• Title/Summary/Keyword: scan pattern

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악성뇌종양 주변부위의 역동자기공명영상의 시간신호강도곡선 양상과 예후와의 관계

  • 최순섭;김기욱;허기영;이영일
    • Proceedings of the KSMRM Conference
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    • 2003.10a
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    • pp.21-21
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    • 2003
  • 목적: 악성뇌종양 주변부위의 역동자기공명영상에서의 시간신호강도곡선 양상으로 종양의 성장 양상이나 예후를 판단할 수 있는지를 알고자 한다. 대상 및 방법: Anaplastic oligodendroglioma 3예, Anaplastic astrocytoma 1예, Glioblastoma multiforme 1예, Malignant ependymoma 2예, Medulloblastorna 1예로서, 총 8예의 종양절제전, 혹은 후의 잔류 종양을 대상으로 하였다. Routine MRI에 추가하여 종양부위에서 Turbo spin echo T1 강조 역동자기공명영상을 하였으며, Gd-DTPA 0.1 mmol/kg를 급속 주사 한 후, TR/TE, 350/15, slice thickness 6 mm, slice number 3, NEX 2회, scan time은 15 초로 하여 5 분 동안 20회 영상을 얻었다. 가시적으로 조영증강이 없는 종양의 주변부위나 수술경계부위에 관심영역을 그려서 시간신호강도곡선을 얻었으며, 첫 회 조영제 통과시의 peak 이후에 신호가 감소하는 경우를 Normal pattern으로, peak 이후에 신호가 계속 유지되거나 증가하는 경우를 Tumor pattern으로 하였으며, Normal pattern과 Tumor pattern을 보인 예들을 구분하여 종양의 재성장 상태와 환자의 생존 기간을 비교 관찰하였다.

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Development of the Sorting Inspection System for Screw/Bolt Using a Slant Method (슬랜트방식을 이용한 스크류/볼트 선별검사시스템 개발)

  • Kim, Yong-Seok;Yang, Soon-Yong
    • Journal of the Korean Society of Manufacturing Technology Engineers
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    • v.19 no.5
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    • pp.698-704
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    • 2010
  • The machine vision system has been widely applied at automatic inspection field of the industries. Especially, the machine vision system shows good performance at difficult inspection field by contact method. In this paper, the automatic system of a slant method to inspect screw/bolt shape using machine vision is developed. The inspection system uses pattern matching method that search similar degree of the lucidity, the average lucidity, length and angle of inspection set up area using a circular scan and a line scan method. Also the feeding method for inspection product is the slant method, and feed rate is controlled by the ramp angle adjustment. This inspection system is composed of a feeding device, a transfer device, vision systems, a lighting device and computer, and is composed the sorting discharge system of the inferior product. The performance test carried out the feeding speed, the shape correct degree and the sorting discharge speed according to the type of screw/bolt. This sorting inspection system showed a satisfied test results in whole inspection items. Presently, this sorting inspection system is being used in the manufacturing process of screw/bolt usefully.

Internal Pattern Matching Algorithm of Logic Built In Self Test Structure (Logic Built In Self Test 구조의 내부 특성 패턴 매칭 알고리즘)

  • Jeon, Yu-Sung;Kim, In-Soo;Min, Hyoung-Bok
    • Proceedings of the KIEE Conference
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    • 2008.07a
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    • pp.1959-1960
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    • 2008
  • The Logic Built In Self Test (LBIST) technique is substantially applied in chip design in most many semiconductor company in despite of unavoidable overhead like an increase in dimension and time delay occurred as it used. Currently common LBIST software uses the MISR (Multiple Input Shift Register) However, it has many considerations like defining the X-value (Unknown Value), length and number of Scan Chain, Scan Chain and so on for analysis of result occurred in the process. So, to solve these problems, common LBIST software provides the solution method automated. Nevertheless, these problems haven't been solved automatically by Tri-state Bus in logic circuit yet. This paper studies the algorithm that it also suggest algorithm that reduce additional circuits and time delay as matching of pattern about 2-type circuits which are CUT(circuit Under Test) and additional circuits so that the designer can detect the wrong location in CUT: Circuit Under Test.

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A study on design of instantaneous field of view of rosette scanning infrared seeker (로젯 주사 적외선 탐색기의 순시 시계 설계에 관한 연구)

  • 장성갑;홍현기;한성현;최종수
    • Journal of the Korean Institute of Telematics and Electronics S
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    • v.35S no.7
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    • pp.86-94
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    • 1998
  • The rosette-scan seeker is a device mounted on the infrared guided missile. It offers the positions and iamges of target to missiles servo system by scanning a space about target in rosette pattern with a single detector. An instantaneous field of view (IFOV), which is a diameter of a detector moving along the path of the rosette pattern, has the property that its smaller size provide the less interference of background signals and detector noise. If its size is too small to voer the total field of view (TFOV), however, it produces the invisible regions in the TFOV. In this case, the invisible regions cause the performance of the seeker to deteriorate. For full scan-coverage, it is necessary to design the small IFOV without the invisible regions in the TFOV, as possible. In this paper, we propose the new method of designing the smaller IFOV than the conventional method and verify full coverage of the scanned region. By comparing the nose equivalent flux density (NEFD) of the proposed method with the that of the conventional one, we confirm that the former is better than the latter in terms of performance.

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Effect of Growth Conditions on Crystal Quality of InGaN Epitaxial Layers Grown by RF-MBE (RF-MBE 성장조건에 따른 InGaN 단결정 박막의 결정성 관찰)

  • Na, Hyunseok
    • Journal of the Korean Society for Heat Treatment
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    • v.31 no.5
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    • pp.237-243
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    • 2018
  • In-rich InGaN epilayers were grown on (0001) sapphire substrates by radio-frequency plasma-assisted molecular beam epitaxy (RF-MBE). InGaN epilayers grown at various growth condition were observed by SEM, XRD, and RHEED. When plasma power of nitrogen increased from 290 to 350 W, surface morphology and crystal quality became worse according to more active nitrogen on the surface of InGaN at N-rich growth condition. As In composition was reduced from 89 to 71% by changing the incoming flux of In and Ga, surface morphology and crystal quality became worse. In addition, weak peaks of cubic InGaN phase was observed from InGaN layer with 71% In composition by XRD ${\Phi}$ scan measurement. When growth temperature decreased from 500 to $400^{\circ}C$, RHEED diffraction pattern was changed to be from streaky to spotty which means atomically rough surface, and spotty pattern showed cubic symmetry of InGaN clearly. XRD ${\Phi}$ scan measurement gave clear evidence that more cubic InGaN phase was formed at low growth temperature. All these results indicates that extremely low surface mobility of Ga adatom caused inferior crystal quality and cubic InGaN phase.

Real-Time Image Processing System for PDP Pattern Inspection with Line Scan Camera (PDP 패턴검사를 위한 실시간 영상처리시스템 개발)

  • Cho Seog-Bin;Baek Gyeoung-Hun;Yi Un-Kun;Nam Ki-Gon;Baek Kwang-Ryul
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.42 no.3 s.303
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    • pp.17-24
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    • 2005
  • Various defects are found in PDP manufacturing process. Detecting these defects early and reprocessing them is an important factor that reduces the cost of production. In this paper, the image processing system for the PDP pattern inspection is designed and implemented using the high performance and accuracy CCD line scan camera. For the preprocessing of the high speed line image data, the Image Processing Part (IPP) is designed and implemented using high performance DSP, FIFO and FPGA. Also, the Data Management and System Control Part (DMSCP) are implemented using ARM processor to control many IPP and cameras and to provide remote users with processed data. For evaluating implemented system, experiment environment which has an area camera for reviewing and moving shelf is made. Experimental results showed that proposed system was quite successful.

An X-masking Scheme for Logic Built-In Self-Test Using a Phase-Shifting Network (위상천이 네트워크를 사용한 X-마스크 기법)

  • Song, Dong-Sup;Kang, Sung-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.44 no.2
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    • pp.127-138
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    • 2007
  • In this paper, we propose a new X-masking scheme for utilizing logic built-in self-test The new scheme exploits the phase-shifting network which is based on the shift-and-add property of maximum length pseudorandom binary sequences(m-sequences). The phase-shifting network generates mask-patterns to multiple scan chains by appropriately shifting the m-sequence of an LFSR. The number of shifts required to generate each scan chain mask pattern can be dynamically reconfigured during a test session. An iterative simulation procedure to synthesize the phase-shifting network is proposed. Because the number of candidates for phase-shifting that can generate a scan chain mask pattern are very large, the proposed X-masking scheme reduce the hardware overhead efficiently. Experimental results demonstrate that the proposed X-masking technique requires less storage and hardware overhead with the conventional methods.

Design of a Rectangular Loop Array Antenna for Beam Scanning (빔 조향이 가능한 직사각형 루프 배열 안테나의 설계)

  • Koo, Han-Ni;Han, In-Hee;Kim, Dong-Seok;Kim, Chan-Hong;Park, Dong-Chul
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.18 no.8
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    • pp.922-929
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    • 2007
  • In this paper, a rectangular loop array antenna for beam scanning is designed. A program using RWG MoM(Rao Wilton Glisson Method of Moment) is developed for SEP(Scan Element Pattern) theoretically. Simulation results obtained by using a commercial software tool, MWS are compared with the MoM results to confirm the validity of the program. Also these results are compared with the measured ones for the case of an $8{\times}5$ subarray. The fabricated $8{\times}5$ subarray showed a flat gain characteristic in the elevation scan range of ${\pm}45^{\circ}$ in the E-plane.

Interactive 3D Pattern Design Using Real-time Pattern Deformation and Relative Human Body Coordinate System (실시간 패턴 변형과 인체 상대좌표계를 이용한 대화형 3D 패턴 디자인)

  • Sul, In-Hwan;Han, Hyun-Sook;Nam, Yun-Ja;Park, Chang-Kyu
    • Fashion & Textile Research Journal
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    • v.12 no.5
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    • pp.582-590
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    • 2010
  • Garment design needs an iterative manipulation of 2D patterns to generate a final sloper. Traditionally there have been two kinds of design methodologies such as the flat pattern method and the pattern draping method. But today, it is possible to combine the advantages from the two methods due to the realistic cloth simulation techniques. We devised a new garment design system which starts from 3D initial drape simulation result and then modifies the garment by editing the 2D flat patterns synchronously. With this interactive methodology using real-time pattern deformation technique, the designer can freely change a pattern shape by watching its 3D outlook in real-time. Also the final garment data were given relative coordinates with respect to the human anthropometric feature points detected by an automatic body feature detection algorithm. Using the relative human body coordinate system, the final garments can be re-used to an arbitrary body data without repositioning in the drape simulation. A female shirt was used for an example and a 3D body scan data was used for an illustration of the feature point detection algorithm.

Comparative Analysis of Body Measurement and Fit Evaluation between 2D Direct Body Measuring and 3D Body Scan Measuring (직접측정과 3차원 측정에 따른 인체치수 및 의복 착장 비교분석)

  • Istook, Cynthia L.;Lim, Ho-Sun;Chun, Jong-Suk
    • The Research Journal of the Costume Culture
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    • v.19 no.6
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    • pp.1347-1358
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    • 2011
  • This study purposed to analyze differences in body measurement between the 2D direct body measuring method and the 3D body scan measuring method and to perform the appearance evaluation and cross-sectional evaluation of the fit of pants to which body measurements obtained by each measuring method were applied. Body measuring was conducted in 10 women in their 20s-30s using 2D direct body measuring and 3D automatic measuring with Hamamatsu body scanner. Among the 10 women, 3 participated in experimental garment wearing. Experimental pants were made using their 2D direct body measurements and 3D automatic measurements, and wearing tests were performed through expert evaluation and cross-sectional evaluation. The results of the experiment were as follows. According to the results of comparative analysis on differences between 2D direct body measurements and 3D scan measurements, 3D automatic measurements were significantly larger in bust circumference, ankle circumference, armscye circumference, shoulder length, scye depth, and arm length. As circumferences measured with the 3D body scanner were somewhat larger than directly measured ones, it is suggested to adjust ease when using existing pattern making methods. We prepared experimental garments by the same pattern making method through applying body measurements obtained with the two measuring methods, and assessed the fit of the garment comparatively through expert evaluation and 3D scan cross-sectional evaluation. According to the results, 2D-pants using 2D direct body measurements was slightly tighter than 3D-pants using 3D measurements in waist circumference, hip circumference, and abdominal circumference. In the results of comparing appearance in terms of the fit of the experimental garment in each subject, significant difference was observed in most of the compared items. This result suggests that 3D automatic body measuring data may show different accuracy according to body shape and therefore it is necessary to examine difference between 2D direct body measurements and 3D automatic measurements according to body shape.