DOI QR코드

DOI QR Code

Simulation of Ultrasonic Dry Cleaning for Semiconductor/display Device Application

반도체/디스플레이 소자용 초음파 건식세정 시뮬레이션 연구

  • Published : 2004.12.01

Abstract

In this paper, the optimum design of ultrasonic dry cleaning head was investigated. The transducer instead of mechanical dynamic structure was used to generate ultrasonic wave and the horn-shape amplifier was utilized to solve the energy decaying problem of ultrasonic wave with propagating it through the media. The analyses of ultrasonic wave and a fluid for the selected structure of a cleaning head were carried out using SYSNOISE and ANSYS simulators, respectively. Based on simulator results, the distance between a horn and the substrate of 4 mm and the horn diameter of 10 mm were determined to maximize the energy of ultrasonic waves. The cooling structure was also considered to reduce the heat from the transducer and the horn. The equivalent circuit for the fabricated horn was deduced from HP4194A impedance/gain/phase analyzer and the frequency of an ultrasonic wave of 20.25 kHz was confirmed using the parameters of the equivalent circuit.

Keywords

References

  1. Yang-Hee Jung and Myoung-Kyu Kim, 'A study on microroughness of silicon surface induced by APM cleaning and electrical properties of Si/$SiO_2$ system', J. of KlEEME (in Korean), Vol. 12, No.7, p. 571, 1999
  2. M. G. Byun, H. W. Back, B. H. Cho, and Y. H. Kim, 'Development of New Cleaning Tech-nology using Ionized Water by Electrolysis', Proc. 1999 Autumn Conf, KIEEME, p. 617, 1999
  3. Jin-Sik Choi, Yong-Deuk Ko, Kyung-Wan Koo, Sung-Il Kim, and Hui-Gon Chun, 'Dry cleaning of si contact holes using UV/$O_3$ method', J. of KlEEME (in Korean), Vol. 10, No. 1, p. 8, 1997
  4. V. B. Bregar and J. Mozina., 'Optoacoustic Analysis of the Laser-cleaning Process', Applied Surface Science 185, p. 277, 2002 https://doi.org/10.1016/S0169-4332(01)00981-3
  5. Hall, R. M., Jarvis, T. D., Parry, T., Li, L., and Hawthorne, R. C., "Investigating Particle, Metallic Deposition in Megasonic Wafer Cleaning', Micro july/ August, p. 80, 1996
  6. Qi, Q. and Brereton, G. J., 'Mechanisms of removal of micron-sized particles by high-frequency ultrasonic waves', IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, Vol. 42, p. 619, 1995 https://doi.org/10.1109/58.393105
  7. Mayer, A. and Schwartzman, S., 'Megasonic cleaning: A new cleaning and drying system for use in semiconductor processing', Journal of Electric Materials, Vol. 8, No.6, p. 855, 1979 https://doi.org/10.1007/BF02651188
  8. Mikko O. Larninen, Harold W. Walker, and Linda K. Weavers, 'Mechanisms and factors influencing the ultrasonic cleaning of particle-fouled ceramic membranes', Journal of Membrane Science 237, p. 213, 2004 https://doi.org/10.1016/j.memsci.2004.02.031
  9. A. P. Cracknell., 'Ultrasonics', Wykeham Publications(London) LTD, The Wykeham Science Series, p. 4, 1980

Cited by

  1. Comparison of particle removal efficiency between the physical cleaning methods in the fabrication of liquid crystal displays vol.11, pp.3, 2010, https://doi.org/10.5762/KAIS.2010.11.3.795