• Nuclear Engineering and Technology
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• v.50 no.3
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• pp.439-445
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• 2018

Experimental measurements of the response of $BF_3$ detector to a 3 Ci Am-Be neutron source for three different reflecting materials, i.e., aluminum, wood, and Perspex of varying thicknesses have been carried out. The varying contribution of wall effect to the response due to change in active volume of the detector has also been determined experimentally. Then, a Monte Carlo code has been developed for the calculation of the neutron response function of the $BF_3$ detector using source biasing and importance sampling. This code simulates the $BF_3$ detector response exposed to the neutron field in a three-dimensional source, detector, and reflecting medium configurations. The results of simulation have been compared with the corresponding experimental measurements and are found to be in good agreement. The experimental neutron albedo measurements for various values of Perspex thickness show saturating behavior, and results agree very well with the data obtained by Monte Carlo simulation.

• Journal of the Korean Magnetics Society
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• v.11 no.6
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• pp.262-266
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• 2001

The magnetic switching volume is known as an important parameter to understand the magnetization reversal process, thermal stability of the written information and media noise. This parameter is influenced significantly by the microstructure of the magnetic layer as well as underlayer. Therefore, we fabricated CoSm/Cr thin films with varying magnetic layer thickness under constant sputtering by using a dc magnetic sputtering machine. The magnetic layer thickness effect on the magnetic switching volume have been studied by the means of magnetic viscosity and dc demagnetization remanence curve mesurements. From these measurements, we found that the switching volumes increased with increasing the magnetic layer thickness, whereas the coercivity showed different behavior. These may be a result of the increased intergranular coupling and the larger volume fraction of the magnetic layer.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.11
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• pp.781-790
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• 2001

The effects of silicon substrate thickness on the performance of thin film PZT IR detectors are theoretically and experimentally investigated. Theoretical analyses show that the pyroelectric current responsivity of a detector without a silicon substrate is about two orders higher than that of a detector with a 450${\mu}{\textrm}{m}$ thick silicon substrate. At a fixed chopping frequency of 100Hz, the pyroelectric current responsivity decreases exponentially with increasing silicon substrate thickness up to 50${\mu}{\textrm}{m}$, and above 50${\mu}{\textrm}{m}$ the decreasing rate become slow. The thinner the silicon substrate is, the less the thermal loss by conduction is , and thus the higher responsivity is resulted. To verify the theoretical analyses, micromachined PZT thin film IR detectors with different silicon substrate thicknesses are fabricated and characterized. The theoretical and experimental results show the similar tendencies for all silicon substrates with varying thickness.

• Journal of Korean Society of Steel Construction
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• v.21 no.5
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• pp.527-536
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• 2009

The purpose of this experimental study was to investigate the block shear fracture behavior and curling effect on a single shear-bolted connection in thin-walled carbon steel fabricated with four bolts. The specimens that fail by block shear were planned to have a constant dimension of the edge distance perpendicular to the loading direction, bolt diameter, pitch, and gage. The main variables of the specimens were plate thickness and end distance parallel to the loading direction. A monotonic tensile test was carried out for the bolted connections, and the ultimate behaviors, such as the fracture shape, ultimate strength, and curling, were compared with those that had been predicted using the current design specifications. The conditions of curling occurrence in terms of plate thickness and end distance were also investigated, and the strength reduction due to curling was considered.

• Proceedings of the Korean Society of Near Infrared Spectroscopy Conference
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• 2001.06a
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• pp.4112-4112
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• 2001

The feasibility of NIR spectroscopy as a quick and nondestructive method for quality control of uniformity of coating thickness of pharmaceutical tablets was investigated. Near infrared spectra of a set of pharmaceutical tablets with varying coating thickness were measured with a diffuse reflectance fiber optic probe connected to a Broker IFS 28/N FT-NIR spectrometer. The challenging issues encountered in this study included: 1. The similarity of the formulation of the core and coating materials, 2. The lack of sufficient calibration samples and 3. The non-linear relationship between the NIR spectral intensity and coating: thickness. A peak at 7184 $cm^{-1}$ was identified that differed for the coating material and the core material when M spectra were collected at 2 $cm^{-1}$ resolution (0.4 nm at 7184 $cm^{-1}$). The study showed that the coating thickness can be analyzed by polynomial fitting of the peak area of the selected peak, while least squares calibration of the same data failed due to the lack of availability of sufficient calibration samples. Samples of coal powder and solid pieces of coal were analyzed by FT-NIR diffuse reflectance spectroscopy with the goal of predicting their ash content, percentage of volatile components, and energy content. The measurements were performed on a Broker Vector 22N spectrometer with a fiber optic probe. A partial least squares model was constructed for each of the parameters of interest for solid and powdered sample forms separately. Calibration models varied in size from 4 to 10 PLS ranks. Correlation coefficients for these models ranged from 86.6 to 95.0%, with root-mean-square errors of cross validation comparable to the corresponding reference measurement methods. The use of FT-NIR diffuse reflectance measurement techniques was found to be a significant improvement over existing measurement methodologies in terms of speed and ease of use, while maintaining the desired accuracy for all parameters and sample forms.(Figure Omitted).

• 한국신재생에너지학회:학술대회논문집
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• 2011.05a
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• pp.112.1-112.1
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• 2011

The back contact solar cell (BCSC) has several advantages compared to the conventional solar cell since it can reduce grid shadowing loss and contact resistance between the electrode and the silicon substrate. This paper presents the effect of the surface texturing of the silicon BCSC by varying the texturing depth or the texturing gap in the commercially available simulation software, ATHENA and ATLAS of the company SILVACO. The texturing depth was varied from $5{\mu}m$ to $150{\mu}m$ and the texturing gap was varied from $1{\mu}m$ to $100{\mu}m$ in the simulation. The resulting efficiency of the silicon BCSC was evaluated depending on the texturing condition. The quantum efficiency and the I-V curve of the designed silicon BCSC was also obtained for the analysis since they are closely related with the solar cell efficiency. Other parameters of the simulated silicon BCSC are as follows. The substrate was an n-type silicon, which was doped with phosphorous at $6{\times}10^{15}cm^{-3}$, and its thickness was $180{\mu}m$, a typical thickness of commercial solar cell substrate thickness. The back surface field (BSF) was $1{\times}10^{20}\;cm^{-3}$ and the doping concentration of a boron doped emitter was $8.5{\times}10^{19}\;cm^{-3}$. The pitch of the silicon BCSC was $1250{\mu}m$ and the anti-reflection coating (ARC) SiN thickness was $0.079{\mu}m$. It was assumed that the texturing was anisotropic etching of crystalline silicon, resulting in texturing angle of 54.7 degrees. The best efficiency was 25.6264% when texturing depth was $50{\mu}m$ with zero texturing gap in case of low texturing depth (< $100{\mu}m$).

• Steel and Composite Structures
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• v.17 no.4
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• pp.497-516
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• 2014

The ultimate carrying capacity of axially loaded welded square box section members made of medium and high strength steels (nominal yield stresses varying from 345 MPa to 460 MPa), with large width-to-thickness ratios ranging from 35 to 70, is analyzed by finite element method (FEM). At the same time, the numerical results are compared with the predicted results using Direct Strength Method (DSM), modified DSM and Effective Yield Strength Method (EYSM). It shows that curve a, rather than curve b recommended in Code for design of steel structures GB50017-2003, should be used to check the local-overall interaction buckling strength of welded square section columns fabricated from medium and high strength steels when using DSM, modified DSM and EYSM. Despite all this, EYSM is conservative. Compared to EYSM and modified DSM, DSM provides a better prediction of the ultimate capacities of welded square box compression members with large width-thickness ratios over a wide range of width-thickness ratios, slenderness ratios and steel grades. However, for high strength steels (nominal yield strength greater than 460 MPa), the numerical and existent experimental results indicate that DSM overestimates the load-carrying capacities of the columns with width-thickness ratio smaller than 45 and slenderness ratio less than 80. Further, for the purpose of making it suitable for a wider scope, DSM has been modified (called proposed modified DSM). The proposed modified DSM is in excellent agreement with the numerical and existing experimental results.

• Journal of the Society of Naval Architects of Korea
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• v.48 no.5
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• pp.457-464
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• 2011

This paper deal with the validation of correction method of ice strength and thickness to the sea trial condition based on the ice model test results. It is very difficult to conduct the model test corresponding to the sea trial condition exactly. In addition, the available sea trial data is not sufficient for the validation of correction method. In the present study, the model test results of Terry-Fox ice breker have been used to compare the corrected results of sea trial test by varying its thickness and strength of model ice. The HSVA and ITTC methods have been applied to the present comparisions and the required power has been also validated by using the HSVA method. There are rather good agreement between the sea trial result and model test corrected by the HSVA and ITTC method. The more comparisons are expected to be carried out in near future.

• Journal of the Korean Magnetics Society
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• v.8 no.5
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• pp.288-294
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• 1998

Effect of degree of intermixing at the Ta/NiFe interface induced by varying applied substrate bias voltage during NiFe free layer deposition on change of magnetoresistance in Substrate/Ta/NiFe/Cu/NiFe/FeMn/Ta spin valve multilayers was investigated. It was found that the optimum NiFe free layer thickness showing a maximum MR increase with increasing the bias voltage. The increase of the optimum thickness was due to the increase of the intermixed layer thickness with a bias voltage. The weak ferromagnetic or non ferromagnetic intermixed layer plays as a spin-independent scattering region and does not contribute on spin-dependent scattering. The existence of the intermixed layer was proved by the means of electrical resistivity and magnetization changes. In the present study, the optimum "effective" free layer thickness which gives the highest MR ratio was a constant independent of the magnitude of the bias voltage we have used.have used.

• Korean Journal of Materials Research
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• v.25 no.1
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• pp.54-59
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• 2015

Glancing angle deposition (GLAD) is a powerful technique to control the morphology and microstructure of thin film prepared by physical vapor deposition. Chromium (Cr) thin films were deposited on a polymer substrate by a sputtering technique using GLAD. The change in thickness and Vickers microhardness for the samples was observed with a change in the glancing angle. The adhesion properties of the critical load (Lc) by a scratch tester for the samples were also measured with varying the glancing angle. The critical load, thickness and Vickers microhardness for the samples decreased with an increase in the glancing angle. However, the thickness of the Cr thin film prepared at a $90^{\circ}$ glancing angle showed a relatively large value of 50 % compared to that of the sample prepared at $0^{\circ}$. The results of X-ray diffraction and scanning electron microscopy demonstrated that the effect of GLAD on the microstructure of samples prepared by sputter technique was not as remarkable as the samples prepared by evaporation technique. The relatively small change in thickness and microstructure of the Cr thin film is due to the superior step-coverage properties of the sputter technique.