• Journal of Photoscience
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• 제12권3호
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• pp.171-174
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• 2005

The relationship between porous surfaces and photoluminescence (PL) behavior of porous silicon carbide (PSC) in various solvents has been studied. The porous surfaces of p-type silicon carbide can be fabricated by electrochemical anodization from the 6H, 15R, 4H-${\alpha}$-SiC substrates in dark-current mode (DCM) condition. We have been investigated the dependence of the PL spectra of PSC under the medium having the different dielectric constants. It has been found that PL depends sensitively on the environment surrounding the surface. The extent of chemically stability on the surface of PSC due to the various solvents was confirmed by reflectance Fourier transform infrared (FTIR) spectroscopy. Detailed IR experiments on the PSC samples were carried out before and after various solvents immersion. These results will be offered important information on the origin of PL in porous structure.

• 마이크로전자및패키징학회지
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• 제18권1호
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• pp.23-27
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• 2011

전기화학적 에칭을 이용한 다공성 실리콘 이중층 형성은 초박형 태양전지 제작에서 PS layer transfer 기술을 적용하기 위한 선행 공정이다. 다공성 실리콘 층의 다공도는 전류밀도와 에칭용액 내 불산의 농도를 조절하여 제어할 수 있다. 전기화학적 에칭을 이용한 다공성 실리콘 형성을 위하여 비저항 $0.01-0.02\;{\Omega}{\cdot}cm$의 p-type (100)의 실리콘 웨이퍼를 사용하였으며, 에칭용액의 조성은 HF (40%) : $C_2H_5OH$(99 %) : $H_2O$ = 1 : 1 : 2 (volume)으로 고정하였다. PS layer transfer 기술에 사용되는 다공성 실리콘 이중층을 형성하기 위해서 에칭 도중 전류밀도를 낮은 전류밀도 조건에서 높은 전류밀도 조건으로 변환하여 low porosity layer 하부에 high porosity layer를 형성할 수 있다.

• 통합자연과학논문집
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• 제8권3호
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• pp.147-152
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• 2015

Photoluminescent porous silicon (PSi) were prepared by an electrochemical etch of n-type silicon under the illumination with a 300 W tungsten filament bulb for the duration of etch. The red photoluminescence emitting at 620 nm with an excitation wavelength of 450 nm is due to the quantum confinement of silicon nanocrystal in porous silicon. As-prepared PSi was sonicated, fractured, and centrifuged in toluene to obtain photoluminescence silicon quantum dots. BET and BHJ methods were employed to study the specific surface area of as-prepared PSi. Optical characterization of red photoluminescent silicon nanocrystal was investigated by UV-vis and fluorescence spectrometer. Also SEM and TEM images of porous silicon and nanoparticles were investigated.

• 센서학회지
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• 제8권2호
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• pp.202-209
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• 1999

본 연구에서는 기존의 열산화막과 거의 버금가는 전기적 및 화학적인 성질을 가진다고 알려져 있는 다공질 실리콘 산화막을 이용하여 마이크로스트립 전송선을 제작하였다. 실리콘 기판의 결정상태를 유지하면서 표면적과 화학적 활성이 큰 다공질 실리콘층(porous silicon layer)을 형성한 다음, 이를 열산화 하여 수 십 ${\mu}m$ 두께의 산화막을 실리콘 기판 상에 제조하였다. 수십 ${\mu}m$ 이상의 양질의 산화막을 얻기 위한 다공질 실리콘의 산화시에 스트레스에 의한 웨이퍼의 휘어짐을 방지하기 위하여 다단계의 열산화 공정을 수행하였다. 제조된 실리콘 산화막 상에 마이크로스트립 전송선을 제작하고 그 마이크로웨이브 특성을 측정하여 MMIC 기판으로서의 응용 가능성을 조사하였다.

• 대한기계학회논문집B
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• 제34권2호
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• pp.105-111
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• 2010

양극산화법과 DRIE 법으로 제작된 다공성 실리콘막을 이용하여 두 종류의 전기침투 펌프를 제작하였다. 펌프의 성능은 유기용매를 이용하여 유량과 단위전류당 유량으로 측정하였다. 두 종류 펌프 모두 기존의 다공성 유리막으로 제작된 전기침투 펌프보다 성능이 우월했다. 특히 DRIE 법으로 제작된 다공성 실리콘막은 유량과 단위전류당 유량이 모두 월등한 성능을 보였다. DRIE 법은 널리 알려진 방법이기에 이와 같이 제작된 펌프는 다양한 응용 분야에 비교적 쉽게 적용될 것으로 기대된다.

• 통합자연과학논문집
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• 제4권3호
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• pp.187-191
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• 2011

The differences of properties for both single-layered and multi-layered porous silicon were investigated. Multistructured porous silicons such as DBR or rugate porous silicon exhibit strong reflection resonances providing the reflection of a specific wavelength in the optical reflectivity spectrum. DBR PSi displays a square varying porosity gradient in the direction perpendicular to the plane of the filter but a sinusoidally varying porosity gradient was obtained for rugate PSi.

• 연구논문집
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• 통권34호
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• pp.131-138
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• 2004

Porous silicon nitride ceramics were prepared by Self-propagating High Temperature Synthesis from silicon powder, silicon nitride powder and the pore-forming precursor. The microstructure, porosity and the flexural strength of the porous silicon nitride ceramics were varied according to the Si/$Si_3N_4$ ratio, size and amount of the pore-forming precursors. Some samples exhibited as high flexural strength as $162\pm24$ MPa. The high strength is considered to result from the fine pore size and the strong bonding among the silicon nitrid particles.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1995년도 하계학술대회 논문집 C
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• pp.1209-1212
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• 1995

This paper presents a capacitive humidity sensor using porous silicon layers formed tom the anodization of p-type silicon in HF solution. The upper electrodes consist of many aluminum strips over porous silicon, between which the porous silicon is etched away. The sensor showed a good sensitivity(20pF/%RH) and lineaity in the range of 40%RH$\sim$80%RH, a hysteresis of ${\pm}2%$ RH, and a slow transient response. These preliminary resluts show that futher improvement can still be expected.

• 한국세라믹학회지
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• 제39권2호
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• pp.109-112
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• 2002

The structural and optical features of Porous Silicon(PS) were investigated; the porous silicon was prepared by electrochemical etching of silicon wafers in HF solution. The morphologies and Photoluminescece(PL) features of the PS were investigated in terms of etching time, current density and aging conditions. The average pore diameter and pore depth were determined by current density and etching time, respectively. As-prepared PS exhibited the maximum PL peak at the wavelength of ∼ 450 nm. The degree of deviation from as-prepared PS during aging treatment seemed to depend on the microstructure as well as morphology of the PS. It is found that etching current density played an important role on the microstructural features of the PS.

• 한국세라믹학회지
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• 제35권5호
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• pp.486-492
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• 1998

Silicon carbide (SiC) thin films were deposited on the porous silicon substrates by chemical vapour de-position(CVD) using MTS as a source material. The deposited films were ${\beta}$-SiC with poor crystallity con-firmed by XRD measurement. It was considered that the films showed the mixed characteistics of cry-stalline and amorphous SiC where amorphous SiC where amorphous SiC played a role of buffer layer in interface between as-dep films and Si substrate. The buffer layer reduced lattice mismatch to some extent the generally occurs when SiC films are deposited on Si. The low temperature (10K) PL (phtoluminescence) studies showed two broad bands with peaks at 600 and 720 for the films deposited at 1100$^{\circ}C$ The maximum PL peak of the crystalline SiC was observed at 600 nm and the amrophous SiC of 720 nm was also confirmed. PL peak due the amorphous SiC was smaller than that of the crystalline SiC, PL of porous Si might be disapperared due to densification during heat treatment.