A Study on the Phase Change Characteristics of Si-doped Ge2Sb2Te5 Thin Films for PRAM (PRAM을 위한 Si-doped Ge2Sb2Te5 박막의 상변화 특성 연구)
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- Journal of the Korean Institute of Electrical and Electronic Material Engineers
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- v.23 no.4
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- pp.261-266
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- 2010