• Journal of the Semiconductor & Display Technology
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• v.20 no.4
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• pp.141-145
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• 2021

The brightness of the Organic Light Emitting Diode (OLED) display is controlled by thin-film transistors (TFTs). Regardless of the materials and the structures of TFTs, an OLED suffers from the instable threshold voltage (V_th) of a TFT during operation. When designing an OLED pixel with circuit simulation tool such as SPICE, a designer needs to take V_th shift into account to improve the reliability of the circuit and various compensation methods have been proposed. In this paper, the effect of the compensation circuits from two typical OLED pixel circuits proposed in the literature are studied by the transient simulation with a SPICE tool in which the stretched-exponential time dependent V_th shift function is implemented. The simulation results show that the compensation circuits improve the reliability at the beginning of each frame, but V_th shifts from all TFTs in a pixel need to be considered to improve long-time reliability.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2010.06a
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• pp.159-159
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• 2010

We conducted bum-in test by current stress to evaluate acceleration reliability characteristics about p-resistivity influence of GaN-based light-emitting diodes. The LEDs used in this study are the polarization field-induced LED(PF-LED) having low p-resistivity and the highly resistive LED(HR-LED) having high p-resistivity. The result of high stress experiment shows that current crowding phenomenon is occurred from the center of between p-bonding pad and n-bonding pad to either electrodes. In addition, series resistance and optical power decrease dramatically. These results means that the resistance of between p-bonding pad and p-GaN affect reliability. That's why we need to consider the ohmic contact of p-bonding pad when design the high efficiency and high reliability LEDs.

• Proceedings of the Korean Society for Quality Management Conference
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• 2006.04a
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• pp.69-75
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• 2006

As the level of technology and the standard of living improve, product reliability plays an Increasingly significant role. This study has been performed to build a reliability model of electronic ballasts for the low wattage fluorescent lamp. Telcordia SR-332, one of the most widely used reliability specifications, was selected for the model development. We briefly reviewed the basic concepts of the electronic ballast. We then developed a reliability model for the ballast using SR-332 concepts and the reliability has been examined.

• Nuclear Engineering and Technology
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• v.31 no.1
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• pp.49-57
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• 1999

It has been a critical issue to predict the safety critical software reliability in nuclear engineering area. For many years, many researches have focused on the quantification of software reliability and there have been many models developed to quantify software reliability. Most software reliability models estimate the reliability with the failure data collected during the test assuming that the test environments well represent the operation profile. User's interest is however on the operational reliability rather than on the test reliability. The experiences show that the operational reliability is higher than the test reliability. With the assumption that the difference in reliability results from the change of environment, from testing to operation, testing environment factors comprising the aging factor and the coverage factor are developed in this paper and used to predict the ultimate operational reliability with the failure data in testing phase. It is by incorporating test environments applied beyond the operational profile into testing environment factors. The application results show that the proposed method can estimate the operational reliability accurately.

• Proceedings of the Korean Society for Quality Management Conference
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• 2010.04a
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• pp.274-280
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• 2010

Through the process of HALT (Highly Accelerated Life Test) between 2003 to 2008, we are about to research on the design method for minimum test for all error modes that are classified and analyzed to obtain more margin able product.

• Wind and Structures
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• v.27 no.3
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• pp.175-186
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• 2018

With the continuous increase of span lengths, modern bridges are becoming much more flexible and more prone to flutter under wind excitations. A reasonable probabilistic flutter analysis of long-span bridges involving random and uncertain variables may have to be taken into consideration. This paper presents a method for estimating the reliability index and failure probability due to flutter, which considers the very important variables including the extreme wind velocity at bridge site, damping ratio, mathematical modeling, and flutter derivatives. The Aizhai Bridge in China is selected as an example to demonstrate the numerical procedure for the flutter reliability analysis. In the presented method, the joint probability density function of wind speed and wind direction at the deck level of the bridge is first established. Then, based on the fundamental theories of structural reliability, the reliability index and failure probability due to flutter of the Aizhai Bridge is investigated by applying the Monte Carlo method and the first order reliability method (FORM). The probabilistic flutter analysis can provide a guideline in the design of long-span bridges and the results show that the structural damping and flutter derivatives have significant effects on the flutter reliability, more accurate and reliable data of which is needed.

• Journal of Korean Institute of Industrial Engineers
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• v.28 no.4
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• pp.407-414
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• 2002

The inherent reliability of a product is primarily determined in the design stage, and therefore, design engineers should be able to design reliability into the product in an efficient manner. Especially, the product should be designed such that its reliability is robust to various noise factors encountered in production and field environments. The Taguchi method can be effectively used for this purpose. However, there exist only a few attempts to integrate the Taguchi method with reliability design, and in addition, the existing works do not sufficiently consider the robustness and/or the distinction between noise and acceleration factors. This paper develops a unified approach to robust reliability design assuming that accelerated life tests are conducted at each combination of design and noise conditions. First, an experimental structure for assigning not only acceleration but also noise factors is presented. Second, the reliability at the use condition is estimated using the assumed accelerated life test model. Third, reliabilities are transformed into 'efforts' using an effort function which reflects the degree of difficulty involved in improving the reliability. Finally, an optimal setting of design parameters is determined based on the mean and standard deviation of the effort values. The above approach is illustrated with an example of a paper feeder design.

• Nuclear Engineering and Technology
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• v.54 no.3
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• pp.926-939
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• 2022

The area of this study will cover the location-wise seismic response variation of an electrical cabinet in nuclear power point (NPP) based on classical reliability analysis. The location-based seismic ground motion (GM) selection is carried out with the help of probabilistic seismic hazard analysis using PSHRisktool, where the variation of reliability analysis can be understood from the relation between the reliability index and intensity measure. Two different approaches such as the first-order second moment method (FOSM) and Monte Carlo Simulation (MCS) are helped to evaluate and compare the reliability assessment of the cabinet. The cabinet is modeled with material uncertainty utilizing Steel01 as the material model and the fiber section modeling approach is considered to characterize the section's nonlinear reaction behavior. To verify the modal frequency, this study compares the FEM result with recorded data using Least-Squares Complex Exponential (LSCE) method from the impact hammer test. In spite of a few investigations, the main novelty of this study is to introduce the reader to check and compare the seismic reliability assessment variation in different seismic locations and for different earthquake levels. Alongside, the betterment can be found by comparing the result between two considered reliability estimation methods.

• The Transactions of the Korean Institute of Power Electronics
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• v.27 no.6
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• pp.535-540
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• 2022

DC-link capacitors are reliability-critical components in a photovoltaic (PV) inverter. Typically, the lifetime of a DC-link capacitor is evaluated by considering the voltage and hot-spot temperature of the capacitor under the specific operating condition of the PV inverter. However, the output of the PV inverter is determined by solar irradiation and ambient temperature, which vary with the seasons; accordingly, the hot-spot temperature of the capacitor also changes. Therefore, the mission profile of the PV system should be considered to effectively evaluate the reliability of the DC-link capacitor. In this study, the reliability of the DC-link capacitor of a three-level NPC inverter is comparatively analyzed with and without considering the mission profiles of the PV system, where two mission profiles recorded in Arizona and Iza are considered. The accumulated damage of the DC-link capacitor is calculated based on the lifetime model by analyzing its thermal loading. Afterward, a reliability evaluation of the DC-link capacitor is performed at the component level and then at the system level by considering all capacitors by means of Monte Carlo analysis. Results reveal the importance of performing a mission-profile-based reliability evaluation during the design of high-reliability PV inverters to achieve the target reliability performance.

• Journal of Electrical Engineering and Technology
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• v.11 no.3
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• pp.575-584
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• 2016

Considering the randomness and uncertainty of wind power, a reliability model of WTGs is established based on the combination of the Weibull distribution and the Markov chain. To analyze the failure mode quickly, we use the switch-section partitioning method. After defining the first-level load zone node, we can obtain the supply power sets of the first-level load zone nodes with each WTG. Based on the supply sets, we propose the dynamic division strategy of island operation. By adopting the fault analysis method with the attributes defined in the switch-section, we evaluate the reliability of the distribution network with WTGs using a sequential Monte Carlo simulation method. Finally, using the IEEE RBTS Bus6 test system, we demonstrate the efficacy of the proposed model and method by comparing different schemes to access the WTGs.