• 제목/요약/키워드: phase change characteristics

검색결과 907건 처리시간 0.028초

The Cooling Characteristics of Clathrate Compound according to Concentration of TMA

  • Lee, Jong-In;Kim, Chang-Oh;Chung, Nak-Kyu
    • International Journal of Air-Conditioning and Refrigeration
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    • 제17권1호
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    • pp.32-36
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    • 2009
  • The ice storage system uses water for low temperature latent heat storage. However, a refrigerator capacity is increased and COP is decreased due to supercooling of water in the course of phase change from solid to liquid. This study investigates the cooling characteristics of the TMA-water clathrate compound including TMA (Tri-methyl-amine, $(CH_3)_3N$) of $20{\sim}25wt%$ as a low temperature latent heat storage material. The results showed that the phase change temperature and the specific heat is increased and the supercooling degree is decreased as the weight concentration of TMA increased. Especially, the clathrate compound containing TMA 25 wt% has the average phase change tempera ture of $5.8^{\circ}C$, the supercooling degree of $8.0^{\circ}C$ and the specific heat of 3.499 kJ/kgK in the cooling process. This can lead to reduction of operation time of refrigerator in low temperature latent heat storage system and efficiency improvement of refrigerator COP and overall system. Therefore, energy saving and improvement of utilization efficiency are expected.

The Study of Phase-change with Temperature and Electric field in Chalcogenide Thin Film

  • Yang, Sung-Jun;Shin, Kyung;Park, Jung-Il;Lee, Ki-Nam;Chung, Hong-Bay
    • Transactions on Electrical and Electronic Materials
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    • 제4권5호
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    • pp.24-27
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    • 2003
  • We have been investigated phase-change with temperature and electric field in chalcogenide Ge$_2$Sb$_2$Te$\sub$5/ thin film. T$\sub$c/(crystallization temperature) is confirmed by measuring the resistance with the varying temperature on the hotplate. We have measured I-V characteristics with Ge$_2$Sb$_2$Te$\sub$5/ chalcogenide thin film. It is compared with I-V characteristics after impress the variable pulse. The pulse has variable height and duration.

GeSbTe계 이중층의 상변화 특성에 미치는 열처리 온도 효과 (Effect of Annealing Temperature on Phase-change Characteristics of GeSbTe-based Bilayers)

  • 윤회진;방기수;이승윤
    • 한국전기전자재료학회논문지
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    • 제30권2호
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    • pp.86-90
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    • 2017
  • This work reports the phase-change behavior and thermal stability of doped GeSbTe/GeSbTe bilayers. We prepared the bilayers using RF sputtering, and annealed them at annealing temperature ranging from $100^{\circ}C$ to $400^{\circ}C$. The sheet resistance of the bilayer decreased and saturated with increasing annealing temperature, and the saturated value was close to that of pure GeSbTe film. The surface of the bilayer roughened at $400^{\circ}C$, which corresponds to the surface roughening of doped GeSbTe film. Mixed phases of face-centered cubic and hexagonal close-packed crystalline structures were identified in the bilayers annealed at elevated temperature. These results indicate that the phase-change behavior of the bilayer depends on the concurrent phase-transitions of the two GeSbTe-based films. The dopants in the doped GeSbTe film were diffused out at annealing temperatures of $300^{\circ}C$ or higher, which implies that the thermal stability of the bilayer should be considered for its application in phase-change electronic devices.

Te 을 미세 도핑한 S $b_{85}Ge_{15}$ 상변화 기록 박막의 특성 (The Characteristics of Te-light doped S $b_{85}Ge_{15}$Thin Film as Phase Change Optical Recording Media)

  • 김종기;김홍석;이영종;정홍배
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1997년도 춘계학술대회 논문집
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    • pp.20-22
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    • 1997
  • In ours study, we investigated the various properties in Te-light doped $Sb_{85}$G $e_{15}$ thin films such as the change of reflectance and transmittance according to phase change from amorphous to crystalline states In all films the transmittance was decreased, but the reflectance was increased by annealing. Particularly, the reflectance between as- deposited state and annealed state showed the largest change in the T $e_{0.5}$($Sb_{85}$G $e_{15}$ )$_{99.5}$ thin film at 780nm, which was about 40% in as-deposited state and about 70% in annealed state. Therefore, it might be considered that the T $e_{0.5}$($Sb_{85}$G $e_{15}$ )$_{99.5}$ thin film is recording medium showing to a good optical properties if it is used to optical recording of the phase change type. change type.ype.

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하부전극에 따른 상변화 메모리 셀의 전기 및 발열 특성 (The Electrical and Thermal Properties of Phase Change Memory Cell with Bottom Electrode)

  • 장낙원;김홍승;이준기;김도형;마석범
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2006년도 추계학술대회 논문집 Vol.19
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    • pp.103-104
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    • 2006
  • PRAM (Phase change Random Access Memory) is one of the most promising candidates for next generation Non-volatile Memories. The Phase change material has been researched in the field of optical data storage media. However, the characteristics required in solid state memory are quite different from optical ones. In this study, the reset current and temperature profile of PRAM cells with bottom electrode were calculated by the numerical method.

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랜드/그루부 기록형 상변화 광디스크 박막에 대한 열전달 해석 (Heat Transfer Analysis on Phase Change Optical Disc with Land/Groove Recording)

  • 이정두;홍성국;조형희
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2003년도 춘계학술대회
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    • pp.1621-1626
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    • 2003
  • This study deals with the heat transfer analysis on phase change optical disc with land/groove recording by means of numerical method. Finite difference time domain(FDTD) method was used to obtain the amount of absorption of light propagating inside disc and finite difference element(FEM) method was used to calculate the temperature distribution. The calculated results present the detailed information of recording characteristics on the phase change optical disc. The temperature profiles are quite different between the land track and the groove track. The recorded mark shape on land track is smaller and more elliptic than that on groove track. It is shown that the thermal problem to the neighboring track takes place due to secondary peaks. It is found that the different write strategy should be applied to land and groove recording, respectively.

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고밀도 광기록을 위한 GeSbTe 박막의 Wet-Etching 특성연구 (Wet-Etching Characteristics of Inorganic GeSbTe Films for High Density Optical Data Storage)

  • 김진홍;김선희;이준석
    • 정보저장시스템학회논문집
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    • 제2권3호
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    • pp.196-200
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    • 2006
  • We are developing a phase change etching technology using an inorganic photoresist of GeSbTe film which is the recording material of the phase change disc. A selective etching phenomenon between amorphous and crystalline states can be utilized with an alkaline etchant. Phase-change pits could be formed using this technique, in which the etching selectivity is strongly dependent on the concentration of the etchant. The degree of etching was investigated by the transmittance between crystalline and amorphous films after the wet-etching. The pits patterned on the disc could be observed by AFM after wet-etching.

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PRAM용 GST계 상변화 박막의 하부막에 따른 특성 (Properties of GST Thin Films for PRAM with Bottom Electrode)

  • 장낙원;김홍승
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
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    • pp.205-206
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    • 2005
  • PRAM (Phase change Random Access Memory) is one of the most promising candidates for next generation Non-volatile Memories. The Phase change material has been researched in the field of optical data storage media. Among the phase change materials, $Ge_2Sb_2Te_5$(GST) is very well known for its high optical contrast in the state of amorphous and crystalline. However, the characteristics required in solid state memory are quite different from optical ones. In this study, the structural properties of GST thin films with bottom electrode were investigated for PRAM. The 100-nm thick GST films were deposited on TiN/Si and TiAlN/Si substrates by RF sputtering system. In order to characterize the crystal structure and morphology of these films, we performed x-ray diffraction (XRD) and atomic force microscopy (AFM).

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Phase Transition Characteristics in $Ge_xSb_{100-x}$ Film for Optical Storage Media

  • Park Tae-jin;Kang Myung-jin;Choi Se-young
    • 정보저장시스템학회:학술대회논문집
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    • 정보저장시스템학회 2005년도 추계학술대회 논문집
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    • pp.124-127
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    • 2005
  • Rewritable optical memory devices such as an CD-RW and DVD+RW are data storage media, which take advantage of the different optical properties in the amorphous and crystalline states of phase change materials. The switching property, structural transformation, transformation kinetics and chemical bindings of $Ge_xSb_{100-x}$($6{\le}x{\le}$34) were studied to investigate the feasibility of applying $Ge_xSb_{100-x}$ alloys in optical memory. The $Ge_xSb_{100-x}$ thin film was deposited by RF magnetron co-sputtering system and phase change characteristics were investigated by X-ray diffraction (XRD), static tester, inductively coupled plasma atomic emission spectrometer (ICP-AES) and atomic force microscopy (AEM). Optimum fiim composition of $Ge_xSb_{100-x}$ was studied and its minimum time fur laser induced crystallization and optical contrast fur phase transition was performed. These results might be correlated with the binding energies between Ge and Sb, and indicate that $Ge_xSb_{100-x}$ have an potential far optical memory applications.

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2상 여자방식에 의한 SRM의 운전특성에 관한 연구 (Study on Driving Characteristics of SRM by 2-Phase Exictation Method)

  • 문재원;오석규;안진우;황영문
    • 전력전자학회:학술대회논문집
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    • 전력전자학회 1998년도 전력전자학술대회 논문집
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    • pp.193-196
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    • 1998
  • A new excitation method of switched reluctance motor drive is described in this paper. This excitation method produces reluctance torque by mutual action between two phases as well as conventional self reluctance torque due to two phase excitation at a time. In other words, the change of self inductance and mutual inductance are used to produce torque. This paper suggests the operational principle, the mechanism of torque product of switched reluctance motor with two phase excitation. The acoustic noise characteristics of two phase excitation method are described against that of conventional excitation method.

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