• Title/Summary/Keyword: plasma-enhanced chemical vapor deposition (PECVD)

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Properties of IZTO Thin Films on Glass with Different Thickness of SiO2 Buffer Layer

  • Park, Jong-Chan;Kang, Seong-Jun;Yoon, Yung-Sup
    • Journal of the Korean Ceramic Society
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    • v.52 no.4
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    • pp.290-293
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    • 2015
  • The properties of the IZTO thin films on the glass were studied with a variation of the $SiO_2$ buffer layer thickness. $SiO_2$ buffer layers were deposited by plasma-enhanced chemical vapor deposition (PECVD) on the glass, and the In-Zn-Tin-Oxide (IZTO) thin films were deposited on the buffer layer by RF magnetron sputtering. All the IZTO thin films with the $SiO_2$ buffer layer are shown to be amorphous. Optimum $SiO_2$ buffer layer thickness was obtained through analyzing the structural, morphological, electrical, and optical properties of the IZTO thin films. As a result, the IZTO surface roughness is 0.273 nm with a sheet resistance of $25.32{\Omega}/sq$ and the average transmittance is 82.51% in the visible region, at a $SiO_2$ buffer layer thickness of 40 nm. The result indicates that the uniformity of surface and the properties of the IZTO thin film on the glass were improved by employing the $SiO_2$ buffer layer and the IZTO thin film can be applied well to the transparent conductive oxide for display devices.

Effect of Rapid Thermal Annealing on Growth and Field Emission Characteristics of Carbon Nanotubes

  • Ko, Sung-Woo;Shin, Hyung-Cheol;Park, Byung-Gook;Lee, Jong-Duk;Jun, Pil-Goo;Kwak, Byung-Hwak;Noh, Hyung-Wook;Uh, Hyung-Soo
    • 한국정보디스플레이학회:학술대회논문집
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    • 2004.08a
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    • pp.453-455
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    • 2004
  • The effect of rapid thermal annealing (RTA) treatment on the growth characteristics of CNTs was investigated. We observed that Ni catalyst film was agglomerated by RTA treatment, resulting in the formation of Ni nanoparticles. The well aligned CNTs were grown from the Ni nanoparticles by plasma enhanced chemical vapor deposition (PECVD). It is shown that the size and distribution of the nanoparticles depend mainly on the annealing temperature and initial thickness of the metal layer. Also, it was found that CNTs grown through optimal RTA treatment had the more improved field emission characteristics than those of as-grown CNTs.

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Electrical Properties of B-doped ZnO Thin Films deposited by Plasma Enhanced Chemical Vapor Deposition (플라즈마 화학기상 증착법에 의해 증착된 B이 첨가된 ZnO 박막의 전기적 특성)

  • 최준영;조해석;김영진;이용의;김형준
    • Journal of the Korean Vacuum Society
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    • v.4 no.1
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    • pp.85-90
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    • 1995
  • 본 연구에서는 투명 전극으로의 응용을 목적으로 PECVD법에 의해 증착된 B이 첨가된 ZnO 박막의 전기 및 광학적 특성을 살펴보았다. B을 첨가하지 않은 ZnO 박막은 비저항이 수 $\Omega$-cm 정도의 값을 가지고 있었으며 시간에 따른 비저항의 변화가 컸으나, 2% B2H6을 5-16sccm의 유량범위에서 첨가한 경우에는 5-9X10-2 $\Omega$-cm의 비저항을 가지고 시간 경과에 따른 비저항의 변화가 아주 작은 ZnO 박막을 얻을 수 있었다. Van der Pauw법에 의한 Hall 계수의 측정 결과에 의하면, B을 첨가하지 않은 ZnO 박막의 전자 농도는 1017/㎤정도였으나 B을 첨가함으로써 최고 1020/㎤까지 증가하였다. 그러나 B이 첨가되기 전에는 박막의 전하 나르게 이동도가 $4extrm{cm}^2$/V.sec 이었으나, B참가에 의해 $0.7\textrm{cm}^2$/V.sec 이하로 감소하였다. B을 첨가한 경우와 첨가하지 않은 경우의 ZnO 박막은 모두 가시광성영역에서 90%이상의 광투과율을 가지고 있었으며, B을 첨가한 경우는 전자농도가 증가함에 따라 광학적 밴드 갭이 3.3eV로부터 3.55eV로 증가하는 거동을 보였다.

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Growth of carbon nanotubes on metal substrate for electronic devices

  • Ryu, Je-Hwang;Kim, Ki-Seo;Lee, Chang-Seok;Min, Kyung-Woo;Song, Na-Young;Jeung, Il-Ok;Manivannan, S.;Moon, Jong-Hyun;Park, Kyu-Chang;Jang, Jin
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08b
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    • pp.1632-1635
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    • 2007
  • We developed a novel growth method of CNTs on metal substrate for device applications, deposited by a triode direct current plasma enhanced chemical vapor deposition (dc-PECVD). With resist-assisted patterning (RAP) method, we had grown CNTs on metal substrate, which were strongly bonded with metal substrate.

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Stress Dependence of Thermal Stability of Nickel Silicide for Nano MOSFETs

  • Zhang, Ying-Ying;Lim, Sung-Kyu;Lee, Won-Jae;Zhong, Zhun;Li, Shi-Guang;Jung, Soon-Yen;Lee, Ga-Won;Wang, Jin-Suk;Lee, Hi-Deok
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.11a
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    • pp.15-16
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    • 2006
  • The thermal stability of nickel silicide with compressively and tensilely stressed nitride capping layer has been investigated in this study. The Ni (10 nm) and Ni/Co/TiN (7/3/25 nm) structures were deposited on the p-type Si substrate. The stressed capping layer was deposited using plasma enhanced chemical vapor deposition (PECVD) after silicide formation by one-step rapid thermal process (RTP) at $500^{\circ}C$ for 30 sec. It was found that the thermal stability of nickel silicide depends on the stress induced by the nitride capping layer. In the case of Ni (10 nm) structure, the high compressive sample shows the best thermal stability, whereas in the case of Ni/Co/TiN (7/3/25 nm) structure, the high compressive sample shows the worst thermal stability.

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Properties of IZTO Thin Films Deposited on PET Substrates with The SiO2 Buffer Layer

  • Park, Jong-Chan;Kang, Seong-Jun;Chang, Dong-Hoon;Yoon, Yung-Sup
    • Journal of the Korean Ceramic Society
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    • v.52 no.1
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    • pp.72-76
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    • 2015
  • 150-nm-thick In-Zn-Tin-Oxide (IZTO) films were deposited by RF magnetron sputtering after a 10 to 50-nm-thick $SiO_2$ buffer layer was deposited by plasma enhanced chemical vapor deposition (PECVD) on polyethylene terephthalate (PET) substrates. The electrical, structural, and optical properties of the IZTO/$SiO_2$/PET films were analyzed with respect to the thickness of the $SiO_2$ buffer layer. The mechanical properties were outstanding at a $SiO_2$ thickness of 50 nm, with a resistivity of $1.45{\times}10^{-3}{\Omega}-cm$, carrier concentration of $8.84{\times}10^{20}/cm^3$, hall mobility of $4.88cm^2/Vs$, and average IZTO surface roughness of 12.64 nm. Also, the transmittances were higher than 80%, and the structure of the IZTO films were amorphous, regardless of the $SiO_2$ thickness. These results indicate that these films are suitable for use as a transparent conductive oxide for transparency display devices.

A Study on Pre-bonding of 3C-SiC Wafers using CVD Oxide (CVD 절연막을 이용한 3C-SiC 기판의 초기직접접합에 관한 연구)

  • ;;Shigehiro Nishino
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.15 no.10
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    • pp.883-888
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    • 2002
  • SiC direct bonding technology is very attractive for both SiCOI(SiC-on-insulator) electric devices and SiC-MEMS(micro electro mechanical system) fields because of its application possibility in harsh environments. This paper presents pre-bonding techniques with variation of HF pre-treatment conditions for SiC wafer direct bonding using PECVD(plasma enhanced chemical vapor deposition) oxide. The PECYD oxide was characterized by XPS(X-ray photoelectron spectrometer) and AFM(atomic force microscopy). The characteristics of the bonded sample were measured under different bonding conditions of HF concentration and an applied pressure. The bonding strength was evaluated by the tensile strength method. The bonded interface was analyzed by using SEM(scanning electron microscope). Components existed in the interlayer were analyzed by using FT-IR(fourier transform infrared spectroscopy). The bonding strength was varied with HF pre-treatment conditions before the pre-bonding in the range of 5.3 kgf/cm$^2$to 15.5 kgf/cm$^2$.

Highly Sensitive and Transparent Pressure Sensor Using Double Layer Graphene Transferred onto Flexible Substrate

  • Chun, Sungwoo;Kim, Youngjun;Jin, Hyungki;Jung, Hyojin;Park, Wanjun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.229.2-229.2
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    • 2014
  • Graphene, an allotrope of carbon, is a two-dimensional material having a unique electro-mechanical property that shows significant change of the electrical conductance under the applied strain. In addition of the extraordinary mechanical strength [1], graphene becomes a prospective candidate for pressure sensor technology [2]. However, very few investigations have been carried out to demonstrate characteristics of graphene sensor as a device form. In this study, we demonstrate a pressure sensor using graphene double layer as an active channel to generate electrical signal as the response of the applied vertical pressure. For formation of the active channel in the pressure sensor, two single graphene layers which are grown on Cu foil (25 um thickness) by the plasma enhanced chemical vapor deposition (PECVD) are sequentially transformed to the poly-di-methyl-siloxane (PDMS) substrate. Dry and wet transfer methods are individually employed for formation of the double layer graphene. This sensor geometry results a switching characteristic which shows ~900% conductivity change in response to the application of pulsed pressure of 5 kPa whose on and off duration is 3 sec. Additionally, the functional reliability of the sensor confirms consistent behavior with a 200-cycle test.

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The Annealing Effect of Diamond-like Carbon Films for RF MEMS Switch

  • Hwang, Hyun-Suk;Choi, Won-Seok;Cha, Jae-Sang
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.35 no.11A
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    • pp.1091-1096
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    • 2010
  • Stiction in microelectromechanical systems (MEMS) has been a major failure mechanism. Especially, in RF MEMS switches, moving parts often suffered in-use and release related stiction problems. Some materials and methods have been used to prevent this problem. Diamond-like carbon (DLC) has not only been used as a protective material owing to its good mechanical properties but also has been used as a hydrophobic material. Its properties could be controlled by post annealing treatment in various conditions. We synthesized DLC films using a radio frequency plasma enhanced chemical vapor deposition (RF PECVD) method on silicon substrates using methane ($CH_4$) and hydrogen ($H_2$) gas. Then, the change of the hydrophobic property of the films was investigated undervarious annealing temperatures in nitrogen and in oxygen ambient. The films, that were annealed above $700^{\circ}C$ in nitrogen ambient, showed a high contact angle of water (> $90^{\circ}$) even though their mechanical property was sacrificed to some degree. The structural variation and the changes of the hydrophobic and mechanical properties of the DLC films were analyzed by Raman spectrum, contact angle measurement, surface profiler, and a nanoindentation test.

이온 빔 식각을 통한 초발수성 금속 표면의 개발

  • Jeong, Seong-Hun;Lee, Seung-Hun;Kim, Jong-Guk;Kim, Do-Geun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.308-308
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    • 2011
  • 최근 초발수성 표면은 자동차 표면을 비롯해 안경 렌즈 등 여러 분야에서 사용되고 점차 그 필요성이 대두되고 있다. 이러한 초발수성 표면 제작은 주로 자연 상태에서 초발수 특성을 보이는 연 잎을 모방하는 방법으로 이루어지고 있다. 연 잎의 표면을 살펴보면 표면에 마이크로-나노 구조의 돌기가 존재하고 그 위에 표면에너지가 낮은 물질이 코팅되어 있는 구조이다. 본 연구에서는 이를 응용하여 금속 표면에 마이크로-나노 구조물을 형성하고 그 위에 발수 특성을 지닌 물질을 코팅하는 방법을 이용하여 초발수성 금속 표면을 개발하였다. 이는 건축 외장재, 자동차 및 내연 기관 부품, 모바일 기기 등의 가전제품 외장재 등 발수 특성을 필요로 하는 분야에 적용 가능하고, 이에 대한 수요가 급증하고 있다. 마이크로-나노 구조 형성은 기계적 가공 및 이온 빔 식각 방법을 이용하였다. 그리고 그 위에 plasma enhanced chemical vapor deposition (PECVD) 방법을 이용하여 표면에너지가 낮은 fluorinated carbon 혹은 diamond-like-carbon (DLC)를 코팅하였다. 본 연구의 결과, 표면 처리 이전 물과의 접촉각이 $60^{\circ}$ 정도를 보이는 steel 기판이 표면 처리 이후에는 $140^{\circ}$ 이상의 접촉각을 보임으로써 초발수 특성의 표면이 형성되었음을 확인할 수 있었다.

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