• Electrical & Electronic Materials
• /
• v.10 no.4
• /
• pp.349-354
• /
• 1997

This paper aims at studying the improvement of test method for t-weight sensitive fault (t-wsf) detect. The development of RAM fabrication technology results in not only the increase at device density on chips but also the decrease in line widths in VLSI. But, the chip size that was large and complex is shortened and simplified while the cost of chips remains at the present level, in many cases, even lowering. First of all, The testing patterns for RAM fault detect, which is apt to be complicated , need to be simplified. This new testing method made use of Local Lower Bound (L.L.B) which has the memory with the beginning pattern of 0(l) and the finishing pattern of 0(1). The proposed testing patterns can detect all of RAM faults which contain stuck-at faults, coupling faults. The number of operation is 6N at 1-weight sensitive fault, 9,5N at 2-weight sensitive fault, 7N at 3-weight sensitive fault, and 3N at 4-weight sensitive fault. This test techniques can reduce the number of test pattern in memory cells, saving much more time in test, This testing patterns can detect all static weight sensitive faults and pattern sensitive faults in RAM.

• Journal of Fashion Business
• /
• v.16 no.3
• /
• pp.78-94
• /
• 2012

This study devised and drew custom sleeve patterns by using a regression equation with the data from 7 models along with the sleeve that was slightly modified to make the general-purpose sleeve pattern. To devise a general-purpose sleeve pattern, the sleeve pattern was drawn as an object for comparison by applying the Bunka drafting system (sleeve pattern by the Bunka drafting system) to the basic upper garment. Actual sleeves, made by using the three types of patterns above, were created and tested by models. Next, 30 panel members participated in a sight test of the compatibility of the sleeves to examine the validity of the sleeve drafting method acquired using the regression equation. The test proved that the custom sleeve pattern and the general-purpose sleeve pattern were more suitable for the characteristics of arm structures. Thus, the new sleeve-cap part drafting method using the regression equation was shown to have validity. As a result, since a very significant correlation was obtained for the body measurement figures and the basic pattern of the adequate basic pattern of the sleeves, this study concludes that it is possible to come up with primary data that can be widely used by increasing the number of subjects.

• JSTS:Journal of Semiconductor Technology and Science
• /
• v.17 no.1
• /
• pp.147-155
• /
• 2017

A new endurance test-pattern generation on NAND-flash memory is proposed to improve test cost. We mainly focus on the correlation between the data-pattern and the device error-rate during endurance testing. The novelty is the development of testing method using quasi-random pattern based on device architectures in order to increase the test efficiency during time-consuming endurance testing. It has been proven by the experiments using the commercial 32 nm NAND flash-memory. Using the proposed method, the error-rate increases up to 18.6% compared to that of the conventional method which uses pseudo-random pattern. Endurance testing time using the proposed quasi-random pattern is faster than that of using the conventional pseudo-random pattern since it is possible to reach the target error rate quickly using the proposed one. Accordingly, the proposed method provides more low-cost testing solutions compared to the previous pseudo-random testing patterns.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
• /
• 2007.06a
• /
• pp.803-806
• /
• 2007

Since the different characteristics from the PRNG (Pseudo Random Number Generator) or various deterministic devices such as arithmetic processing units, new concepts and test methods should be suggested in order to test TRNG (Ture Random Number Generator). Deterministic devices can be covered by ATPG (Automatic Test Pattern Generation), which uses patterns generated by cyclic shift registers due to its hardware oriented characteristics, pure random numbers are not possibly tested by automatic test pattern generation due to its analog-oriented characteristics. In this paper, we studied and analyzed a hardware/software combined test method named Diehard test, in which we apply continuous pattern variation to check the statistics. We also point out the considerations when making random number tests.

• Journal of Advanced Marine Engineering and Technology
• /
• v.22 no.5
• /
• pp.687-692
• /
• 1998

Test pattern generation is one of most difficult problems encountered in automating the design of logic circuits. The goal is to obtain the highest fault coverage with the minimum number of test patterns for a given circuit and fault set. although there have been many deterministic algorithms and heuristics the problem is still highly complex and time-consuming. Therefore new approach-es are needed to augment the existing techniques. This paper considers the problem of test pattern improvement for combinational circuits as a restricted subproblem of the test pattern generation. The problem is to maximize the fault coverage with a fixed number of test patterns for a given cir-cuit and fault set. We propose a new approach by use of a genetic algorithm. In this approach the genetic algorithm evolves test patterns to improve their fault coverage. A fault simulation is used to compute the fault coverage of the test patterns Experimental results show that the genetic algorithm based approach can achieve higher fault coverages than traditional techniques for most combinational circuits. Another advantage of the approach is that the genetic algorithm needs no detailed knowledge of faulty circuits under test.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.40 no.7
• /
• pp.526-531
• /
• 2003

Recently, many BIST(Built-in Self Test) schemes have been researched to reduce test time and hardware. But, most BIST schemes about pattern generation are for deterministic pattern generation. In this paper a new pseudo-random BIST scheme is provided to reduce the existing test hardware and keep a reasonable length of test time. Theoretical study demonstrates the possibility of the reduction of the hardware for pseudo-random test with some explanations and examples. Also the experimental results show that in the proposed test scheme the hardware for the pseudo-random test is much less than in the previous scheme and provide comparison of test time between the proposed scheme and the current one.

• The Korean Journal of Nuclear Medicine Technology
• /
• v.16 no.1
• /
• pp.76-79
• /
• 2012

Purpose: This study was to evaluate usefulness of $^{99m}Tc$-MIBI scintimammography for dense breast by comparing concordance in test results between Tc-99m MIBI scintimammography and mammography whose effect was proved the most as an imaging tool depending on breast density and at the same time by examining limitation on evaluation depending on density of breast tissue. [Materials and Methods] In the period from December 2010 to July 2011, this study targeted 150 patients who took both of $^{99m}Tc$-MIBI scintimammography and mammography conducted by using breast gamma camera in this hospital. Breast density was classified to the four levels of pattern 1~4 based on the results of mammography. $^{99m}Tc$-MIBI scintimammography was conducted with the LCC, the RCC, the LMLO, and the RML one minute after intravenous injection of 99mTc-MIBI 7400 MBq (20 mCi) while analysis was made for concordance in test results of $^{99m}Tc$-MIBI scintimammography and mammography. [Results] Among the 150 patients, pattern 1 was found in 3 patients, pattern 2 in 44 patients, pattern 3 in 61 patients, and pattern 4 in 37 patients. There were 5 patients who showed the case where it was impossible to determine density of breast tissue due to foreign body inserted to breast. The concordance ratio of the results between $^{99m}Tc$-MIBI scintimammography and mammography was 95.5% for pattern 2, 95.1% for pattern 3 and 94.6% for pattern 4. This demonstrated that the concordance rate decreased according to the increase in breast density. [Conclusion] When there was limitation on evaluation of breast specific gamma imaging test results due to increased intake in breast tissue or surgical site, the concordance rate was 6.8% for pattern 2, 16.3% for pattern 3 and 18.9% for pattern 4. This demonstrated that the degree of limitation on evaluation of breast specific gamma imaging test results increased according to the increase in breast density.

• Journal of the Korean Institute of Telematics and Electronics B
• /
• v.30B no.5
• /
• pp.82-89
• /
• 1993

In this paper, we proposed the autonomous algorithm of pseudo-exhaustive testing for the multi-level combinational logic circuits. For the processing of shared-circuit that existed in each cone-circuit when it backtracked the path from PO to PI of CUT at the conventional verification testing, the dependent relation of PI-P0 is presented by a dependence matrix so it easily partitioned the sub-circuits for the pseudo-exhaustive testing. The test pattern of sub-circuit's C-inputs is generated using a binary counter and the test pattern of I-inputs is synthesized using a singular cover and consistency operation. Thus, according to the test patterns presented with the recipe cube, the number of test pattrens are reduced and it is possible to test concurrently each other subcircuits. The proposed algorithm treated CUT's net-list to the source file and was batch processed from the sub-circuit partitioning to the test pattern generation. It is shown that the range of reduced ration of generated pseudo-exhaustive test pattern exhibits from 85.4% to 95.8% when the average PI-dependency of ISACS bench mark circuits is 69.4%.

• Journal of the Korean Society of Costume
• /
• v.51 no.7
• /
• pp.147-165
• /
• 2001

The objective of this study was to develop the Jeogori Pattern for 9 to 10 year-old boys To determine the measurement items for the Jeogori Pattern making, applied factor analysis, correlation analysis and regression analysis to the 37 measurement items of the 9 to 10 year-old boys classified as a standard somatotype. To understand the shape and variation of the body surface, analyzed the replica of the upper body surface that was obtained by the method of using surgical tape. Be based on the results of the above studies, designed the Jeogori Pattern. The designed pattern was evaluated by the sensory test. The drafting methods of Jeogori Pattern obtained are as follows. $\circled1$ The measurement items are Bust Girth, Center Back Waist Length, Neck Width, and Hwajang Length. $\circled2$ Jeogori Length Center Back Waist Length$\times$4/3 $\circled3$ Front Body Girth(1/2) : B/2 + 1.5cm Back Body Girth(1/2) : B/2 + 3.5cm $\circled4$ Jin-Dong : B/4 + 3cm $\circled5$ Back Godae Width(1/2) : Neck Width/2 + 1.7cm Front Godae Width(l/2) : Back Godae Width(1/2) - 2cm $\circled6$Back Godae Point is 1.5cm higher than shoulder line, and Front Godae Point is 1.5cm lower than shoulder line. $\circled7$ Back Godae Depth: 1.2cm + 1.5cm = 2.7cm The Jeogori Pattern designed by the above method Is as (fig. 8) The results of the sensory test of the new pattern are as fellows. Except for 2 items, every mark of 24 test items has over 5.0 point and a total average mark is 5.25 point. Witch is a good mark. Therefore the new pattern is valid. Especially, the parts of Git, sleeves and back face have a high mark, so the appearances of those parts are excellent.

• Proceedings of the KSME Conference
• /
• 2001.06d
• /
• pp.840-845
• /
• 2001

Development of a small gas-turbine combustor for 100kW class APU(Auxiliary Power Unit) has been performed. This combustor is a reverse-annular type and has a tangential swirler in the liner head to improve the fuel/air mixing and flame stability. Three main and three pilot fuel injectors of the simplex pressure-swirl type are used. The performance target at the design condition includes a turbine inlet temperature of 1170K, a combustion efficiency of 99%, a pattern factor of 30%, and an engine durability of 3000 hours. Under developing the combustor, we conducted performance test of our first prototype(TS1) with some variants. As a result of the test, the performance targets of the combustor are satisfied except that the pattern factor is about 4% higher than target value. So, we redesigned the second prototype(TS2) and conduct performance test with the critical focus on pattern factor and exit mean temperature. We adopted TS2 four variant to check the improvement of pattern factor. As the result, the pattern factors of several variants were satisfied with the performance target. Finally, We chose the TS2A variant as a final combustor for our APU model.