MOSFET Model HiSIM Based on Surface-Potential Description for Enabling Accurate RF-CMOS Design

  • 발행 : 2004.09.30

초록

The origin of the phenomena, obstructing circuit performance in the RF operating regime, as well as their modeling will be discussed. The applied surface-potential-based modeling allows self-consistent description of all phenomena important for accurate circuit simulation, as demonstrated with the MOSFET model HiSIM.

키워드

참고문헌

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