• ETRI Journal
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• 제17권1호
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• pp.1-10
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• 1995

We have achieved very low threshold current densities with high light output powers for InGaAs/ GaAs surface-emitting lasers using a periodic gain active structure in which three quantum wells are inserted in two-wavelength-thick (2${\lambda}$ ) cavity. Air-post type devices with a diameter of 20~40${\mu}m$ exhibit a threshold current density of 380~410$A/cm^2$. Output power for a 40${\mu}m$ diameter device reaches over 11 mW. A simple theoretical calculation of the threshold and power performances indicates that the periodic gain structure has an advantage in achieving low threshold current density mainly due to the high coupling efficiency between gain medium and optical field. The deterioration of power, expected from the long cavity length of $2{\lambda}$, is negligible.

• 전자공학회논문지A
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• 제30A권10호
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• pp.27-32
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• 1993

Separate-confinement hetero-structure (SCH) broad area Laser Diodes (LD's) were fabricated from $Al_{0.07}$Ga$_{0.93}$/. As single-quantum-well (SQW) grown by metal organic chemical vapor deposition (MOCVD). Under pulsed operation, we obtained maximum output powers of about 0.8watt/facet and 1.83watt/facet from LD's with 60$\mu$m and 160$\mu$m channel width, respectively, without facet coatings. The differential quantum efficiency of the 60$\mu$m wide LD was about 21.7%/facet and its threshold current density was about 1k [A/cm$^{2}$]. The differential quantum efficiency of the 160$\mu$m wide LD was about 25.6%/facet and its threshold current density was about 1k[A/cm$^{2}$]. The minimum threshold current density of 60$\mu$m wide LD's was 620[A/cm$^{2}$] when the cavity length was 603$\mu$m and the minimum threshold current density of 160$\mu$m wide Ld's was 675[A/cm$^{2}$] when the cavity length was 752$\mu$m. The internal quantum efficienty and the internal loss of both LD's were 92.3% and 18.1cm$^{1}$, respectively.

• 한국진공학회지
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• 제17권6호
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• pp.523-527
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• 2008

GaAs/AlGaAs 물질계를 기반으로 한 양자폭포레이저를 제작하였다. 양자폭포레이저는 활성층의 위까지만 식각된 shallow mesa 구조와 활성층까지 식각된 deep mesa 구조로 제작되었다. shallow mesa 구조의 경우 문턱전류 밀도가 $26-32\;kA/cm^2$이었지만 deep mesa 구조의 경우 문턱전류 밀도는 $13\;kA/cm^2$로 대단히 감소되었다. Deep mesa 구조에서의 문턱전류 감소는 측면 방향으로의 전류 손실이 감소되었기 때문으로 설명되었다.

• 센서학회지
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• 제31권4호
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• pp.271-277
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• 2022

We analyzed the effects of the interface trap on the output characteristics of an inversion mode n-channel GaN Schottky barrier (SB)-MOSFET based on the N_it distribution using TCAD simulation. As interface trap number density (N_it) increased, the threshold voltage increased while the drain current density decreased. Under N_it=5.0×10¹⁰ cm^-2 condition, the threshold voltage was 3.2 V for V_DS=1 V, and the drain current density reduced to 2.4 mA/mm relative to the non-trap condition. Regardless of the N_it distribution type, there was an increase in the subthreshold swing (SS) following an increase in N_it. Under U-shaped N_it distribution, it was confirmed that the SS varied depending on the gate voltage. The interface fixed charge (Q_f) caused an shift in the threshold voltage and increased the off-state current collectively with the surface trap. In summary, GaN SB-MOSFET can be a building block for high power UV optoelectronic circuit provided the surface state is significantly reduced.

• 한국세라믹학회지
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• 제44권9호
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• pp.524-528
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• 2007

The results of evaluating steel corrosion in concrete containing chloride content of various levels indicated that the more chloride content in concrete leads to the lower potential and higher corrosion current density. However, the open circuit potential of steel varied with time and exposure condition, and the corelation between the open circuit potential and corrosion current density was not obvious. In order to determine the critical threshold content of chloride of steel corrosion in concrete, the concept of average corrosion current density was employed. The range of critical chloride content in portland cement concretes was about $1.56{\sim}1.77%$($Cl^-$, %, wt of cement content) along with water-cement ratio, and higher water-cement ratio resulted in reduction in critical threshold chloride content.

• 한국전기전자재료학회논문지
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• 제36권6호
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• pp.547-555
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• 2023

High-density crossbar arrays based on storage class memory (SCM) are ideally suited to handle an exponential increase in data storage and processing as a central hardware unit in the era of AI-based technologies. To achieve this, selector devices are required to be co-integrated with SCM to address the sneak-path current issue that indispensably arises in such crossbar-type architecture. In this perspective, we first summarize the current state of tellurium-based threshold-switching devices and recent advances in the material, processing, and device aspects. We thoroughly review the physicochemical properties of elemental tellurium (Te) and representative binary tellurides, their tailored deposition techniques, and operating mechanisms when implemented in two-terminal threshold switching devices. Lastly, we discuss the promising research direction of Te-based selectors and possible issues that need to be considered in advance.

• 한국광학회지
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• 제9권2호
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• pp.111-116
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• 1998

활성층의 변형이 0.9%의 압축변형에서 1.4%의 인장변형에 이르는 13개의 InGaAs/InGaAsP 따로가둠 이종접합 다중양자우물 레이저의 문턱전류밀도 값을 계산하여, 변형이 문턱전류밀도에 미치는 영향을 살펴보았다. 양자우물의 띠간격이 1.55.mu.m가 되도록 양자우물의 두께를 정하였고, 레이저의 이득계산을 위한 띠구조 및 전이행렬요소의 계산에는 블록대각화된 8 * 8 이차 $k^{\rarw}$ * $p^{\rarw}$ 해밀토니안을 사용하여 전도띠의 비포물선형 효과 및 원자가띠의 섞임을 모두 고려하였다. 실온의 문턴전류밀도는 중양공띠와 경양공띠가 교차하는 0.4% 인장변형의 값과 두번째 전도부띠가 생기기 시작하는 0.5% 인장변형의 값에서 불연속점을 가졌다. 실온의 문턱전류밀도는 이 0.4-0.5% 인장변형 부근에서 극대가 되고, 양쪽으로 변형값이 달라지면서 감소하였다가 극소점을 거쳐 다시 약간 증가하는 모습을 보였는데, 이는 실험결과와 대체로 일치한다. 이 계산결과를 변형의 효과에 관한 다른 여러 이론적 혹은 실험적인 논문들과 비교 토론하였다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1999년도 춘계학술대회 논문집
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• pp.450-453
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• 1999

In this paper, The relationship between device performance and channel length(1.5-50$\mu$m) in polysilicon thin-film transistors fabricated by SPC technology was Investigated by measuring electric Properties such as 1-V characteristics, field effect mobility, threshold voltage, subthreshold swing, and trap density in grain boundary with channel length. The drain current at ON-state increases with decreasing channel length due to increase of the drain field, while OFF-state current (leakage current) is independent of channel length. The field effect mobility decrease with channel length due to decreasing carrier life time by the avalanche injection of the carrier at high drain field. The threshold voltage and subthreshold swing decrease with channel length, and then increase in 1.5 $\mu$m increase of increase of trap density in grain boundary by impact ionization.

• 대한전자공학회논문지
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• 제25권7호
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• pp.780-790
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• 1988

We have studied the hot-carrier-induced degradation caused by the high channel electric field due to the decrease of the gate length of MOSFET used in VLSI. Under DC stress, the condition in which maximum substrate current occures gave the worst degradation. Under AC dynamic stress, other conditions, the pulse shape and the falling rate, gave enormous effects on the degradation phenomena, especially at 77K. Threshold voltage, transconductance, channel conductance and gate current were measured and compared under various stress conditions. The threshold voltage was almost completely recovered by hot-injection stress as a reverse-stress. But, the transconductance was rapidly degraded under hot-hole injection and recovered by sequential hot-electron stress. The Si-SiO2 interface state density was analyzed by a charge pumping technique and the charge pumping current showed the same trend as the threshold voltage shift in degradation process.

• 한국광학회:학술대회논문집
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• 한국광학회 2000년도 하계학술발표회
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• pp.162-163
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• 2000

We have observed the short-channel effect, narrow-channel effect and small-geometry effect in terms of a variation of the threshold voltage. For a short-channel effect the threshold voltage was largely determined by the DIBL effect which stimulates more carrier injection in the channel by reducing the potential barrier between the source and channel. The effect becomes more significant for a shorter-channel device. However, the potential, field and current density distributions in the channel along the transverse direction showed a better uniformity for shorter-channel devices under the same voltage conditions. The uniformity of the current density distribution near the drain on the potential minimum point becomes worse with increasing the drain voltage due to the enhanced DIBL effect. This means that considerations for channel-width effect should be given due to the variation of the channel distributions for short-channel devices. For CCDs which are always operated at a pinch-off state the channel uniformity thus becomes significant since they often use a device structure with a channel length of > 4 ${\mu}{\textrm}{m}$ and a very high drain (or diffusion) voltage. (omitted)