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나노 와이어 MOSFET 구조의 광검출기를 가지는 SOI CMOS 이미지 센서의 픽셀 설계

Design of SOI CMOS image sensors using a nano-wire MOSFET-structure photodetector

  • 도미영 (경북대학교 전기전자공학과) ;
  • 신영식 (경북대학교 전기전자공학과) ;
  • 이성호 (경북대학교 전기전자공학과) ;
  • 박재현 (경북대학교 전기전자공학과) ;
  • 서상호 (경북대학교 전기전자공학과) ;
  • 신장규 (경북대학교 전기전자공학과) ;
  • 김훈 (한국전자부품연구원)
  • Do, Mi-Young (School of Electronic and Electrical Engineering, Kyungpook National University) ;
  • Shin, Young-Shik (School of Electronic and Electrical Engineering, Kyungpook National University) ;
  • Lee, Sung-Ho (School of Electronic and Electrical Engineering, Kyungpook National University) ;
  • Park, Jae-Hyoun (School of Electronic and Electrical Engineering, Kyungpook National University) ;
  • Seo, Sang-Ho (School of Electronic and Electrical Engineering, Kyungpook National University) ;
  • Shin, Jang-Kyoo (School of Electronic and Electrical Engineering, Kyungpook National University) ;
  • Kim, Hoon (Korea Electronics Technology Institute)
  • 발행 : 2005.11.30

초록

In order to design SOI CMOS image sensors, SOI MOSFET model parameters were extracted using the equation of bulk MOSFET model parameters and were optimized using SPICE level 2. Simulated I-V characteristics of the SOI NMOSFET using the extracted model parameters were compared to the experimental I-V characteristics of the fabricated SOI NMOSFET. The simulation results agreed well with experimental results. A unit pixel for SOI CMOS image sensors was designed and was simulated for the PPS, APS, and logarithmic circuit using the extracted model parameters. In these CMOS image sensors, a nano-wire MOSFET photodetector was used. The output voltage levels of the PPS and APS are well-defined as the photocurrent varied. It is confirmed that SOI CMOS image sensors are faster than bulk CMOS image sensors.

키워드

참고문헌

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