A Self-Aligned Trench Body IGBT Structure with Low Concentrated Source

자기정렬된 낮은 농도의 소오스를 갖는 트렌치 바디 구조의 IGBT

  • 윤종만 (서울대 대학원 전기공학과) ;
  • 김두영 (서울대 대학원 전기공학과) ;
  • 한민구 (서울대 공대 전기공학과) ;
  • 최연익 (아주대 공대 전자공학과)
  • Published : 1996.02.01

Abstract

A self-aligned latch-up suppressed IGBT has been proposed and the process method and the device characteristics of the IGBT have been verified by numerical simulation. As the source is laterally diffused through the sidewall of the trench in the middle of the body, the size of the source is small and the doping concentration of the source is lower than that of the p++ body and the emitter efficiency of the parasitic npn transistor is low so that latch-up may be suppressed. No additional mask steps for p++ region, source, and source contact are required so that small sized body can be obtained Latch-u current density higher than 10000 A/cm$^{2}$ have been achieved by adjusting the process conditions.

Keywords