• 한국전기전자재료학회논문지
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• 제14권8호
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• pp.622-628
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• 2001

We developed 1- and 2-dimensional fluid model for the analysis of a capacitively coupled Ar RF(Radio Frequency) glow discharge. This discharge is in pure Ar gas at the pressure 100[mTorr], frequency 13.56[MHz] and voltage amplitude 120[V}. This model is based on the equations of continuity and electron energy conservation coupled with Poison equation. 2-dimensional model is simulated on the condition of GEC(Gaseous Electronic Conference cell). The geometry of the discharge chamber and the electrodes used in the model is cylindrically simmetric; tow cylinders for the electrodes are surrounded by the grounded chamber. It is shown that 1-dimensional model is very useful on the understanding of RF glow discharge property and of the movement of charged particles. 2-dimensional model predicts off-axis maximum structure as in the experiments and has the results in qualitatively and quantitatively good agreement with the experiments. Effects of dc self-bias voltage, guard ring and reactor geometry is discussed.

• Journal of Advanced Marine Engineering and Technology
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• 제32권8호
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• pp.1263-1268
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• 2008

In this paper, the low noise power amplifier for GaAs FET ATF-10136 is designed and fabricated with active bias circuit and self bias circuit. To supply most suitable voltage and current, active bias circuit is designed. Active biasing offers the advantage that variations in the pinch-off voltage($V_p$) and saturated drain current($I_{DSS}$) will not necessitate a change in either the source or drain resistor value for a given bias condition. The active bias network automatically sets a gate-source voltage($V_{gs}$) for the desired drain voltage and drain current. Using resistive decoupling circuits, a signal at low frequency is dissipated by a resistor. This design method increases the stability of the LNA, suitable for input stage matching and gate source bias. The LNA is fabricated on FR-4 substrate with active and self bias circuit, and integrated in aluminum housing. As a results, the characteristics of the active and self bias circuit LNA implemented more than 13 dB and 14 dB in gain, lower than 1 dB and 1.1 dB in noise figure, 1.7 and 1.8 input VSWR at normalized frequency $1.4{\sim}1.6$, respectively.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2003년도 추계학술대회 논문집 전기물성,응용부문
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• pp.309-311
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• 2003

The effects of etch parameters on dry etching of BLT thin films were investigated with ICP etch system in $Cl_2$/Ar and $BCl_2/Cl_2$/Ar gas. The etch rate and etch selectivity of BLT films were examined as a function of gas concentration, ICP power, bias power, and pressure. The maximum etch rates of 191.1 nm/min was obtained at the mixed etch condition of $BCl_3(20%)/Cl_2$/Ar, 700 W ICP RF power, 12 mTorr pressure and 400 W substrate RF power. As ICP power and rf power increased, the etch rate of BLT increased. As pressure increased, the etch rate of BLT decreased. The changes of radicals in both $Cl_2$/Ar and $BCl_3/Cl_2$/Ar plasma were measured with using optical emission spectroscopy (OES).

• 한국진공학회지
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• 제8권1호
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• pp.75-82
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• 1999

내부 삽입형 유도결합 플라즈마를 이온화원으로 하는 I-PVD장치를 이용하여 박막을 형성하는데 중요한 요소의 하나가 이온의 입사에너지이며, 이는 플라즈마 전위와 기판 전위의 차이에 의해서 결정된다. 이를 감소시킬 목적으로 안테나 여기 주파수를 4MHz의 중간주파수에서, 안테나의 정합 회로를 변형형, 부동형의 2가지로 변화시키고, 부동형에서는 바이어스 저항의 값을 가변시켰다. 그 결과 Ar 플라즈마에서 4MHz RF 전력 600 W에서 5 mTorr에서 30 mTorr의 넓은 압력 범위에서 5V 미만의 낮은 평균 플라즈마 전위와 60V의 안테나 전압을 얻었다. 또한 출력측에 설치한 RLC회로의 조절을 통해서 RF전력 500 W에서 RF 입력 및 출력단의 Rf 안테나 유기 전압을 50V의 아주 낮은 값으로 유지시킬 수 있었다. 이때의 안테나 및 플라즈마의 총 임피던스는 약 10$\Omega$이었으며, 리액턴스를 0.05$\Omega$수준으로 유지하였을 때 가장 낮은 전압을 얻었다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2009년도 하계학술대회 논문집
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• pp.74-74
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• 2009

Titanium nitride has been used as hardmask for semiconductor process, capacitor of MIM type and diffusion barrier of DRAM, due to it's low resistivity, thermodynamic stability and diffusion coefficient. Characteristics of the TiN film are high intensity and chemical stability. The TiN film also has compatibility with high-k material. This study is an experimental test for better condition of TiN film etching process. The etch rate of TiN film was investigated about etching in $BCl_3/Ar/O_2$ plasma using the inductively coupled plasma (ICP) etching system. The base condition were 4 sccm $BCl_3$ /16 sccm Ar mixed gas and 500 W the RF power, -50 V the DC bias voltage, 10 mTorr the chamber pressure and $40\;^{\circ}C$ the substrate temperature. We added $O_2$ gas to give affect etch rate because $O_2$ reacts with photoresist easily. We had changed $O_2$ gas flow rate from 2 sccm to 8 sccm, the RF power from 500 W to 800 W, the DC bias voltage from -50 V to -200 V, the chamber pressure from 5 mTorr to 20 mTorr and the substrate temperature from $20\;^{\circ}C$ to $80\;^{\circ}C$.

• 한국전기전자재료학회논문지
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• 제17권10호
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• pp.1100-1106
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• 2004

In this paper, we intend to make fringe-field switching (FFS) mode cell by the ion beam (IB) alignment method on the a-C：H thin film, to analyze electro-optical characteristics in this cell. We studied on the suitable inorganic thin film for fringe-field switching (FFS) cell and the aligning capabilities of nematic liquid crystal (NLC) using the alignment material of a-C：H thin film as working gas at 30 W rf bias condition. A high pretilt angle of about 5 $^{\circ}C$ by ion beam (IB) exposure on the a-C：H thin film surface was measured. Consequently, the high pretilt angle and the good thermal stability of LC alignment by the IB alignment method on the a-C：H thin film surface as working gas at 30 W rf bias condition can be achieved. An excellent voltage-transmittance (V -T) and response time curve of the IE-aligned FFS-LCD was observed with oblique IB exposure on the a-C：H thin films. Also, AC V-T hysteresis characteristics of the IB-aligned FFS-LCD with IE exposure on the a-C：H thin films is almost the same as that of the rubbing-aligned FFS cell on a polyimide (PI) surface.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제49권8호
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• pp.438-444
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• 2000

We report the effects of etch process parameters on the ohmic contact formation in the plasma etching of GaN. Planar inductively coupled plasma system with $CH_4/H_2/Ar$gas chemistry has been used as etch reactor. The contact resistance and the specific contact resistance have been investigated using transfer length method as a function of RF bias power and %Ar gas concentration in total flow rate. AES(Auger electron spectroscopy) analysis revealed that the etched GaN has nonstoichiometric Ga rich surface and was contaminated by carbon and oxygen. Especially large amount of carbon was detected at the sample etched for high bias power (or voltage) condition, where severe degradation of contact resistance was occurred. We achieved the low ohmic contact of $2.4{\times}10^{-3} {\Omega}cm^2$ specific contact resistance at the input power 400 W, RF bias power 150 W, and working pressure 10mTorr with 10 sccm $CH_4$, 15 sccm H2, 5 sccm Ar gas composition.

• 한국항해항만학회지
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• 제28권3호
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• pp.213-219
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• 2004

본 논문에서는 1,452∼l,492 MHz L-Band 대역의 위성 DAB 수신기를 위한 저잡음증폭기를 입ㆍ출력 반사계수와 전압정재파비를 개선하기 위하여 평형증폭기 형태로 설계 및 제작하였다. 저 잡음증폭기는 GaAs FET소자인 ATF-10136을 사용한 저 잡음증폭단과 MMIC 소자인 VNA-25을 사용한 이득증폭단을 하이브리드 방식으로 구성하였으며, 최적의 바이어스를 인가하기 위하여 능동 바이어스 회로를 사용하였다. 적용된 능동 바이어스 회로는 소자의 펀치오프전압($V_P$)과 포화드래인 전류($I_{DSS}$)의 변화에 따라 주어진 바이어스 조건을 만족시키기 위해 소스 저항과 드래인 저항의 조절이 필요없다. 즉, 능동 바이어스 회로는 요구된 드래인 전류와 전압을 공급하기 위해 게이트-소스 전압($V_{gs}$)을 자동적으로 조절한다. 저잡음증폭기는 바이어스 회로와 RF 회로를 FR-4기판 위에 제작하였고, 알류미늄 기구물에 장착하였다. 제작된 저잡음증폭기는 이득 32 dB, 이득평탄도 0.2 dB, 0,95 dB 이하의 잡음지수, 입ㆍ출력 전압정재파비는 각각 1.28, 1.43이고, $P_{1dB}$ 는 13 dBm으로 측정되었다.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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• pp.217-217
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• 2016

The amorphous InGaZnO (a-IGZO) is widely accepted as a promising channel material for thin-film transistor (TFT) applications owing to their outstanding electrical properties [1, 2]. However, a-IGZO TFTs have still suffered from their bias instability with illumination [1-4]. Up to now, many researchers have studied the sub-gap density of states (DOS) as the root cause of instability. It is well known that defect states can influence on the performances and stabilities of a-IGZO TFTs. The defects states should be closely related with the deposition condition, including sputtering power, and pressure. Nevertheless, it has not been reported how these defects are created during conventional RF magnetron sputtering. In general, during conventional RF magnetron sputtering process, negative oxygen ions (NOIs) can be generated by electron attachment in oxygen atom near target surface and then accelerated up to few hundreds eV by a self-bias; at this time, the high energy bombardment of NOIs induce defects in oxide thin films. Recently, we have reported that the properties of IGZO thin films are strongly related with effects of NOIs which are generated during the sputtering process [5]. From our previous results, the electrical characteristics and the chemical bonding states of a-IGZO thin films were depended with the bombardment energy of NOIs. And also, we suggest that the deep sub-gap states in a-IGZO as well as thin film properties would be influenced by the bombardment of high energetic NOIs during the sputtering process.In this study, we will introduce our novel technology named as Magnetic Field Shielded Sputtering (MFSS) process to prevent the NOIs bombardment effects and present how much to be improved the properties of a-IGZO thin film by this new deposition method. We deposited a-IGZO thin films by MFSS on SiO2/p-Si and glass substrate at various process conditions, after which we investigated the morphology, optical and electrical properties of the a-IGZO thin films.

• 한국전자파학회논문지
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• 제14권9호
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• pp.944-949
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• 2003

본 논문에서는 InCaP/GaAs HBT공정을 이용하여 낮은 DC 파워소모, 낮은 NF, 낮은 IMD 와 광대역 특성을 갖는 Ku-band LNB용 이중평형믹서를 설계하였다. 제작된 믹서는 3 V, 16 mA 의 U조건과 -23 dBm의 RF입력 조건하에서 5 dB의 변환이득, 14 dB의 NF, 17.9 GHz의 대역폭 그리고 50.34 dBc의 IMD특성을 얻었다. 낮은 IMD 특성, 광대역폭, 낮은 파워소모 특성은 InGaP/GaAs HBT의 선형성과 광대역 입력 정합기법과 바이어스 점의 최적화를 통해 얻을 수 있었다.