• Title/Summary/Keyword: scan pattern

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Modeling of Received Radar Signals for Scan Pattern Analysis (스캔패턴 분석을 위한 레이더 수신신호 모델링)

  • Kim, Yong-Hee;Kim, Wan-Jin;Song, Kyu-Ha;Lee, Dong-Won;Kim, Hyoung-Nam
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.47 no.4
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    • pp.73-85
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    • 2010
  • In dense electronic warfare signal environments, the conventional radar identification methods based on the basic parameters such as frequency, pulse width, and pulse repetition interval are confronted by the problem of identification ambiguity. To overcome this critical problem, a new approach introducing scan pattern of radars has been presented. Researches on new identification methods, however, suffer from a practical problem that it is not easy to secure the many radar signals including various scan pattern information and operation parameters. This paper presents a modeling method of radar signals with which we can generate radar signals including various scan pattern types according to the parameters determining the variation pattern of received signal strength. In addition, with the radar signals generated by the proposed model we analyze their characteristics according to the location of an electronic warfare support (ES) system.

Development of 2D Tight-fitting Collar Pattern from 3D Scan Data of Various Types of Men's Dressform (남성 체형별 인대의 3차원 형상 데이터와 칼라 패턴 개발)

  • Jeong Yeon-Hee;Kim So-Young;Hong Kyung-Hi
    • Journal of the Korean Society of Clothing and Textiles
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    • v.30 no.5 s.153
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    • pp.722-732
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    • 2006
  • The pattern making of the tight-fitting collars which often used in diving suits, dance wear, or cycle wear has not been fully established. To develop tight-fitting collar pattern directly from 3D images from the representative somatotypes, dressforms developed by Jaeun Jung were used. The 3D scan data of the four male dressforms were obtained using Exyma-1200. Triangle Simplification and the Runge-Kutta method were applied to reduce the 3D scan data points and to make the segmented triangular patches in a plane from 3D data. As results, apparent differences between the tight-fitting collar patterns obtained from the 3D scan data and the ordinary 2D collar patterns were found around the center back line. The curvatures of the center back line were higher in all types of the tight-fitting collar than in the ordinary collar pattern. Relative differences in the shape of collar lines among four representative Korean men were reported. To fit the curved shape of the back neckline, 1.8 cm should be reduced from the upper neckline in average. We suggested the direct pattern making method for the 2D tight-fitting collar patterns considering the 3D shape of various types of men's dressform.

An Internal Pattern Run-Length Methodology for Slice Encoding

  • Lee, Lung-Jen;Tseng, Wang-Dauh;Lin, Rung-Bin
    • ETRI Journal
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    • v.33 no.3
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    • pp.374-381
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    • 2011
  • A simple and effective compression method is proposed for multiple-scan testing. For a given test set, each test pattern is compressed from the view of slices. An encoding table exploiting seven types of frequently-occurring pattern is used. Compression is then achieved by mapping slice data into codewords. The decompression logic is small and easy to implement. It is also applicable to schemes adopting a single-scan chain. Experimental results show this method can achieve good compression effect.

Scan Element Characteristics of Open-Ended Waveguide Array Antenna (개방형 도파관 배열안테나의 조향소자 특성)

  • Kim, Dong-Seok;Kim, Tae-Hyun;Park, Dong-Chul;Kim, Chan-Hong
    • Proceedings of the Korea Electromagnetic Engineering Society Conference
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    • 2005.11a
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    • pp.347-352
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    • 2005
  • Scan Element Pattern(SEP) and Scan Impedance(SI) concepts are used to analyze the characteristics of open-ended waveguide array, which is the representative phased array antenna element in C-band and X-band. Transmit SEP's are calculated for 15$\sim$15 subarray and SI's are obtained by applying periodic boundary conditions for a unit cell of the given array condition. CST's MWS and Ansoft's HFSS are utilized for each analysis. Some relations are reviewed between the two results, which are based on mutual coupling effects. For validation purpose, an 8$\sim$8 subarray is constructed and tested. Transmit SEP measured in MTG's far-field range shows good agreement with the calculated transmit SEP.

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Pattern Analysis of Occlusal Contacts During Lateral Excursion Using T-scan III System (T-scan III 시스템을 이용한 하악 측방운동 시 교합접촉 양상의 분석)

  • Lee, Sang-Min
    • Journal of Dental Rehabilitation and Applied Science
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    • v.29 no.1
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    • pp.59-68
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    • 2013
  • The objective of this study was to analyze occlusal contact pattern of 33 young adult males with normal occlusion during lateral excursion using T-scan III system which can measure the dynamic occlusion. Occlusal contact patterns were examined and categorized in non-working side disclusion point(more functionally acceptable position) not canine-to-canine position. Disclusion time, occlusal force, and occlusal force distribution ratio of upper canine at disclusion point during lateral excursion movement was also measured and compared among the groups divided according to contact patterns. The results showed that group function was clearly more dominant than canine guidance and other occlusal contact patterns different with existing patterns were found. There were significantly difference between groups in variables of T-scan measurement. T-scan III system is effective tools to analyze and evaluate occlusal contact patterns, disclusion time, occlusal force, and occlusal force distribution ratio of upper canine at disclusion point.

Scan Element Pattern and Scan Impedance of Open-Ended Waveguide Away Antenna (개방형 도파관 배열 안테나의 조향 소자 패턴 및 조향 임피던스에 관한 연구)

  • Yu, Je-Woo;Rah, Dong-Kyoon;Kim, Dong-Seok;Kim, Chan-Hong;Park, Dong-Chul
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.18 no.1 s.116
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    • pp.7-14
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    • 2007
  • In this paper, the scan characteristics of phased array antenna consisted of rectangular open-ended waveguide with a triangular grid are investigated. An infinite array structure is analyzed by numerically solving the integral equation for the electric field over the waveguide aperture using waveguide mode function and Floquet mode function. Next, SEP(Scan Element Pattern) and SI(Scan Impedance) characteristics are simulated by CST's MWS(Microwave Studio) and Ansoft's HFSS(High Frequency Structure Simulator) for the finite and infinite array structures. Also, validity of these approaches is verified by comparing the calculated and simulated results with the measured ones for an $8{\times}8$ subarray. Within 10.5 % fractional bandwidth in the X-band, the fabricated subarray showed the flat gain characteristic in the scan range of ${\pm}45^{\circ}C$ in the E-plane(azimuth) and ${\pm}20^{\circ}C$ in the H-plane(elevation), and also showed the return loss characteristic of less than -10 dB.

A Study on Development of the Basic Hat Pattern using 3D Scan Data for Korean Women - Focusing on the 6 pieces Crown - (3D 측정치를 이용한 여성용 모자 패턴 개발 - 6면 크라운 중심으로 -)

  • Kim, Cha-Hyun;Kim, Gum-Hwa
    • Fashion & Textile Research Journal
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    • v.12 no.3
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    • pp.354-363
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    • 2010
  • The purpose of this study was to provide some preliminary results on application of 3D scan data of head shapes to the hat design and pattern-making. This paper defined necessary measurement items and concepts in 3-dimensional images of head shapes. And also it presented the methodology to pattern-making of 6-piece crown hat based on 3D data. It used the data of Size Korea to pick up and choose a head shape model with the average head size of Korean women in their twenties. Main results were: 1. The 3D scan data of head shape was better than the 1 dimensional measurement data. Because I could establish a hat pattern-making theory by the 3D scan data of head. 2. The 3D scan data provided the basis for conceptualization of basic measurement points and items for a better fit of hats as well as the definition of the basic hat circumference. 3. This presented a methodology for analyzing out head shape by 3D scan data, and allowed the derivation of the basic hat circumference from the maximum head circumference. 4. As the 6-piece Crown cloche hat made by this method fitted the head shape model perfectly, this methodology could suggest potential applicability to various hat design.

Block Label-based Binary Connected-component Labeling using an efficient pixel-based scan mask (효율적인 화소기반 스캔마스크를 이용한 블록라벨기반 이진연결요소 라벨링)

  • Kim, Kyoil
    • Journal of Digital Convergence
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    • v.11 no.4
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    • pp.259-266
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    • 2013
  • Binary connected-components labeling, which is widely used in the field of the pattern recognition, has been researched for a long time as one of the basic image processing techniques. Two-scan algorithm has been mainly used in the researches of the connected-components labeling. Recently, for the first scan in the two-scan algorithm, block-based labeling approaches have been used and reported as the fastest methods. In this paper, a new efficient scan mask for connected-components labeling with a block-based labeling approach is proposed. Labeling with the new pixel-based scan mask is more efficient than any other existing method. The results of the experiments show that the proposed method is faster than the existing fastest method.

Method of 3D Body Surface Segmentation and 2D Pattern Development Using Triangle Simplification and Triangle Patch Arrangement (Triangle Simplification에 의한 3D 인체형상분할과 삼각조합방법에 의한 2D 패턴구성)

  • Jeong, Yeon-Hee;Hong, Kyung-Hi;Kim, See-Jo
    • Journal of the Korean Society of Clothing and Textiles
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    • v.29 no.9_10 s.146
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    • pp.1359-1368
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    • 2005
  • When we develop the tight-fit 2D pattern from the 3D scan data, segmentation of the 3D scan data into several parts is necessary to make a curved surface into a flat plane. In this study, Garland's method of triangle simplification was adopted to reduce the number of data point without distorting the original shape. The Runge-Kutta method was applied to make triangular patch from the 3D surface in a 2D plane. We also explored the detailed arrangement method of small 2D patches to make a tight-fit pattern for a male body. As results, minimum triangle numbers in the simplification process and efficient arrangement methods of many pieces were suggested for the optimal 2D pattern development. Among four arrangement methods, a block method is faster and easier when dealing with the triangle patches of male's upper body. Anchoring neighboring vertices of blocks to make 2D pattern was observed to be a reasonable arrangement method to get even distribution of stress in a 2D plane.

Partial Enhanced Scan Method for Path Delay Fault Testing (경로 지연 고장 테스팅을 위한 부분 확장 주사방법)

  • Kim, Won-Gi;Kim, Myung-Gyun;Kang, Sung-Ho;Han, Gun-Hee
    • The Transactions of the Korea Information Processing Society
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    • v.7 no.10
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    • pp.3226-3235
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    • 2000
  • The more complex and larger semiconductor integraed circuits become, the core important delay test becomes which guarantees that semiconductor integrated circuits operate in time. In this paper, we propose a new partial enhanced scan method that can generate test patterns for path delay faults offectively. We implemented a new partial enhanced scan method based on an automatic test pattern generator(ATPG) which uses implication and justification . First. we generate test patterns in the standard scan environment. And if test patterns are not generated regularly in the scan chain, we determine flip-flops which applied enhanced scan flip-flops using the information derived for running an automatic test pattern generator inthe circuti. Determming enhanced scan flip-flops are based on a fault coverage or a hardware overhead. through the expenment for JSCAS 89 benchmark sequential circuits, we compared the fault coverage in the standard scan enviroment and enhance scan environment, partial enhanced scan environment. And we proved the effectiveness of the new partial enhanced scan method by identifying a high fault coverage.

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