한국전기전자재료학회:학술대회논문집 (Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference)
- 한국전기전자재료학회 2006년도 영호남 합동 학술대회 및 춘계학술대회 논문집 센서 박막 기술교육
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- Pages.149-151
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- 2006
프랙탈 차원에 의한 소자 표면의 특성
The Properties of Devices Surface by Fractal Dimension
- Hong, Kyung-Jin (Gwangju Univ.) ;
- Min, Yong-Ki (Gwangju Univ.) ;
- Cho, Jae-Cheol (Chodang Univ.)
- 발행 : 2006.05.19
초록
The surface properties of electrical devices studied by fractal phenomenon were investigated. The SEM photographs of devices surface were changed by binary code and it were analyzed by fractal dimension. The void of devices surface was found by fractal program. The relation between grain density and electrical properties are able to expect to fractal dimension. The grain size in varistors surface was decreased by increasing of oxide antimony addition. The fractal dimension and electrical properties of devices surface was related to between grain boundary and grain density. The grain size was decreased by increasing of fractal dimensions.