Microstructure and Critical Current Density of $Nb_3$ Sn wire processed by Internal Tin Method
(내부확산법으로 제조한 $Nb_3$ Sn선재의 미세조직 및 임계전류밀도특성)
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- Journal of the Korean Institute of Electrical and Electronic Material Engineers
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- v.11 no.11
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- pp.1022-1026
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- 1998