• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.402.1-402.1
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• 2014

Photonic force microscopy (PFM) is an optical tweezers-based scanning probe microscopy, which measures the forces in the range of fN to pN. The low stiffness leads proper to measure single molecular interaction. We introduce a novel photonic force microscopy to stably map various chemical properties as well as topographic information, utilizing weak molecular bond between probe and object's surface. First, we installed stable optical tweezers instrument, where an IR laser with 1064 nm wavelength was used as trapping source to reduce damage to biological sample. To manipulate trapped material, electric driven two-axis mirrors were used for x, y directional probe scanning and a piezo stage for z directional probe scanning. For resolution test, probe scans with vertical direction repeatedly at the same lateral position, where the vertical resolution is ~25 nm. To obtain the topography of surface which is etched glass, trapped bead scans 3-dimensionally and measures the contact position in each cycle. To acquire the chemical mapping, we design the DNA oligonucleotide pairs combining as a zipping structure, where one is attached at the surface of bead and other is arranged on surface. We measured the rupture force of molecular bonding to investigate chemical properties on the surface with various loading rate. We expect this system can realize a high-resolution multi-functional imaging technique able to acquire topographic map of objects and to distinguish difference of chemical properties between these objects simultaneously.

• Tribology and Lubricants
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• v.11 no.5
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• pp.40-46
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• 1995

This study concerns the design and development of the non-vibrating capacitance probe which could be used as a non-contact sensor for tribological wear. This device detects surface charge through temporal variation in the work function of a material. Experiments are performed to demonstrate the operation of the probe on a roating aluminum shaft. The reference electrode of the probe, made of lead, is placed adjacent (< 1.25-mm distance) to the shaft. Both surfaces which are electrically connected, form a capacitor. An artificial spatial variation in the work function is imposed on the shaft surface by coating a segment along the shaft circumference with a colloidal silver paint. As the shaft rotates, the reference electode senses changing contact potential difference with the shaft surface, owing to compositional variation. Temporal variation in the contact potential difference induces a current through the electrical connection. This current is amplified and converted to a voltage signal by an electoronic circuit with an operational amplifier. The magnitude of the signal decreases asymptotically with the electrode-shaft distance and increases linearly with the rotational frequency. These results are consistent with the theoretical model. Potential applications of the probe on wear monitoring are proposed.

• Transactions of the Korean Society for Noise and Vibration Engineering
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• v.15 no.2 s.95
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• pp.184-191
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• 2005

The near-field scanning micro scope (NSOM) technique is in the spotlight as the next generation storage device. Many different types of read/write mechanism for NSOM have been introduced in the literature. In order for a near-field probe to be successfully implemented in the system, a suitable slider and suspension are needed to be properly designed. The optical slider is designed considering near-filed optics and probe array. The suspension generally supports slider performance, and tracking servo capacity in HDD. Moreover, the suspension for optical slider also should meet the optical characteristics, and is also required to satisfy shock performances for the mobility for the actuator. In this study, the optical slider and the suspension for near-field probe array are designed and analyzed.

• Journal of Applied Reliability
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• v.7 no.1
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• pp.23-29
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• 2007

Probe card is a test component which is to classify the known good die with electrical contact before the packaging in the ATE (automatic testing equipment). Conventional probe tip was mostly needle type, it has been difficult to meet with conventional type, because of decreasing chip size, pad to pad pitch and pads size increasingly. For that reason, probe cards using MEMS (micro electro mechanical system) technology have been developed for various semiconductor chips. In this paper, Area Array type MEMS Probe tip was designed,, fabricated, and characterized its mechanical and electrical properties. The authors found that good electrical characteristics under $1{\Omega}$ were acquired with gold (Au) and aluminium (Al) pad contact test over 0.5gf and 4gf respectively. And, contact resistance variation under $0.1{\Omega}$ were achieved with 100,000 times of repetition test. And, insertion loss (IS) for high frequency operation was ascertained over 300MHz at -3dB loss.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2004.11a
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• pp.393-398
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• 2004

The near-field scanning micro scope (NSOM) technique is in the spotlight as the next generation storage device. Many different types of read/write mechanism for NSOM have been introduced in the literature. In order for a near-field probe to be successfully implemented in the system, a suitable slider and suspension are needed to be properly designed. The optical slider is designed considering near-filed optics and probe array. The suspension generally supports slider performance, and tracking servo capacity in HDD. Moreover, the suspension for optical slider also should meet the optical characteristics, and is also required to satisfy shock performances for the mobility for the actuator. In this study, the optical slider and the suspension fer near-field probe array are designed and analyzed.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.18 no.10
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• pp.1117-1125
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• 2007

In this paper, a study has been performed on the design of small loop probe and analysis of induced electromagnetic wave signal from a smartcard for contactless cryptographic analysis. Probes for cryptographic analysis are different from conventional EM probes, because the purpose of proposed probe is to obtain the information for secret key analysis of cryptographic system. The waveform of induced voltage on probe must be very close to radiated waveform from IC chip on smartcard because electromagnetic attack makes an attempt to analyze the radiated waveform from smartcard. In order to obtain secret key information, we need to study about cryptographic analysis using electromagnetic waves, an approximate model of source, characteristic of probe for cryptographic analysis, measurement of electromagnetic waves and calibration of probes. We measured power consumption signal on a smartcard chip and electromagnetic wave signal using proposed probe and compared with two signals of EMA point of view. We verified experimently the suitability of the proposed small loop probe for contactless cryptographic analysis by applying ARIA algorithm.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.23 no.2
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• pp.177-186
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• 2012

In this paper, we propose a design method that the crosstalk of probe connector pins satisfy the limitation of -30 dB. The parameters(inductance and capacitance) were extracted in the grid-structured probe connector pin system, and it is shown that the new parameters are easily calculated with increasing ground pin numbers using the previously calculated parameters. In addition, the crosstalk reduction algorithm by employing more grounds around the signal pin has been suggested, and it is confirmed that the suggested method is quite effective especially for the reduction of inductive couplings. Finally, we suggested the correlation between the pitch and the length of the pins to satisfy the crosstalk limitation of -30 dB with the given number of ground pins, which will be quite useful when design a probe connector pin system.

• Tribology and Lubricants
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• v.38 no.6
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• pp.274-280
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• 2022

There is a problem that semiconductor probe pin has a short lifespan. In order to solve this problem, Ti having excellent conductivity was doped to tetrahedral amorphous carbon (ta-C) having excellent hardness and abrasion resistance. This experiment was planned through the Taguchi robust design to determine the effect of the control factor of the ta-C:Ti coating film. The effect and contribution of control factors such as Unbalanced Magnetron Sputter(UBM) discharge current, arc discharge current, temperature, and bias voltage on ta-C:Ti characteristics were analyzed from the perspective of electrical and mechanical characteristics. The UBM discharge current was set to 4, 6, and 8 A. The main control factor of thickness and resistance is the UBM discharge current, and the thickness increased and the resistance decreased as the current increased. The decrease in resistance is due to the increase in the Ti content of the ta-C:Ti coating film. The arc discharge current was set to 60, 80, and 100 A. The main control factor of hardness and wear is the arc discharge current, and as the current rises, the hardness increases and the wear area decreases. This is due to the increased ta-C content of the ta-C:Ti coating film. Since resistance and wear are important for Probe Pin, the optimal level is set from the perspective of resistance and wear and a confirmation experiment is conducted.

• 유체기계공업학회:학술대회논문집
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• 1999.12a
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• pp.234-241
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• 1999

The flow at the impeller exit is important to validate engineering design and numerical analysis of pumps. However, it is not easy to measure the flow at the impeller exit and evaluate the impeller performance since there is usually strong interaction between the impeller and the volute casing. We installed axisymmetric collector instead of the volute casing, so there is no interaction between the impeller and casing. A 3-hole Cobra probe is used to investigate the flow at impeller exit and vaneless diffuser region for design and on design flow rate. For a single suction centrifugal pump of low specific speed, the flow field such as velocity, flow angle, and total pressure are measured by traversing the probe across the vaneless diffuser. These data can be used for performance prediction, desist and numerical analysis of pumps.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.19 no.1
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• pp.203-209
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• 2019

In this work, a new land-specific resistance measuring device (GM) and a measuring probe (Grounding Rod) are connected to the WENNER quadrant as power-line communication (PLC). In groups of two (P1,P2) probes, five to ten probes are installed in series on the ground at intervals of 1m, 2m, 4m, 8m, and 16m, respectively. If the PLC signal from the GMD is detected by the receiver of the Probe 1 (P1) for measurement, the minute voltage and current for measurement flow from the PSD (power supply) attached to the probe to the ground, and then, through the soil between P1 and P2, enters the Probe 1 (P2). The resistance value is then measured by the principle of voltage drop due to ground resistance. Measure the earth resistance every T seconds up to 1 trillion and store the measured data on the Arduino Server mounted on the main equipment. Stored measurement data can be derived from formulas by Ohm's Law and from inherent resistance (here,). Data obtained in real time will be linked to CDGES programs installed on Main PC, enabling data analysis and real-time monitoring of the ground environment on land. In addition, a three-dimensional display is possible with 3D graph support by identifying seasonal characteristics such as temperature and humidity of land (soils). The limitations of the study will require specific application measures of Test Bed for commercial access to a model that has been developed and operated experimentally.