• Journal of the Korean Ceramic Society
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• v.49 no.6
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• pp.631-636
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• 2012

Conventional SONOS (poly-silicon/oxide/nitride/oxide/silicon) type memory is associated with a retention issue due to the continuous demand for scaled-down devices. In this study, $Al_2O_3/Y_2O_3/SiO_2$ (AYO) multilayer structures using a high-k $Y_2O_3$ film as a charge-trapping layer were fabricated for nonvolatile memory applications. This work focused on improving the retention properties using a $Y_2O_3$ layer with different tunnel oxide thickness ranging from 3 nm to 5 nm created by metal organic chemical vapor deposition (MOCVD). The electrical properties and reliabilities of each specimen were evaluated. The results showed that the $Y_2O_3$ with 4 nm $SiO_2$ tunnel oxide layer had the largest memory window of 1.29 V. In addition, all specimens exhibited stable endurance characteristics (program/erasecycles up to $10^4$) due to the superior charge-trapping characteristics of $Y_2O_3$. We expect that these high-k $Y_2O_3$ films can be candidates to replace $Si_3N_4$ films as the charge-trapping layer in SONOS-type flash memory devices.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.9 no.2
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• pp.231-239
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• 1999

The microstructure of ceramic composite has been found to be governed by the type and amount of the secondary phase, the sintering aid, and the sintering conditions such as sintering temperature, pressure and holing time. Moreover, tribological properties are strongly dependent on microsturcture of composite and operating conditions. In this study, silicon nitride with various amount of magnesia as a sintering aid were prepared and sintered by a hot pressing (HP) technique. Microstructure, mechanical properties (hardness, strength, and fracture toughness), and tribological properties in different environments of $Si_{3}N_{4}$ (in air, water, and paraffine oil) were investigated as a function of MgO content in $Si_{3}N_{4}$. As increasing the amount of MgO in $Si_{3}N_{4}$, the glassy phase in the grain boundaries enlarged the $\beta$-phase elongated grains, and also degraded the Hertzian contact damage resistance. Tribological behaviors in air was seemed to be determined by fracture toughness of $Si_{3}N_{4}$, and those in water and paraffin oil was seemed to be determined by hardness as well as strength. Since glassy grain-boundary phase (MgO) in $Si_{3}N_{4}$ expected to be reacted with water during sliding, such tribochemical reaction reduced wear. In paraffin oil under a higher applied load, the initial sliding dominated wear rate because of Hertzian contact damage.

• Korean Journal of Materials Research
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• v.13 no.8
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• pp.519-523
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• 2003

We report the synthesis of cubic spinel $ZnCo_2$$O_4$thin films and the tunability of the conduction type by control of the oxygen partial pressure ratio. Zinc cobalt oxide films were grown on$ SiO_2$(200 nm)/Si substrates by reactive magnetron sputtering method using Zn and Co metal targets in a mixed Ar/$O_2$atmosphere. We found from X-ray diffraction measurements that the crystal structure of the zinc cobalt oxide films grown under an oxygen-rich condition (the $O_2$/Ar partial pressure ratio of 9/1) changes from wurtzite-type $Zn_{1-x}$ $Co_{X}$O to spinel-type $ZnCo_2$$O_4$with the increase of the Co/Zn sputtering ratio,$ D_{co}$ $D_{zn}$ . We noted that the above structural change accompanied by the variation of the majority electrical conduction type from n-type (electrons) to p-type (holes). For a fixed $D_{co}$ $D_{zn}$ / of 2.0 yielding homogeneous spinel-type $_2$O$ZnCo_4$films, the type of the majority carriers also varied, depending on the$ O_2$/Ar partial pressure ratio: p-type for an $O_2$-rich and n-type for an Ar-rich atmosphere. The maximum electron and hole concentrations for the Zn $Co_2$ $O_4$films were found to be 1.37${\times}$10$^{20}$ c $m^{-3}$ and 2.41${\times}$10$^{20}$ c $m^{-3}$ , respectively, with a mobility of about 0.2 $\textrm{cm}^2$/Vs and a high conductivity of about 1.8 Ω/$cm^{-1}$ /.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.308-308
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• 2012

현재 결정질 태양전지 제작에 있어 공정 단가 및 재료비 절감을 위해 실리콘 웨이퍼의 두께가 점점 얇아지는 추세이며, 이에 따른 장파장 영역 흡수 손실을 감소시키기 위한 방안으로 후면 패시베이션에 관한 연구가 활발히 진행되고 있다. 후면 패시베이션층으로는 SiO2, SiNx, a-Si:H, SiOxNy 등의 물질이 사용되고 있으며, 본 연구에서는 SiO2/SiNx/SiO2 (ONO)의 삼중막 구조를 패시베이션층으로 하여 SiNx 단일막 구조와의 열처리 온도에 따른 소수캐리어 수명(${\tau}eff$), 후면 재결합속도(Seff), 확산거리(LD) 등의 파라미터 변화를 비교하였다. 증착 직후와 $350^{\circ}C$에서의 Forming Gas Annealing (FGA), 그리고 $800^{\circ}C$의 고온에서의 fast firing 후의 각각의 파라미터 변화를 관찰하였다. 증착 직후 SiNx 단일막과 ONO 삼중막의 소수캐리어 수명은 각각 $108{\mu}s$와 $145{\mu}s$를 보였다. 후면 재결합속도는 65 cm/s와 44 cm/s를 보였으며, 확산거리는 각각 $560{\mu}m$와 $640{\mu}m$를 나타내었다. FGA와 firing 열처리 후 세 파마미터는 모두 향상된 값을 보였으며 최종 firing 처리 후 단일막과 삼중막의 소수캐리어 수명은 각각 $196{\mu}s$와 $212{\mu}s$를 보였다. 또한 후면 재결합속도는 28 cm/s와 24 cm/s를 보였으며, 확산거리는 각각 $750{\mu}m$와 $780{\mu}m$를 보여 ONO 삼중막 구조의 경우에서 보다 우수한 특성을 보였다. 본 실험을 통해 SiNx 단일막보다 ONO 패시베이션 구조에서의 열적안정성이 우수함을 확인하였으며, 또한 ONO 패시베이션 구조는 열적 안정성뿐 아니라 n-type 도핑을 위한 Back To Back (BTB) 도핑 공정 시 후면으로 의 도펀트 침투를 막는 차단 층으로서의 역할도 기대할 수 있다.

• Journal of the Korean Magnetics Society
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• v.14 no.1
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• pp.52-57
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• 2004

In this research, characteristics of air core rectangular spiral type inductors of ㎓ band are numerical analyzed. The basic structure of inductors is a rectangular spiral having 390${\mu}{\textrm}{m}$${\times}$390${\mu}{\textrm}{m}$ size, 5.5 turns, line width of 10 ${\mu}{\textrm}{m}$ and line space of 10 ${\mu}{\textrm}{m}$. Frequency characteristics were simulated up to 10 ㎓. The substrate was modeled as Si, Sapphire, glass and GaAs and the conductor as Cu. The thickness of the conductor was fixed at 2. The number of turns was n.5 to make the input and output terminals to be on the opposite sides. The initial inductance of the basic inductor structure was 13.0 nH, maximum inductance 60.0 nH and resonance frequency 4.25 ㎓. As the dielectric constant of the substrate was increased, the initial inductance varied only slightly, but the resonance frequency decreased considerably. As the number of turns was varied from 1.5 to 9.5, the initial inductance was increased linearly from 2.9 nH to 15.9 nH and, then, saturated at 16.9 nH. The Q factor increased only slightly. The line width and line space of inductors were varied from 5 ${\mu}{\textrm}{m}$ to 20 ${\mu}{\textrm}{m}$, which resulted in the decrease of the initial and maximum inductances. But the resonance frequency was increased. Q factor displayed an increase and a decrease, respectively, when the line width and line space were increased.

• Proceedings of the KIEE Conference
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• 1989.07a
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• pp.662-666
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• 1989

Pure mono Silane(Purity: 99.99%) was used as a thin film source and [$SiH_4$ + $H_2$ (5%)] + [$PH_3$ + $H_2$(0.05%)] mixed dilute gas was used for p-n junction diode. The substrate was P-type silicon wafer (p=$3{\Omega}$ cm) with the direction (100). The crystalline qualities of deposited thin film were investigated by the X-ray diffraction, RHEED and TED patterns and the voltampere characteristics of p-n junction diode was identified by I-V curve.

• Proceedings of the Korean Vacuum Society Conference
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• 2016.02a
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• pp.406-406
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• 2016

To get high efficiency n-type crystalline silicon solar cells, passivation is one of the key factor. Tunnel oxide (SiO2) reduce surface recombination as a passivation layer and it does not constrict the majority carrier flow. In this work, the passivation quality enhanced by different chemical solution such as HNO3, H2SO4:H2O2 and DI-water to make thin tunnel oxide layer on n-type crystalline silicon wafer and changes of characteristics by subsequent annealing process and firing process after phosphorus doped amorphous silicon (a-Si:H) deposition. The tunneling of carrier through oxide layer is checked through I-V measurement when the voltage is from -1 V to 1 V and interface state density also be calculated about $1{\times}1012cm-2eV-1$ using MIS (Metal-Insulator-Semiconductor) structure . Tunnel oxide produced by 68 wt% HNO3 for 5 min on $100^{\circ}C$, H2SO4:H2O2 for 5 min on $100^{\circ}C$ and DI-water for 60 min on $95^{\circ}C$. The oxide layer is measured thickness about 1.4~2.2 nm by spectral ellipsometry (SE) and properties as passivation layer by QSSPC (Quasi-Steady-state Photo Conductance). Tunnel oxide layer is capped with phosphorus doped amorphous silicon on both sides and additional annealing process improve lifetime from $3.25{\mu}s$ to $397{\mu}s$ and implied Voc from 544 mV to 690 mV after P-doped a-Si deposition, respectively. It will be expected that amorphous silicon is changed to poly silicon phase. Furthermore, lifetime and implied Voc were recovered by forming gas annealing (FGA) after firing process from $192{\mu}s$ to $786{\mu}s$. It is shown that the tunnel oxide layer is thermally stable.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.06a
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• pp.367-367
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• 2008

Aluminum nitride (AlN) thin films have been deposited on Si substrate by using reactive RF magnetron sputtering method in a gas mixture of Ar and $N_2$ at different $N_2$ concentration. It was found that $N_2$ concentration was varied in the range up to 20-100%, highly c-axis oriented film can be obtained at 50% $N_2$ with full width at half maximum (FWHM) $4.5^{\circ}$. Decrease in surface roughness from 7.5 nm to 4.6 nm found to be associated with decrease in grain size, with $N_2$ concentration; however, the AlN film fabricated at 20% $N_2$ exhibited a granular type of structure with non-uniform grains. The absorption peak was observed around 675 $cm^{-1}$ in fourier transform infrared spectroscopy (FTIR). It is concluded that the AlN film deposited at $N_2$ concentration of 50% exhibited the most desirable properties for the application of high-frequency surface acoustic devices.

• Applied Chemistry for Engineering
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• v.5 no.4
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• pp.714-721
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• 1994

Titanium and zirconium-containing MFI type zeolites have been prepared hydrothermally. Incorporation of titanium or zirconium into the framework of zeolite has been demonstrated by XRD, FT-IR, $^{29}Si$ MAS NMR analysis, and the catalytic benzene hydroxylation or n-hexane oxidation was used for checking the properties of catalysts. Pure titania and zirconia powder showed no catalytic activity at all for these reactions but Ti and Zr modified zeolite had the high activities in both reactions. The catalytic activity strongly depended on the kind of solvents, and the conversion of benzene or n-hexane increased with the increasing content of Ti and Zr in zeolites.

• Journal of Applied Biological Chemistry
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• v.59 no.2
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• pp.91-94
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• 2016

The fruits of Morus alba L. were extracted with 80 % aqueous MeOH, and the concentrated extract was partitioned into EtOAc, n-butyl alcohol, and water fractions. The repeated silica gel ($SiO_2$) and octadecyl silica gel column chromatographies for the EtOAc and n-butyl alcohol fractions led to isolation of two phenolic compounds. The chemical structures of the compounds were determined as Diels-Alder type adducts, mulberrofuran E (1) and chalcomoracin (2) based on spectroscopic data analyses including nuclear magnetic resonance, mass spectrometry, and infrared spectrometry. Compounds 1 and 2 were isolated for the first time from the fruits of M. alba L. in this study.