roberts, 'A Built-in Self-Test Strategy for Wireless Communication Systems,' Proceedings of the 1995 International Test Conference, pp. 930-939, October 1995 https://doi.org/10.1109/TEST.1995.529939
- A. Chatterjee, 'Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial,' IEEE 10th International Conference on VLSI Design, pp. 388-392, January 1997 https://doi.org/10.1109/ICVD.1997.568158
- Jee-Youl Ryu and Bruce C. Kim, 'A New BIST Scheme for SGHz Low Noise Amplifiers,' IEEE 9th European Test Symposium, accepted, May 2004
- M. Soma, 'Challenges and Approaches in Mixed Signal RF Testing,' IEEE Proceedings, pp. 33-37, 1997 https://doi.org/10.1109/ASIC.1997.616973
- W.A. Pleskacz, D. Kasprowicz, T. Oleszczak and W. Kuzmicz, 'CMOS Standard Cells Characterization for Defect Based Testing,' IEEE International Symposium on DFT in VLSI Systems, 2001 https://doi.org/10.1109/DFTVS.2001.966792
- G. Gonzalez, Microwave Transistor Amplifiers: Analysis and Design 2nd Edition: Prentice Hall, New Jersey, 1997, pp. 212-293
- A.J. Bishop and A Ivanov, 'On the Testability of CMOS Feedback Amplifiers,' IEEE, pp. 65-73, 1994 https://doi.org/10.1109/DFTVS.1994.630015
- S. Yu, B.W. Jervis, KR. Eckersall, I.M. Bell, AG. Hall and G.E.Taylor, 'Neural Network Approach to Fault Diagnosis in CMOS Opamp with Gate Oxide Short,' Electronics Letters, Vol. 30, No.9, pp. 695-696, April 1994 https://doi.org/10.1049/el:19940472
- Z. H. Liu, 'Mixed-Signal Testing of Integrated Analog Circuits and Electronic Modules,' PhD thesis, Ohio University, March 1999