• 제목/요약/키워드: memory retention

검색결과 258건 처리시간 0.023초

감성이 시각적 이미지의 색감기억에 미치는 영향 (Effects of Emotion on Color Vividness of Visual Memory)

  • 장필식
    • 대한인간공학회지
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    • 제30권1호
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    • pp.221-227
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    • 2011
  • Objective: The aim of this study is to investigate the quantitative effects of various emotions and retention periods on the color vividness of visual memory. Background: Although numerous studies have focused on the effects of emotions on memory such as visual detail and vividness of emotional events compared to neutral events, the relationship between emotion and visual memory is ambiguous yet. Furthermore, there were few studies on the effect of emotion on vividness of visual memory. Method: A total of 68 subjects were participated in serial experiments proceed on online and the experiments had two phases: recognition phase and reproduction phase. The 15 photographs were used as visual stimuli and all experiments were conducted over the internet(experiment website) and the results were collected on the web database. Results: The retention period, sleep-arousal emotion and subjective saturation of visual stimuli had a significant effect on the color vividness of visual memory. Conclusion: The results suggested that the color of visual stimulus might be more vividly remembered when it is arousing, the subjective saturation is higher and the retention period is longer. Application: The findings of this study may help clarify the relationship between human emotions and visual memory.

Simulation and Modelling of the Write/Erase Kinetics and the Retention Time of Single Electron Memory at Room Temperature

  • Boubaker, Aimen;Sghaier, Nabil;Souifi, Abdelkader;Kalboussi, Adel
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제10권2호
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    • pp.143-151
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    • 2010
  • In this work, we propose a single electron memory 'SEM' design which consist of two key blocs: A memory bloc, with a voltage source $V_{Mem}$, a pure capacitor connected to a tunnel junction through a metallic memory node coupled to the second bloc which is a Single Electron Transistor "SET" through a coupling capacitance. The "SET" detects the potential variation of the memory node by the injection of electrons one by one in which the drainsource current is presented during the memory charge and discharge phases. We verify the design of the SET/SEM cell by the SIMON tool. Finally, we have developed a MAPLE code to predict the retention time and nonvolatility of various SEM structures with a wide operating temperature range.

비휘발성 MNOS기억소자의 기억 및 유지특성 (Write-in and Retention Characteristics of Nonvolatile MNOS Memory Devices)

  • 이형옥;강창수;이상배;서광열
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1991년도 추계학술대회 논문집
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    • pp.44-47
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    • 1991
  • Electron injection and memory retention chracteristics of the MNOS devices with thin oxide layer of 23${\AA}$ thick and silicon nitride layer of 1000${\AA}$ thick which are fabricated for this experiment. As a result, pulse amplitude increase oxide current is dominated in linearly increasing region of $\Delta$V$\_$FB/the decreasing region after saturation was due to the increased silicon nirtide current. In low pulse ampiltude $\Delta$V$\_$FB/ is not variated on temperature, but as temperature and pulse amplitude increase. $\Delta$V$\_$FB/ is decreased after saturation. And the decay rate during 10$^4$sec after electron injection was ohiefly dominated by the back tunneling of emission from memory trap to silicon. Memory retention characteristics in V$\_$FB/ stage was better than that of OV retention regardless of injection conditions.

데이터 망각을 활용한 비휘발성 메모리 기반 파일 캐시 관리 기법 (Forgetting based File Cache Management Scheme for Non-Volatile Memory)

  • 강동우;최종무
    • 정보과학회 논문지
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    • 제42권8호
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    • pp.972-978
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    • 2015
  • 비휘발성 메모리는 바이트 단위 접근과 비휘발성을 지원한다. 이러한 특성들은 비휘발성 메모리를 캐시, 메모리, 디스크와 같은 메모리 계층 구조 가운데 하나의 영역으로 사용을 가능케 한다. 비휘발성 메모리의 흥미로운 특성은 데이터 보존 기간이 실제로는 제한적인 기간을 가지고 있다는 것이다. 게다가 데이터 보존 기간과 쓰기 지연간의 트레이드오프가 존재 한다. 본 논문에서는 이를 활용하여 비휘발성 메모리를 파일 캐시로 사용하는 새로운 관리 기법을 제안한다. 제안하는 기법은 기존의 캐시 관리 기법과는 반대로 짧은 데이터 보존 시간으로 데이터를 저장하고 쓰기 성능을 개선한다. 제안하는 기법은 LRU 대비 평균 접근 지연 시간을 최대 31%, 평균 24.4%로 감소시킴을 보인다.

탐구 중심 판토마임 교수에서 곱셈 개념의 기억의 보존 (Memory retention of mathematical concepts in multiplication in the inquiry-based pantomime instruction)

  • 배종수;박도영;박만구
    • 대한수학교육학회지:학교수학
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    • 제9권4호
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    • pp.507-521
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    • 2007
  • 본 연구는 초등학교에서의 탐구 중심 펜토마임 접근법을 이용할 때 곱셈의 개념에 대한 학생들의 기억의 보존에 관하여 조사를 하였다. 사전시험을 실시한 후 전통적으로 지도한 반과 펜토마임 접근법으로 지도한 반을 3개월 후에 어떻게 달라졌는지 알아보았다. 이 연구 결과 펜토마임 접근 방법을 사용한 반이 전통적인지도 방법을 이용한 반보다 곱셈의 개념을 보다 더 잘 기억하였고 수량적/기하적 설명을 하는데 있어서는 전통적인 지도 방법을 이용한 반과 비슷하였다. 이 연구는 특별히 초등학교 수준에서 탐구 지향적인 교수법과 같은 다양한 교수 전략을 사용할 때 수학적 개념의 이해의 유지에 어떤 영향을 주는지에 대한 시사점을 제공하였다.

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Robustness of Differentiable Neural Computer Using Limited Retention Vector-based Memory Deallocation in Language Model

  • Lee, Donghyun;Park, Hosung;Seo, Soonshin;Son, Hyunsoo;Kim, Gyujin;Kim, Ji-Hwan
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • 제15권3호
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    • pp.837-852
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    • 2021
  • Recurrent neural network (RNN) architectures have been used for language modeling (LM) tasks that require learning long-range word or character sequences. However, the RNN architecture is still suffered from unstable gradients on long-range sequences. To address the issue of long-range sequences, an attention mechanism has been used, showing state-of-the-art (SOTA) performance in all LM tasks. A differentiable neural computer (DNC) is a deep learning architecture using an attention mechanism. The DNC architecture is a neural network augmented with a content-addressable external memory. However, in the write operation, some information unrelated to the input word remains in memory. Moreover, DNCs have been found to perform poorly with low numbers of weight parameters. Therefore, we propose a robust memory deallocation method using a limited retention vector. The limited retention vector determines whether the network increases or decreases its usage of information in external memory according to a threshold. We experimentally evaluate the robustness of a DNC implementing the proposed approach according to the size of the controller and external memory on the enwik8 LM task. When we decreased the number of weight parameters by 32.47%, the proposed DNC showed a low bits-per-character (BPC) degradation of 4.30%, demonstrating the effectiveness of our approach in language modeling tasks.

Integration Process and Reliability for $SrBi_2$ $Ta_2O_9$-based Ferroelectric Memories

  • Yang, B.;Lee, S.S.;Kang, Y.M.;Noh, K.H.;Hong, S.K.;Oh, S.H.;Kang, E.Y.;Lee, S.W.;Kim, J.G.;Shu, C.W.;Seong, J.W.;Lee, C.G.;Kang, N.S.;Park, Y.J.
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제1권3호
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    • pp.141-157
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    • 2001
  • Highly reliable packaged 64kbit ferroelectric memories with $0.8{\;}\mu\textrm{m}$ CMOS ensuring ten-year retention and imprint at 125^{\circ}C$ have been successfully developed. These superior reliabilities have resulted from steady integration schemes free from the degradation, due to layer stress and attacks of process impurities. The resent results of research and development for ferroelectric memories at Hynix Semiconductor Inc. are summarized in this invited paper.

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파지기간에 따른 모니터 화면상 광각이미지의 경계축소현상 (Boundary Contraction for Wide-Angle Images on Monitor Screen: An Effect of Retention Interval)

  • 장필식
    • 한국컴퓨터정보학회논문지
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    • 제12권4호
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    • pp.61-68
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    • 2007
  • 모니터 화면상에서 광각으로 멀리보이는 이미지에 대한 기억왜곡현상을 고찰하기 위해 피실험자 170명을 대상으로 두 개의 실험이 실시되었다. 기억 파지기간을 세 가지(즉시, 1시간, 24시간)로 나누고, 시각기억에 대한 재생실험과 재인실험을 실시하였다. 재생실험 결과, 파지기간에 상관없이 피실험자들은 원본이미지보다 전경과 배경을 더 크게 확대 하여 표현하였다. 재인실험결과 파지기간이 1시간과 48시간인 경우에 피실험자들은 원본과 동일한 이미지에 대해 더 광각으로 멀리 촬영된 것으로 인식하였다. 이 결과들은 광각이미지의 시각적 기억, 회상에 경계축소현상이 나타난다는 것을 확인시켜주며, 기존 연구들의 주장과는 달리 경계확장이 일관성 있으며 단방향적으로만 일어나는 현상이 아니라는 것을 보여준다. 또한 연구결과는 경계축소현상을 기억스키마 가설로 설명하는 것이 타당함을 보여준다.

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Charge Spreading Effect of Stored Charge on Retention Characteristics in SONOS NAND Flash Memory Devices

  • Kim, Seong-Hyeon;Yang, Seung-Dong;Kim, Jin-Seop;Jeong, Jun-Kyo;Lee, Hi-Deok;Lee, Ga-Won
    • Transactions on Electrical and Electronic Materials
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    • 제16권4호
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    • pp.183-186
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    • 2015
  • This research investigates the impact of charge spreading on the data retention of three-dimensional (3D) silicon-oxide-nitride-oxide-silicon (SONOS) flash memory where the charge trapping layer is shared along the cell string. In order to do so, this study conducts an electrical analysis of the planar SONOS test pattern where the silicon nitride charge storage layer is not isolated but extends beyond the gate electrode. Experimental results from the test pattern show larger retention loss in the devices with extended storage layers compared to isolated devices. This retention degradation is thought to be the result of an additional charge spreading through the extended silicon nitride layer along the width of the memory cell, which should be improved for the successful 3-D application of SONOS flash devices.