• Applied Microscopy
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• 제2권1호
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• pp.39-46
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• 1972

There are many kinds of microscopes suitable for general studies; optical microscopes(OM), conventional transmission electron microscopes (TEM), and scanning electron microscopes(SEM). The optical microscopes and the conventional transmission electron microscopes are very familiar. The images of these microscopes are directly formed on an image plane with one or more image forming lenses. On the other hand, the image of the scanning electron microscope is formed on a fluorescent screen of a cathode ray tube using a scanning system similar to television technique. In this paper, the features and some applications of the scanning electron microscope will be discussed briefly. The recently available scanning electron microscope, combining a resolution of about $200{\AA}$ with great depth of field, is favorable when compared to the replica technique. It avoids the problem of specimen damage and the introduction of artifacts. In addition, it permits the examination of many samples that can not be replicated, and provides a broader range of information. The scanning electron microscope has found application in diverse fields of study including biology, chemistry, materials science, semiconductor technology, and many others. In scanning electron microscopy, the secondary electron method. the backscattererd electron method, and the electromotive force method are most widely used, and the transmitted electron method will become more useful. Change-over of magnification can be easily done by controlling the scanning width of the electron probe. It is possible. to continuously vary the magnification over the range from 100 times to 1.00,000 times without readjustment of focusing. Conclusion: With the development of a scanning. electron microscope, it is now possible to observe almost all-information produced through interactions between substances and electrons in the form of image. When the probe is properly focused on the specimen, changing magnification of specimen orientation does not require any change in focus. This is quite different from the conventional transmission electron microscope. It is worthwhile to note that the typical probe currents of $10^{-10}$ to $10^{-12}\;{\AA}$ are for below the $10^{-5}$ to $10^{-7}\;{\AA}$ of a conventional. transmission microscope. This reduces specimen contamination and specimen damage due to heatings. Outstanding features of the scanning electron microscope include the 'stereoscopic observation of a bulky or fiber specimen in high resolution' and 'observation of potential distribution and electromotive force in semiconductor devices'.

• Applied Microscopy
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• 제51권
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• pp.1.1-1.2
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• 2021

We demonstrate a fabrication of an atomically controlled single-crystal heart-shaped nanostructure using a convergent electron beam in a scanning transmission electron microscope. The delicately controlled e-beam enable epitaxial crystallization of perovskite oxide LaAlO₃ grown out of the relative conductive interface (i.e. 2 dimensional electron gas) between amorphous LaAlO₃/crystalline SrTiO₃.

• 식물조직배양학회지
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• 제22권6호
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• pp.323-327
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• 1995

미나리의 체세포 배발생 과정을 해부학적으로 구명하기 위하여 배발생 기원세포와 캘러스를 광학현미경 및 전자현미경으로 관찰한 결과, 배발생 세포는 hematoxylin에 짙은 보라색으로, 비배발생 세포는 safranin에 적색으로 염색되어 광학현미경하에서 쉽게 구별할 수 있었다. 배발생 캘러스는 많은 수의 원배 및 발육중인 배, 비배발생 세포 등으로 구성되어 있었다. 체세포 배발생은 발육 중인 배나 세포괴의 표피세포에 위치한 배발생 세포의 하나가 분열하거나 세포괴내의 비배발생 세포속에 묻혀 있는 배발생 세포가 분열하여 일어났다. 배발생 과정은 항상 일정한 형태는 아니지만 단세포로부터 일정한 segmentation 과정를 거쳐서 배발생이 진행되는 것으로 나타났다. 투과전자현미경에 의한 관찰에서 배발생 세포는 비배발생 세포에 비하여 세포질이 조밀하고 핵이 대형이며 amyloplast, 인지질체 및 세포소기 관들이 많으며 액포가 없거나 매우 작았다. 이들 세포들은 두터운 세포벽에 의하여 주위의 비배발생 세포와 분리되어 있으며 세포윤곽은 둥글었다. 주사전자현미경으로 관찰한 배발생캘러스는 외부가 그물이 씌워진 형태의 구형의 다양한 크기의 배들과 비교적 크기가 큰 비배발생 세포들이 혼재하였다. 한편 비배발생능 캘러스는 구성세포가 크고 외부에는 gelatin같은 물질로 덮여 있었다.

• 한국식품영양과학회지
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• 제29권6호
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• pp.1112-1115
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• 2000

• 한국세라믹학회지
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• 제36권10호
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• pp.1132-1138
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• 1999

• 한국전자현미경학회:학술대회논문집
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• 한국현미경학회 2001년도 제32차 추계학술대회
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• pp.18-22
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• 2001

A technique to characterize specific site of materials using a combination of a dedicated focused ion beam system(FIB), and Intermediate-voltage scanning transmission electron microscope(STEM) or transmission electron microscope(TEM) equipped with a scanning electron microscope(SEM) unit has been developed. The FIB system is used for preparation of electron transparent thin samples, while STEM or TEM is used for localization of a specific site to be milled in the FIB system. An FIB-STEM(TEM) compatible sample holder has been developed to facilitate thin sample preparation with high positional accuracy Positional accuracy of $0.1{\mu}m$ or better can be achieved by the technique. In addition, an FIB micro-sampling technique has been developed to extract a small sample directly from a bulk sample in a FIB system These newly developed techniques were applied for the analysis of specific failure in Si devices and also for characterization of a specific precipitate In a metal sample.

• 대한금속재료학회지
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• 제48권1호
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• pp.57-61
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• 2010

Nanosized surface structures of Cu powders were investigated at the atomic scale by field-emission transmission electron microscope techniques. The nanoscale surface oxide layer on the Cu powder was analyzed to be the $CU_2O$ phase by electron diffraction pattern and electron energy-loss spectroscopy. In addition, it was found from high-resolution transmission electron microscopy study that there are formed no surface oxide layers on the surface of alkanethiol coated Cu powders.

• Nuclear Engineering and Technology
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• 제44권5호
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• pp.491-500
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• 2012

The dissimilar metal joints welded between Ni-based alloy, Alloy 690 and low alloy steel, A533 Gr. B with Alloy 152 filler metal were characterized by using optical microscope, scanning electron microscope, transmission electron microscope, secondary ion mass spectrometry and 3-dimensional atom probe tomography. It was found that in the weld root region, the weld was divided into several regions including unmixed zone in Ni-base alloy, fusion boundary, and heat-affected zone in the low alloy steel. The result of nanostructural and nanochemical analyses in this study showed the non-homogeneous distribution of elements with higher Fe but lower Mn, Ni and Cr in A533 Gr. B compared with Alloy 152, and the precipitation of carbides near the fusion boundary.

• Applied Microscopy
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• 제45권3호
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• pp.107-114
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• 2015

Two-dimensional (2D) materials containing hole defects are a promising substitute for conventional nanopore membranes like silicon nitride. Hole defects on 2D materials, as atomically thin nanopores, have been used in nanopore devices, such as DNA sensor, gas sensor and purifier at lab-scale. For practical applications of 2D materials to nanopore devices, researches on characteristics of hole defects on graphene, hexagonal boron nitride and molybdenum disulfide have been conducted precisely using transmission electron microscope. Here, we summarized formation, features, structural preference and stability of hole defects on 2D materials with atomic-resolution transmission electron microscope images and theoretical calculations, emphasizing the future challenges in controlling the edge structures and stabilization of hole defects. Exploring the properties at the local structure of hole defects through in situ experiments is also the important issue for the fabrication of realistic 2D nanopore devices.

• Applied Microscopy
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• 제21권1호
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• pp.108-120
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• 1991

Principles of electron diffraction patterns in transmission electron microscope are described for beginners in terms of reciprocal lattices and Ewald sphere. Analysis of both ring patterns and spot patterns are illustrated with practical examples as well as basic calibrations of TEM. Especially convergent beam electron diffraction method is emphasized for the determination of lattice parameters, microstrains, and thickness of thin foil followed by a review of microcomputer programs for the electron diffraction analyses explained in this paper.