• Title/Summary/Keyword: transparent semiconductor

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A Study on Vacuum-deposited Transparent OLED to Improve Its Transmittance and Luminescence Characteristics with a Mesh Electrode (진공 증착 투명 OLED 투과도 및 발광 특성 개선을 위한 Mesh 전극 연구)

  • Young Woo Kim;Yongmin Jeon;Eou-Sik Cho;Sang Jik Kwon
    • Journal of the Semiconductor & Display Technology
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    • v.23 no.2
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    • pp.82-86
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    • 2024
  • With the growing field and growing interest in transparent organic light-emitting diodes (TOLED) in the industry, various attempts are being made to improve the transmittance and performance of TOLED. TOLEDs are expected to be used in next-generation displays such as mixture reality (MR) displays, displayable windows, televisions, etc. This study presents a mesh TOLED with better transmittance and luminescence characteristics than existing TOLEDs through an in-situ vacuum deposition method that does not require additional processes such as photolithography and etching. In this study the mesh TOLED's cathode consists of Mg: Ag 1:9 electrode. Mesh patterns are interconnected with a 6 nm layer of interlayer. We approached transmittance improvement up to 30% at 555 nm at the cathode electrode with similar current injection character, also we improved lumination characteristics up to 23% at 7 V driving condition.

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Approach to High Stable Oxide Thin-Film Transistors for Transparent Active Matrix Organic Light Emitting Devices

  • Cheong, Woo-Seok;Lee, Jeong-Min;Jeong, Jae-Kyeong;KoPark, Sang-Hee;Yoon, Sung-Min;Cho, Doo-Hee;Ryu, Min-Ki;Byun, Chun-Won;Yang, Shin-Hyuk;Chung, Sung-Mook;Cho, Kyoung-Ik;Hwang, Chi-Sun
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.382-384
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    • 2009
  • In this study, high stable oxide thin-film transistors (TFTs) have been developed by using several approaching techniques, which including a change of the channel composition ratio in multi-component oxide semiconductors, a change of TFT structure with interfacial dielectric layers, a control of interface roughness, a channel-doping method, and so on.

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Graphene field-effect transistor for radio-frequency applications : review

  • Moon, Jeong-Sun
    • Carbon letters
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    • v.13 no.1
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    • pp.17-22
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    • 2012
  • Currently, graphene is a topic of very active research in fields from science to potential applications. For various radio-frequency (RF) circuit applications including low-noise amplifiers, the unique ambipolar nature of graphene field-effect transistors can be utilized for high-performance frequency multipliers, mixers and high-speed radiometers. Potential integration of graphene on Silicon substrates with complementary metal-oxide-semiconductor compatibility would also benefit future RF systems. The future success of the RF circuit applications depends on vertical and lateral scaling of graphene metal-oxide-semiconductor field-effect transistors to minimize parasitics and improve gate modulation efficiency in the channel. In this paper, we highlight recent progress in graphene materials, devices, and circuits for RF applications. For passive RF applications, we show its transparent electromagnetic shielding in Ku-band and transparent antenna, where its success depends on quality of materials. We also attempt to discuss future applications and challenges of graphene.

Oxide/Organic Hybrid TFTs for Flexible Devices

  • Yang, Shin-Hyuk;Cho, Doo-Hee;KoPark, Sang-Hee;Lee, Jeong-Ik;Cheong, Woo-Seok;Yoon, Sung-Min;Ryu, Min-Ki;Byun, Chun-Won;Kwon, Oh-Sang;Cho, Kyoung-Ik;Chu, Hye-Yong;Hwang, Chi-Sun;Ahn, Taek;Choi, Yoo-Jeong;Yi, Mi-Hye;Jang, Jin
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.393-395
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    • 2009
  • We fabricated oxide and oxide/organic hybrid TFTs on a glass substrate using the photolithography process under $200^{\circ}C$. We adopt the solution processed organic ferroelectric materials of P(VDF-TrFE) and polyimide (KSPI) insulator for 1-T structure memory and flexible device, respectively. All devices have successfully operated and showed the possibility of hybrid TFTs for the application to the flexible electronic devices.

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Simulations of Transmittance for the ITO/Ag/ITO Multiple Transparent Electrode Layers by 3 Dimensional FDTD Method (3차원 FDTD 방법에 의한 ITO/Ag/ITO 다층 투명전극막의 투과도 시뮬레이션)

  • Kim, Ki Rak;Cho, Eou Sik;Kwon, Sang Jik
    • Journal of the Semiconductor & Display Technology
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    • v.19 no.3
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    • pp.88-92
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    • 2020
  • As a highly conductive and transparent electrode, the optical transmittances of ITO/Ag/ITO were simulated and compared with the experimental results. The simulations are based on the finite-difference time-domain (FDTD) method in solving linear Maxwell equations. In our simulations, the computation domain is set in the XZ-plane with 3D dimension, and a plane wave with variable wavelengths ranging from 250 nm to 850 nm is incident in the z-direction at normal incidence to the ITO/Ag/ITO film surrounded by free-air space. As the results through both simulations and experiments, it was shown that the thickness combinations by the ITO layers of about 40 nm and the Ag layer of about 10 nm could be most suitable conditions as a high conductive transparent electrode having the transmittance similar to that of a single ITO layer.

Enhancement of Light Extraction from Transparent OLED Lighting Panels (투명 OLED 면광원 광 추출 향상 기술)

  • Park, June Buem;Shin, Dong-Kyun;Han, Seun Gjo;Park, Jong-Woon
    • Journal of the Semiconductor & Display Technology
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    • v.16 no.4
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    • pp.41-45
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    • 2017
  • We have investigated the light extraction efficiency of large-area OLED lighting panels with a microlens array (MLA) or external scattering layer (ESL) by ray tracing simulation. The application of MLA and ESL to transparent OLEDs (TOLEDs) with an auxiliary metal electrode is also studied. It is found that MLA shows higher light extraction efficiency, compared with ESL. However, we have demonstrated that ESL is more suitable for TOLEDs having dual-sided equal light emission. Namely, equal light emission from the front and rear surfaces of TOLED can be achieved by increasing the scattering particle density of ESL. To compensate for a loss in light emission induced by auxiliary metal electrode, we come out with an OLED structure partially covered with MLA at the outer surface of glass substrate, which is aligned with metal electrode. With this scheme, it is observed that the light extraction efficiency can be boosted more than 20% from opaque OLED and 50% from transparent OLED.

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Antireflective ZTO/Ag bilayer-based transparent source and drain electrodes for highly transparent thin film transistors

  • Choe, Gwang-Hyeok;Kim, Han-Gi
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2012.05a
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    • pp.110.2-110.2
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    • 2012
  • We reported on antireflective ZnSnO (ZTO)/Ag bilayer and ZTO/Ag/ZTO trilayer source/drain (S/D) electrodes for all-transparent ZTO channel based thin film transistors (TFTs). The ZTO/Ag bilayer is more transparent (83.71%) and effective source/drain (S/D) electrodes for the ZTO channel/Al2O3 gate dielectric/ITO gate electrode/glass structure than ZTO/Ag/ZTO trilayer because the bottom ZTO layer in the trilayer increasea contact resistance between S/D electrodes and ZTO channel layer and reduce the antireflection effect. The ZTO based all-transparent TFTs with ZTO/Ag bilayer S/D electrode showed a saturation mobility of 4.54cm2/Vs and switching property (1.31V/decade) comparable to TTFT with Ag S/D electrodes.

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Characteristics of amorphous IZTO-based transparent thin film transistors (비정질 IZTO기반의 투명 박막 트렌지스터 특성)

  • Shin, Han-Jae;Lee, Keun-Young;Han, Dong-Cheul;Lee, Do-Kyung
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.06a
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    • pp.151-151
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    • 2009
  • Recently, there has been increasing interest in amorphous oxide semiconductors to find alternative materials for an amorphous silicon or organic semiconductor layer as a channel in thin film transistors(TFTs) for transparent electronic devices owing to their high mobility and low photo-sensitivity. The fabriction of amorphous oxide-based TFTs at room temperature on plastic substrates is a key technology to realize transparent flexible electronics. Amorphous oxides allows for controllable conductivity, which permits it to be used both as a transparent semiconductor or conductor, and so to be used both as active and source/drain layers in TFTs. One of the materials that is being responsible for this revolution in the electronics is indium-zinc-tin oxide(IZTO). Since this is relatively new material, it is important to study the properties of room-temperature deposited IZTO thin films and exploration in a possible integration of the material in flexible TFT devices. In this research, we deposited IZTO thin films on polyethylene naphthalate substrate at room temperature by using magnetron sputtering system and investigated their properties. Furthermore, we revealed the fabrication and characteristics of top-gate-type transparent TFTs with IZTO layers, seen in Fig. 1. The experimental results show that by varying the oxygen flow rate during deposition, it can be prepared the IZTO thin films of two-types; One a conductive film that exhibits a resistivity of $2\times10^{-4}$ ohm${\cdot}$cm; the other, semiconductor film with a resistivity of 9 ohm${\cdot}$cm. The TFT devices with IZTO layers are optically transparent in visible region and operate in enhancement mode. The threshold voltage, field effect mobility, on-off current ratio, and sub-threshold slope of the TFT are -0.5 V, $7.2\;cm^2/Vs$, $\sim10^7$ and 0.2 V/decade, respectively. These results will contribute to applications of select TFT to transparent flexible electronics.

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비정질 산화물 반도체 IGZO 박막의 특성 연구

  • Jang, Yajuin;Kim, Hong-Bae
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.08a
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    • pp.287-287
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    • 2012
  • 최근 투명 산화물 반도체(TOS: Transparent Oxide Semiconductor)중에 비정질 산화물 반도체(amorphous oxide semiconductor)를 이용한 트랜지스터 연구가 활발히 진행되고 있다. 비정질 산화물 반도체는 박막 트렌지스터 소자의 Active Layer으로 사용할 수 있다. 본 연구는 RF magnetron sputtering법으로 유리기판 위에 IGZO박막을 증착하였다. 박막 증착 조건은 초기 압력 $3.0{\times}10^{-6}$ Torr, 증착 압력 20 mTorr, 반응가스 Ar 50 sccm, RF power 30w, 증착 온도는 실온으로 고정하였으며, 공정변수로 증착 시간을 변화시키며 IGZO박막을 증착하였다. IGZO 타겟은 $In_2O_3$, $Ga_2O_3$, ZnO 분말을 각각 1:1:1 mol% 조성비로 혼합하여 소결한 타겟을 사용하였다. XRD 분석결과에 따라서 Bragg's 법칙을 만족하는 피크가 나타나지 않는 비정질 구조임을 확인할 수 있었다. 가시광 영역에서(450~700 nm) 모든 박막은 90% 이상 투과도를 나타내었다. 증착시간이 증가할수록 밴드갭이 감소하는 것을 확인하였다. 증착시간이 5분인 경우 캐리어 농도는 $2.2{\times}10^{19}$ $cm^{-3}$, 이동도는 7.5 $cm^2/V-s$, 비저항은 $3.8{\times}10^{-2}{\Omega}$-cm의 반도체 특성을 나타냈고, 박막 트렌지스터 소자의 Active Layer으로 사용할 수 있다.

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Selective Laser Direct Patterning of Indium Tin Oxide on Transparent Oxide Semiconductor Thin Films

  • Lee, Haechang;Zhao, Zhenqian;Kwon, Sang Jik;Cho, Eou Sik
    • Journal of the Semiconductor & Display Technology
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    • v.18 no.4
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    • pp.6-11
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    • 2019
  • For a wider application of laser direct patterning, selective laser ablation of indium tin oxide (ITO) film on transparent oxide semiconductor (TOS) thin film was carried out using a diode-pumped Q-switched Nd:YVO4 laser at a wavelength of 1064 nm. In case of the laser ablation of ITO on indium gallium zinc oxide (IGZO) film, both of ITO and IGZO films were fully etched for all the conditions of the laser beams even though IGZO monolayer was not ablated at the same laser beam condition. On the contrary, in case of the laser ablation of ITO on zinc oxide (ZnO) film, it was possible to etch ITO selectively with a slight damage on ZnO layer. The selective laser ablation is expected to be due to the different coefficient of thermal expansion (CTE) between ITO and ZnO.