• Communications for Statistical Applications and Methods
• /
• v.11 no.1
• /
• pp.197-211
• /
• 2004

According to the increase of internet application, the marketing process as well as the research and survey, the education process, and administration of government are very depended on web bases. All kinds of goods and sales which are traded on the internet shopping malls are extremely increased. So, the necessity of automatically intelligent information system is shown, this system manages web site connected users for effective marketing. For the recommendation system which can offer a fit information from numerous web contents to user, we propose an automatic recommendation system which furnish necessary information to connected web user using statistical learning theory and bayesian fuzzy clustering. This system is called collaborative CRM in this paper. The performance of proposed system is compared with the other methods using real data of the existent shopping mall site. This paper shows that the predictive accuracy of the proposed system is improved by comparison with others.

• Journal of the Korea Academia-Industrial cooperation Society
• /
• v.13 no.8
• /
• pp.3779-3784
• /
• 2012

Real-time process monitoring and diagnosis of industrial processes is one of important operational tasks for quality and safety reasons. The objective of fault diagnosis or identification is to find process variables responsible for causing a specific fault in the process. This helps process operators to investigate root causes more effectively. This work assesses the applicability of combining a nonlinear statistical technique of kernel Fisher discriminant analysis with a preprocessing method as a tool of on-line fault identification. To compare its performance to existing linear principal component analysis (PCA) identification scheme, a case study on a benchmark process was performed to show that the fault identification scheme produced more reliable diagnosis results than linear method.

• Communications for Statistical Applications and Methods
• /
• v.15 no.3
• /
• pp.451-464
• /
• 2008

Six sigma is the rating that signifies "best in clas", with only 3.4 defects per million units or operations. Higher sigma quality level is generally perceived by customers as improved performance by assigning a correspondingly higher satisfaction score. The process capability indices and the sigma level $Z_{st}$ have been widely used in six sigma industries to assess process performance. Most evaluations on process capability indices focus on point estimates, which may result in unreliable assessments of process performance. In this paper, we consider statistical inference for process capability indices $C_p$, $C_{pk}$ and $C_{pm}$. Also, we study better testing procedure on assessing sigma level $Z_{st}$ and capability index $C_{pm}$, for practitioners to use in determining whether a given process is capable. The proposed method is easy to use and the decision making is more reliable. Whether a process is clearly normal or nonnormal, our bootstrap testing procedure could be applied effectively without the complexity of calculation. A numerical result based on our proposed method is illustrated.

• Communications for Statistical Applications and Methods
• /
• v.8 no.3
• /
• pp.697-709
• /
• 2001

In this paper we study two vector-valued process capability indices $C_{p}$=($C_{px}$, $C_{py}$ ) and C/aub pm/=( $C_{pmx}$, $C_{pmy}$) considering process capability indices $C_{p}$ and $C_{pm}$ . First, two asymptotic distributions of plug-in estimators $C_{p}$=($C_{px}$, $C_{py}$ ) and $C_{pm}$ =) $C_{pmx}$, $C_{pmy}$) are derived.. With the asymptotic distributions, we propose asymptotic confidence regions for our indices. Next, obtaining the asymptotic distributions of two bootstrap estimators $C_{p}$=($C_{px}$, $C_{py}$ )and $C_{pm}$ =( $C_{pmx}$, $C_{pmy}$) with our bootstrap algorithm, we will provide the consistency of our bootstrap for statistical inference. Also, with the consistency of our bootstrap, we propose bootstrap asymptotic confidence regions for our indices. (no abstract, see full-text)see full-text)e full-text)

• Journal of Ocean Engineering and Technology
• /
• v.7 no.2
• /
• pp.114-120
• /
• 1993

Responses of marine vehicles and ocean structures in a seaway can be predicted by applying the probabilistic approach. When we consider a linear system, the responses in a random seaway can be evaluated through spectral analysis in the frequency domain. But when we treat nonlinear system in irregular waves, it is necessary to get time history of waves. In the previous study we introduced one-directional waves (long crested waves)as wave environment and carried out calculations and experiments in the waves. But the real sea in which marine vehicles and structures are operated has multi-directional waves (short crested waves). It is important to get a simulated random sea and analyse dynamic problems in the sea. We need entire sample function or probabillty density function to infer statistical value of random process. However if the process are ergodic process, we can get statistical values by analysis of one sample function. In this paper, we developed the simulation technique of multi-directional waves and proved that the time history given by this method keep ergodic characteristics by the statistical analysis.

• Education of Primary School Mathematics
• /
• v.21 no.4
• /
• pp.397-413
• /
• 2018

The purpose of this study is to analyze the level of statistical literacy among fifth and sixth graders in the data presentation task based on the speculative data generation process. For the research, the data presentation tasks based on the speculative data generation process was designed and statistical literacy standards for evaluating the student's level was presented based on prior studies. It is meaningful that the stepwise presentation of the students' statistical literacy and analysis of their developmental patterns can help them to find their current position and reach a higher level of performance. In this study, the standard of statistical literacy level was clarified based on the previous research, and a new perspective was presented about the data presentation instruction in the statistical education by analyzing the students' responses by each level.

• Journal of the Korean Statistical Society
• /
• v.33 no.2
• /
• pp.219-231
• /
• 2004

Process adjustment is a complimentary tool to process monitoring in process control. Although original intention of process adjustment is not identifying a special cause, detection and elimination of special causes may lead to significant process improvement. In this paper, we examine the impact of special causes on process adjustment. The bias in the adjusted output process is derived for each type of special causes, and average run length (ARL) of the Shewhart chart applied to the adjusted output is computed for each special cause types. Numerical results are illustrated for the ARL of the Shewhart chart, thereupon seriousness of special causes on process adjustment is evaluated for each type of special causes.

• Korean Management Science Review
• /
• v.31 no.3
• /
• pp.27-39
• /
• 2014

We derive a generalized statistic form of Q control chart, which is especially suitable for short run productions and start-up processes, for the detection of process mean shifts. The generalization means that the derived control chart statistic concurrently uses within lot variability and between lot variability to explain the process variability. The latter variability source is noticeably prevalent in lot type production processes including semiconductor wafer fabrications. We first obtain the generalized Q control chart statistic when both the process mean and process variance are unknown, which represents the case of implementing statistical process control charting for short run productions and start-up processes. Also, we provide the corresponding generalized Q control chart statistics for the rest of three cases of previous Q control chart statistics : (1) both the process mean and process variance are known (2) only the process mean is unknown and (3) only the process variance is unknown.

• Journal of Korean Society of Industrial and Systems Engineering
• /
• v.25 no.2
• /
• pp.1-10
• /
• 2002

Process capability indices are widely used in industries and quality assurance system. In past years, process capability analysis have been used to characterize process performance on the basis of univariate quality characteristics. However, in actual manufacturing industrial, statistical process control (SPC) often entails characterizing or assessing processes or products based on more than one engineering specification or quality characteristic. Therefore, the analysis have to be required a multivariate statistical technique. This paper introduces to multivariate capability indices and then selects a multivariate process capability index incorporated both the process variation and the process deviation from target among these indices under the multivariate normal distribution. We propose a new multivariate capability index $MC_{pm}^+$ using quality loss function instead of the process variation and this index is compared with the proposed indices when quality characteristics are independent and dependent of each other.

• Transactions on Electrical and Electronic Materials
• /
• v.13 no.3
• /
• pp.129-135
• /
• 2012

A number of surface mount technology (SMT) process variables including land design are considered for minimizing tombstone defect in flexible printed circuit assembly in high volume manufacturing. As SMT chip components have been reduced over the past years with their weights in milligrams, the torque that once helped self-centering of chips, gears to tombstone defects. In this paper, we have investigated the correlation of the assembly process variables with respect to the tombstone defect by employing statistically designed experiment. After the statistical analysis is performed, we have setup hypotheses for the root causes of tombstone defect and derived main effects and interactions of the process parameters affecting the hypothesis. Based on the designed experiments, statistical analysis was performed to investigate significant process variable for the purpose of process control in flexible printed circuit manufacturing area. Finally, we provide beneficial suggestions for find-pitch PCB design, screen printing process, chip-mounting process, and reflow process to minimize the tombstone defects.