• Journal of the Korea Computer Industry Society
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• v.6 no.2
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• pp.295-304
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• 2005

This paper presents the problem of exhaustive test generation for detection of coupling faults between cells in word-oriented memories. According to this fault model, contents of any w-bit memory word in a memory with n words, or ability tochange this contents, is influenced by the contents of any other s-1 words in the memory. A near optimal iterative method for construction of test patterns is proposed The systematic structure of the proposed test results in simple BIST implementations.

• Journal of KIISE:Computing Practices and Letters
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• v.7 no.1
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• pp.99-107
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• 2001

In this paper, we implemented memory BIST circuit based on ION march algorithm, and the IEEE 1149.1 has been designed as main controlJer for embedded memory testing. The implemented memory BIST can be used for word-oriented memory since it adopts background data, this is avaliable for word-oriented memory. It is able to detect all stuck-at faults, transition faults, coupling faults, and address decoder faults in the word-oriented memory. Memory BIST and IEEE 1149.1 are described at RTL level in Verilog-HDL, and synthesized with the Synopsys. The synthesized circuits are fully velified using VerilogXL and memory cell generated by memory compiler.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.2 s.344
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• pp.51-59
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• 2006

Von Neumann architecture suffers from the interface between the central processing unit and the memory, which is called 'Von Neumann bottleneck' In this paper, we propose a scalable general-purpose associative processor (AP) based on content-addressable memory (CAM) which solves this problem and is suitable for the search-oriented applications. We propose an efficient instruction set and a structural scalability to extend for larger applications. We define twelve instructions and provide some reduced instructions to speed up which execute two instructions in a single instruction cycle. The proposed AP performs in a bit-serial, word-parallel fashion and can be considered as a 32-bit general-purpose parallel processor with a massively parallel SIMD structure. We design and simulate a maximum/minumum search greater-than/less-than search, and parallel addition to verify the proposed architecture. The algorithms are executed in a constant time O(k) regardless of the number of input data.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.22 no.7
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• pp.1394-1402
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• 1997

In this work, an efficient test algorithm and BIST architeture a for embedded memories are presented. The proposed test algorithm can fully detect stuck-at fault, transition fault, coupling fault. Moreover, the proposed test algorithm can detect nighborhood pattern sensitive fault which could not be detected in previous march test algoarithms. The proposed test algorithm perposed test algorithm performs testing for neghborhood pattern sensitive fault using backgroung data which has been used word-oriented memory testing.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.47 no.11
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• pp.30-36
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• 2010

In recent memories, repair is an unavoidable method to maintain its yield and quality. Although many word oriented memories as well as embedded memories in system-on-chip (SOC) consists of multiple local memory blocks with a global spare architecture, most of previous studies on built-in redundancy analysis (BIRA) algorithms have focused on single memory block with a local spare architecture. In this paper, a new BIRA algorithm for multiple blocks with a global spare architecture is proposed. The proposed BIRA is basd on CRESTA which is able to achieve optimal repair rate with almost zero analysis time. In the proposed BIRA, all repair solutions for local memory blocks are analyzed by local analyzers which belong to each local memory block and then compared sequentially and judged whether each solution can meet the limitation of the global spare architecture or not. Experimental results show that the proposed BIRA achieves much faster analysis speed compared to previous BIRAs with an optimal repair rate.

• Sleep Medicine and Psychophysiology
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• v.6 no.2
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• pp.149-157
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• 1999

A Computerzed Neuropsychological Test(CNT) system using multimedia and object oriented technologies are developed for clinical application in psychiatry. The developed system is composed of 14 neuropsychologial tests which are capable of evaluation of various cognitive functions and functional localization of brain. The system employs Microsoft Window based graphic user interface for easy operation and it has a touch screen and a mouse as input devices from the patient. Speech perception test, color word test, verbal memory test, contingent continuos performance test, and trail making test were translated into korean language, so that usefulness of tests was maximized. Through the results of utilization of this system in the cases of patients with head trauma and psychiatric desorder, this system can be proved to be useful in the evaluation of cognitive function and functional localization of brain.