Applications of Josephson Arrays to Voltage Metrology

  • Benz, S.P. (NIST) ;
  • Burroughs, C.J. (NIST) ;
  • Dresselhaus, P.D. (NIST) ;
  • Chong, Y. (NIST) ;
  • Hadacek, N. (NIST) ;
  • Yamamori, H. (AIST)
  • Published : 2004.08.16