• 제목/요약/키워드: process capability indices

검색결과 90건 처리시간 0.021초

다측정 공정능력지수의 특성분석 (Analysis of Process Capability Index for Multiple Measurements)

  • 이도경
    • 산업경영시스템학회지
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    • 제39권1호
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    • pp.91-97
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    • 2016
  • This study is concerned about the process capability index in single process. Previous process capability indices have been developed for the consistency with the nonconforming rate due to the process target value and skewness. These indices calculate the process capability by measuring one spot in an item. But the only one datum in an item reduces the representativeness of the item. In addition to the lack of representativeness, there are many cases that the uniformity of the item such as flatness of panel is absolutely important. In these cases, we have to measure several spots in an item. Also the nonconforming judgment to an item is mainly due to the range not due to the standard variation or the shift from the specifications. To imply the uniformity concept to the process capability index, we should consider only the variation in an item. It is the within subgroup variation. When the universe is composed of several subgroups, the sample standard deviation is the sum of the within subgroup variation and the between subgroup variation. So the range R which represents only the within subgroup variation is the much better measure than that of the sample standard deviation. In general, a subgroup contains a couple of individual items. But in our cases, a subgroup is an item and R is the difference between the maximum and the minimum among the measured data in an item. Even though our object is a single process index, causing by the subgroups, its analytic structure looks like a system process capability index. In this paper we propose a new process capability index considering the representativeness and uniformity.

불량률과 이치하는 공정능력 지수 $C_{pd}$ (A Process Capability Index $C_{pd}$ Consistent with the Proportion of Nonconforming Items)

  • 임태진;변시섭
    • 품질경영학회지
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    • 제28권2호
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    • pp.103-122
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    • 2000
  • Process capability indices (PCI) $C_p\;C_{pk},\;C_m,\;and\;C_{pmk}$ are widely used to evaluate the process performance. The PCI's have been evolved to consider the 'off targetness' more adequately. However, all of these indices are found to be inconsistent with the proportion of nonconforming items, in some cases. That is, the PCI for a process may result in higher value even when the proportion of defectives increases. For these reasons, we propose a new capability index, $c_{pd}$, which is consistent with the defect rate. The characteristics of the new PCI, $c_{pd}$ are investigated with respect to the existing PCI's. Some statistical properties of an estimator for $c_{pd}$ are also investigated by a Monte Carlo simulation. Sensitivity study under minor deviation from normality is also performed to show the robustness of $c_{pd}$. A good estimator for $c_{pd}$ is under study.

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대화식 절차를 활용한 공정능력지수 기반 다중반응표면 최적화 (An Interactive Process Capability-Based Approach to Multi-Response Surface Optimization)

  • 정인준
    • 품질경영학회지
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    • 제45권2호
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    • pp.191-207
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    • 2017
  • Purpose: To develop an interactive version of the conventional process capability-based approach, called 'Interactive Process Capability-Based Approach (IPCA)' in multi-response surface optimization to obtain a satisfactory compromise which incorporates a decision maker(DM)'s preference information precisely. Methods: The proposed IPCA consists of 4 steps. Step 1 is to obtain the estimated process capability indices and initialize the parameters. Step 2 is to maximize the overall process capability index. Step 3 is to evaluate the optimization results. If all the responses are satisfactory, the procedure stops with the most preferred compromise solution. Otherwise, it moves to Step 4. Step 4 is to adjust the preference parameters. The adjustment can be made in two modes: relaxation and tightening. The relaxation is to make the importance of one of the satisfactory responses lower, which is implemented by decreasing its weight. The tightening is to make the importance of one of the unsatisfactory responses higher, which is implemented by increasing its weight. Then, the procedure goes back to Step 2. If there is no response to be adjusted, it stops with the unsatisfactory compromise solution. Results: The proposed IPCA was illustrated through a multi-response surface problem, colloidal gas aphrons problem. The illustration shows that it can generate a satisfactory compromise through an interactive procedure which enables the DM to provide his or her preference information conveniently. Conclusion: The proposed IPCA has two major advantages. One is to obtain a satisfactory compromise which is faithful to the DM preference structure. The other is to make the DM's participation in the interactive procedure easier by using the process capability index in judging satisfaction/unsatisfaction. The process capability index is very familiar with quality practitioners as well as indicates the process performance levels numerically.

게이지 R&R과 성능지수를 이용한 측정시스템과 공정능력 평가 방법 (Evaluation Method for Measurement System and Process Capability Using Gage R&R and Performance Indices)

  • 주영돈;이동주
    • 산업경영시스템학회지
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    • 제42권2호
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    • pp.78-85
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    • 2019
  • High variance observed in the measurement system can cause high process variation that can affect process capability badly. Therefore, measurement system analysis is closely related to process capability analysis. Generally, the evaluation for measurement system and process variance is performed separately in the industry. That is, the measurement system analysis is implemented before process monitoring, process capability and process performance analysis even though these analyses are closely related. This paper presents the effective concurrent evaluation procedure for measurement system analysis and process capability analysis using the table that contains Process Performance (Pp), Gage Repeatability & Reproducibility (%R&R) and Number of Distinct Categories (NDC). Furthermore, the long-term process capability index (Pp), which takes into account both gage variance and process variance, is used instead of the short-term process capability (Cp) considering only process variance. The long-term capability index can reflect well the relationship between the measurement system and process capability. The quality measurement and improvement guidelines by region scale are also described in detail. In conclusion, this research proposes the procedure that can execute the measurement system analysis and process capability analysis at the same time. The proposed procedure can contribute to reduction of the measurement staff's effort and to improvement of accurate evaluation.

다수 측정 위치를 갖는 단일 공정의 공정능력지수 (Process capability index for single process with multiple measurement locations)

  • 이도경;이현석
    • 산업경영시스템학회지
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    • 제30권3호
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    • pp.28-36
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    • 2007
  • Process Capability indices (PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process performance. PCIs have been developed to represent process capability more exactly. In the previous studies, only one designated location on each part is measured. But even though in single process, multiple measurement locations on each part are required to calculate the reliable process capability. In this paper, we propose a new process capability index with multiple measurement locations on each part. We showed numerical examples and sensitivity analysis according to the number of measurement locations.

이차손실함수를 이용한 유동적인 공정수행척도 (Flexible Process Performance Measures by Quadratic Loss Function)

  • 정영배
    • 산업경영시스템학회지
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    • 제18권36호
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    • pp.275-285
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    • 1995
  • In recent years there has been increasing interest in the issue of process centering in manufacturing process, The traditional process capability indices Cp, Cpk and Cpu are used to provide measure of process performance, but these indices do not represent the issue of process centering. A new measure of the process capability index Cpm is proposed that takes into account the proximity to the target value as well as the process variation when assessing process performance. However, Cpm only considers acceptance cost for deviation from target value within specification limits, do not includes economic consideration for rejected items. This paper proposes flexible process performance measures that considered quadratic loss function caused by quality deviation within specification limits, rejection cost associated with the disposition of rejected items, and inspection cost. In this model disposition of rejected items are considered under perfect corrective procedures and the absence of perfect corrective procedures.

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공정능력지수들과 6 시그마 품질수준에 대한 통계적 추론 (Statistical Inference for Process Capability Indices and 6 Sigma Qualify Levels)

  • 조중재;심규영;박병선
    • Communications for Statistical Applications and Methods
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    • 제15권3호
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    • pp.451-464
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    • 2008
  • 6 시그마는 백만 기회당 3.4개의 결점만을 갖는 최고의 품질수준을 의미한다. 일반적으로 높은 시그마 품질수준은 고객들에게 높은 만족도를 부여하는 것으로 알려져 있다. 공정능력지수들과 시그마 품질수준 $Z_{st}$는 6시그마 산업에서 공정능력을 평가하기 위하여 널리 이용되고 있다 공정능력지수에 관한 대부분의 평가들은 공정능력분석에 대해 경우에 따라 믿기 어려운 상황을 초래할 수도 있는 점 추정에 초점을 두고 있다. 본 논문에서는 현장 실무자들이 공정능력 여부를 결정하기 위하여 사용하고 있는 6시그마 품질수준 $Z_{st}$와 공정능력지수들 $C_p$, $C_{pk}$$C_{pm}$에 대하여 몇 가지 통계적 추정문제를 기초로 보다 효율적인 검정 방법에 대하여 제안, 연구하였다. 제안된 붓스트랩 검정 방법에 근거한 모의실험 결과는 공정분포의 정규성 여부에 관계없이 그리고 복잡한 계산 과정 없이 보다 효율적으로 적용될 수 있음을 입증하고 있다.

분포분할법을 이용한 휴리스틱 공정능력지수의 비교 분석 (Heuristic Process Capability Indices Using Distribution-decomposition Methods)

  • 장영순
    • 품질경영학회지
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    • 제41권2호
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    • pp.233-248
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    • 2013
  • Purpose: This study develops heuristic process capability indices (PCIs) using distribution-decomposition methods and evaluates the performances. The heuristic methods decompose the variation of a quality characteristic into upper and lower deviations and adjust the value of the PCIs using decomposed deviations in accordance with the skewness. The weighted variance(WV), new WV(NWV), scaled WV(SWV), and weighted standard deviation(WSD) methods are considered. Methods: The performances of the heuristic PCIs are investigated under the varied situations such as various skewed distributions, sample sizes, and specifications. Results: WV PCI is the best under the normal populations, WSD and SWV PCIs are the best under the low skewed populations, NWV PCI is the best under the moderate and high skewed populations. Conclusion: Comprehensive analysis shows that the NWV method is most adequate for a practical use.

기대손실을 이용한 다변량 공정능력지수 (A Multivariate Process Capability Index using Expected Loss)

  • 정영배
    • 산업경영시스템학회지
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    • 제28권4호
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    • pp.116-123
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    • 2005
  • The traditional process capability indices Cp, Cpk, Cpm, $Cpm^+$ have been used to characterize process performance on the basis of univariate quality characteristics. Cp, Cpk consider the process variation, Cpm considers both the process variation and the process deviation from target and Cpm+ considers economic loss for the process deviation from target. In manufacturing industry, there is growing interest in quantitative measures of process variation under multivariate duality characteristics. The multivariate process capability index incorporates both the process variation and the process deviation from target or considers expected loss caused by the process deviation from target. This paper proposes multivariate capability index based on the expected loss derived from multivariate normal distribution.

공정능력과 시그마 수준의 표시에 대한 연구 : 다수 위치측정에 대한 공정능력지수 기준 (A Study on Expression of Process Capability and Sigma Level)

  • 이도경
    • 산업경영시스템학회지
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    • 제32권1호
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    • pp.111-116
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    • 2009
  • Process capability indices have been widely used in manufacturing industries to provide a quantitative measure of process performance. PCIs have been developed to represent process capability more exactly. In the previous studies, only one designated location on each part has been measured. But multiple measurement locations on each part are required to calculate the reliable process capability. In this paper, we propose a new process capability index dealing the multiple measurement locations on each part. Also we showed the relationship between the new index and sigma level according to the number of measurement locations.