• Title/Summary/Keyword: technology reliability

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Effect of Applied Voltage on the Reliability of Coating Flaw Detection of Pipe with Different Buried Depths

  • Lim, B.T.;Kim, M.G.;Kim, K.T.;Chang, H.Y.;Kim, Y.S.
    • Corrosion Science and Technology
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    • v.18 no.6
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    • pp.277-284
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    • 2019
  • External corrosion control of buried pipe can be achieved by the combination of barrier coating and cathodic protection. Coating damage and deterioration can be induced by many reasons; damage during handling and laying, enhanced failure at low temperatures, failure during commissioning and operation, disbanding due to inadequate surface cleaning, rock penetration during installation and service etc. This work focused on the effect of survey conditions on the reliability of coating flaw detection of buried pipes. The effects of applied voltage and anode location on the detection reliability of coating flaw of buried pipe in soil with the resistivity of ca. 25.8 kΩ·cm were discussed. Higher applied voltage increased the detection reliability, regardless of buried depth, but deeper burial depth reduced the reliability. The location of the anode has influenced on the detection reliability. This behaviour may be induced by the variation of current distribution by the applied voltage and buried depth. From the relationship between the applied voltage and reliability, the needed detection potential to get a desire detection reliability can be calculated to get 100% detection reliability using the derived equation.

Reliability-Based Topology Optimization with Uncertainties

  • Kim Chwa-Il;Wang Se-Myung;Bae Kyoung-Ryun;Moon Hee-Gon;Choi Kyung-K.
    • Journal of Mechanical Science and Technology
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    • v.20 no.4
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    • pp.494-504
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    • 2006
  • This research proposes a reliability-based topology optimization (RBTO) using the finite element method. RBTO is a topology optimization based on probabilistic (or reliability) constraints. Young's modulus, thickness, and loading are considered as the uncertain variables and RBTO is applied to static and eigenvalue problems. The RBTO problems are formulated and a sensitivity analysis is performed. In order to compute probability constraints, two methods-RIA and PMA-are used. Several examples show the effectiveness of the proposed method by comparing the classical safety factor method.

A Reliability Test for ph-free SnCu Plating Solution and It's Deposit (Sn-Cu 무연 도금용액 및 피막의 신뢰성평가)

  • Lee Hong-Kee;Hur Jin-Young
    • Journal of the Korean institute of surface engineering
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    • v.38 no.6
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    • pp.216-226
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    • 2005
  • Pb-Free Technology was born with environmental problems of electronic component, Being connected by big and small project of every country. Also, in each country environment is connected and various standards of IEC, ISO, MIL, JIS, KS, JEDEC, EIAJ etc. All products can divide at solder part and finishing part These can tested each and synthetically divide. This research is reliability evaluation for three kind of ph-free SnCu solder plating solution and it's deposit. First, executed analysis about Pure Sn, SnCu solutions and plating surface by way similar to other plating solution analysis. Next, executed reliability about test method and equipment for reliable analyzer system construction. Next, data comparison and estimation, main estimation test method and item's choice. In this paper the systematic surface analysis and reliability for plating solutions and it's deposit in metal surface finishing processes could be shown.

A Case Study of Six Sigma for Improving Non-Function Test Process in the Ammunition Stockpile Reliability Program (저장탄약신뢰성평가의 비기능시험 업무프로세스 개선을 이한 6시그마 적용 사례 연구)

  • Yoon, Keun-Sig;Kim, Yong-Hwa;Bong, Ha-Gyu;Lee, Jong-Chan
    • Journal of Korean Society for Quality Management
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    • v.34 no.4
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    • pp.13-21
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    • 2006
  • This paper includes an example of applying Six Sigma to Non-function test process to improve the efficiency and reliability of the Ammunition Stockpile Reliability Program (ASRP). By applying the DMAIC which is one of the Six sigma methods. we found out the vital few and as an improved version : effective redesign of check-sheets, pre-examination of technology, on-the-scene support system. As a result, we could enhance the reliability and reduce manpower and additional expenses.

Recent Progress in Pb-free Solders and Soldering Technology: Fundamentals, Reliability Issues and Applications

  • Kang Sung Kwon
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2004.09a
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    • pp.1-26
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    • 2004
  • The implementation of Pb-free solder technology is making good progress in electronic industry. Further understanding on fundamental issues on Pb-free solders/processes is required to reduce reliability risk factors of Pb-free solder joints. Several reliability issues including thermal fatigue, impact reliability, IMC growth, spalling, void formation are reviewed for Pb-free solder joints. Several applications of Pb-free technology are discussed, such as Pb-free, CBGA, CuCGA, flip chips, and wafer bumping by IMS.

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A Study on Method for Classifying Quality Levels of Commercial Electric & Electronic Parts (상용 전기전자 부품의 품질등급 적용 방안에 관한 연구)

  • Jeong, Da-Un;Yun, Hui-Sung;Kwak, Cho-Rong;Lee, Seung-Hun;Hur, Man-Og
    • Journal of Applied Reliability
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    • v.12 no.1
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    • pp.1-12
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    • 2012
  • The quality of a part has directly effect on part reliability. In the basis of MIL-HDBK-217F model, it is the determined rule that part's quality level should follow its nominal one written in its specification. If quality information is unknown, quality level of the part should be determined as 'Lower'. However, the prediction model is said to be short in reflecting parts applying 'state-of-the-art' technology and result in over-estimated failure rate by some reliability-related authorities or research institutes. In this study, the reliability prediction results by the model of MIL-HDBK-217F and Telcordia SR-332 are compared and analyzed to verify whether the statement is reasonable or not.

A Study on the Reliability Growth of Multiple Launch Rocket System Using Accelerated Life Testing (가속수명시험을 이용한 다련장 발사대 신뢰도 성장 연구)

  • Lee, Yongjun;Ryu, Jeongmin;Son, Kwonil;Song, Seokbong;Kim, Sangboo;Park, Woojae
    • Journal of the Korea Institute of Military Science and Technology
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    • v.22 no.2
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    • pp.241-248
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    • 2019
  • In this paper, we aim to check the reliability growth of multiple launch rocket components by the life evaluation. We apply the Crow-AMSAA model to the sets of test data obtained from the development phase. The result of the data analysis shows that the reliability of some components needs to be improved. In order to improve their reliability, we analyze the failure mechanism and change their designs. The verification of the reliability growth for those components is done by analyzing the data sets obtained by the accelerated life tests. As a result, we show that the MTBF of those components is increased and also their reliabilities improved.

Reliability analysis of piles based on proof vertical static load test

  • Dong, Xiaole;Tan, Xiaohui;Lin, Xin;Zhang, Xuejuan;Hou, Xiaoliang;Wu, Daoxiang
    • Geomechanics and Engineering
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    • v.29 no.5
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    • pp.487-496
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    • 2022
  • Most of the pile's vertical static load tests in construction sites are the proof load tests, which is difficult to accurately estimate the ultimate bearing capacity and analyze the reliability of piles. Therefore, a reliability analysis method based on the proof load-settlement (Q-s) data is proposed in this study. In this proposed method, a simple ultimate limit state function based on the hyperbolic model is established, where the random variables of reliability analysis include the model factor of the ultimate bearing capacity and the fitting parameters of the hyperbolic model. The model factor M = RuR / RuP is calculated based on the available destructive Q-s data, where the real value of the ultimate bearing capacity (RuR) is obtained by the complete destructive Q-s data; the predicted value of the ultimate bearing capacity (RuP) is obtained by the proof Q-s data, a part of the available destructive Q-s data, that before the predetermined load determined by the pile test report. The results demonstrate that the proposed method can easy and effectively perform the reliability analysis based on the proof Q-s data.

Lifetime estimation for current sensor by accelerated life test (가속수명시험을 통한 전류센서의 수명 예측)

  • Kim, Je-Min;Choi, Sung-Soon;Ma, Byung-Jin;Lee, Kwan-Hun;Song, Byeong-Suk
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.257-258
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    • 2008
  • Hall-type current sensors have been widely used in many fields such as elevator and train system. To estimate lifetime of hall-type current sensors, an accelerated life test with real-time monitoring system simultaneously was designed and performed in high temperature environment with three different temperatures. From the experimental results, activation energy was about 0.9 eV, and acceleration factor was about 450 based on Arrhenius model. As a results, $B_{10}$ lifetime of hall-type current sensor is estimated to be 65,460 hours.

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Reliability Assessment Criteria of Sensor Module for Lighting Fixtures (조명용센서모듈의 신뢰성평가기준)

  • Jeong, Hee-Suk;Park, Chang-Kyu;Jeong, Hai-Sung;Baik, Jai-Wook
    • Journal of Applied Reliability
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    • v.10 no.1
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    • pp.11-24
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    • 2010
  • Lighting industry is rapidly being developed as the ubiquitous society based on sensor network emerges. This kind of paradigm shift brings the society convergence of technologies which leads to smart lighting system as well as the integration of interior and sensibility control. However, standards for sensors have not been firmly established, and problems related to quality and malfunction have been brought up, thereby calling for careful approach to the enhancement and assessment of reliability of the item. In this article reliability assessment criteria for sensor module for lighting fixtures is established in terms of performance assessment criterion and reliability assessment criterion.