Electrical Properties of $Bi_4Ti_3O_{12}$ Thin Films dependant on Oxygen Partial Pressure during Annealing
(열처리 산소 분압에 따른 $Bi_4Ti_3O_{12}$ 박막의 전기적 특성 변화)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 2009.06a
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- pp.191-191
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- 2009