• Title/Summary/Keyword: low current

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Arc Fault Circuit Interruption Design

  • Kang, C.S.
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 2006.05a
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    • pp.384-386
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    • 2006
  • In this paper, arc current controller is designed for the interruption of arc fault current which is occurred in the low voltage network. Arc in electrical network have the characteristics of low current, high impedance and high frequency. Conventional controller does not have the arc current interrupt function. Hence, arc current controller is designed for the interruption of arc fault current.

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Tunneling Current Calculation in HgCdTe Photodiode (HgCdTe 광 다이오드의 터널링 전류 계산)

  • 박장우;곽계달
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.29A no.9
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    • pp.56-64
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    • 1992
  • Because of a small bandgap energy, a high doping density, and a low operating temperature, the dark current in HgCdTe photodiode is almost composed of a tunneling current. The tunneling current is devided into an indirect tunneling current via traps and a band-to-band direct tunneling current. The indirect tunneling current dominates the dark current for a relatively high temperature and a low reverse bias and forward bias. For a low temperature and a high reverse bias the direct tunneling current dominates. In this paper, to verify the tunneling currents in HgCdTe photodiode, the new tunneling-recombination equation via trap is introduced and tunneling-recombination current is calculated. The new tunneling-recombination equation via trap have the same form as SRH (Shockley-Read-Hall) generation-recombination equation and the tunneling effect is included in recombination times in this equation. Chakrabory and Biswas's equation being introduced, band to band direct tunneling current are calculated. By using these equations, HgCdTe (mole fraction, 0.29 and 0.222) photodiodes are analyzed. Then the temperature dependence of the tunneling-recombination current via trap and band to band direct tunneling current are shown and it can be known what is dominant current according to the applied bias at athe special temperature.

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Design of Fuse Elements of Current Sensing Type Protection Device for Portable Secondary Battery Protection System (휴대용 이차전지 보호 시스템용 전류 감지 동작형 보호소자의 퓨즈 가용체 설계)

  • Kang, Chang-Yong;Kim, Eun-Min
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.67 no.12
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    • pp.1619-1625
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    • 2018
  • Portable electronic devices secondary batteries can cause fire and explosion due to micro-current change in addition to the situation of short-circuit inrush current, safety can not be secured with a general operation limited current fuse. Therefore, in secondary battery, it is necessary for the protector to satisfy both the limit current type operation in the open-short-circuit inrush current and the current detection operation characteristic in the micro current change situation and for this operation, a fuse for the current detection type secondary battery protection circuit can be applied. The purpose of this study is to design a protection device that operates stably in the hazardous situation of small capacity secondary battery for portable electronic devices through the design of low melting fuse elements alloy of sensing type fuse and secures stability in abnormal current state. As a result of the experiment, I-T and V-T operation characteristics are satisfied in a the design of the alloy of the current sensing type self-contained low melting point fuse and the resistance of the heating resistor. It is confirmed that it can prevent accidents of short circuit over-current and micro current change of secondary battery.

The Characteristics of LLLC in Ultra Thin Silicon Oxides (실리콘 산화막에서 저레벨누설전류 특성)

  • Kang, C.S.
    • Journal of the Institute of Electronics and Information Engineers
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    • v.50 no.8
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    • pp.285-291
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    • 2013
  • In this paper, MOS-Capacitor and MOSFET devices with a Low Level Leakage Current of oxide thickness, channel width and length respectively were to investigate the reliability characterizations mechanism of ultra thin gate oxide films. These stress induced leakage current means leakage current caused by stress voltage. The low level leakage current in stress and transient current of thin silicon oxide films during and after low voltage has been studied from strss bias condition respectively. The stress channel currents through an oxide measured during application of constant gate voltage and the transient channel currents through the oxide measured after application of constant gate voltage. The study have been the determination of the physical processes taking place in the oxides during the low level leakage current in stress and transient current by stress bias and the use of the knowledge of the physical processes for driving operation reliability.

Evaluation of Low Power and High Speed CMOS Current Comparators

  • Rahman, Labonnah Farzana;Reaz, Mamun Bin Ibne;Marufuzzaman, Mohammad;Mashur, Mujahidun Bin;Badal, Md. Torikul Islam
    • Transactions on Electrical and Electronic Materials
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    • v.17 no.6
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    • pp.317-328
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    • 2016
  • Over the past few decades, CMOS current comparators have been used in a wide range of applications, including analogue circuits, MVL (multiple-valued logic) circuits, and various electronic products. A current comparator is generally used in an ADC (analog-to-digital) converter of sensors and similar devices, and several techniques and approaches have been implemented to design the current comparator to improve performance. To this end, this paper presents a bibliographical survey of recently-published research on different current comparator topologies for low-power and high-speed applications. Moreover, several aspects of the CMOS current comparator are discussed regarding the design implementation, parameters, and performance comparison in terms of the power dissipation and operational speed. This review will serve as a comparative study and reference for researchers working on CMOS current comparators in low-power and high-speed applications.

Introduction to Industrial Applications of Low Power Design Methodologies

  • Kim, Hyung-Ock;Lee, Bong-Hyun;Choi, Jung-Yon;Won, Hyo-Sig;Choi, Kyu-Myung;Kim, Hyun-Woo;Lee, Seung-Chul;Hwang, Seung-Ho
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.9 no.4
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    • pp.240-248
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    • 2009
  • Moore's law has driven silicon technology scale down aggressively, and it results in significant increase of leakage current on nano-meter scale CMOS. Especially, in mobile devices, leakage current has been one of designers' main concerns, and thus many studies have introduced low power methodologies. However, there are few studies to minimize implementation cost in the mixed use of the methodologies to the best of our knowledge. In this paper, we introduce industrial applications of low power design methodologies for the decrease of leakage current. We focus on the design cost reduction of power gating and reverse body bias when used together. Also, we present voltage scale as an alternative to reverse body bias. To sustain gate leakage current, we discuss the adoption of high-$\kappa$ metal gate, which cuts gate leakage current by a factor of 10 in 32 nm CMOS technology. A 45 nm mobile SoC is shown as the case study of the mixed use of low power methodologies.

Analog-Digital Switching Mixed Mode Low Ripple - High Efficiency Li-Ion Battery Charger (아날로그 - 디지털 스위칭 혼합형 저 리플- 고 효율 Li-Ion 배터리 충전기)

  • Jung, Sang-Hwa;Woo, Young-Jin;Kim, Nam-In;Cho, Gyu-Hyeong
    • Proceedings of the KIEE Conference
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    • 2001.07d
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    • pp.2531-2533
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    • 2001
  • This paper describes a low noise and high efficiency analog-digital switching mixed mode battery charger for production facilities of Li-Ion batteries. The requirements for battery chargers for production facilities are very strict. The accuracy of output voltage and output current should be below 0.1% with very low ripple current. Therefore analog type linear regulators are widely used for battery charger in spite of their inefficiency and bulkiness. We combined linear regulator as a voltage source with digital switching converter as a dependent current source. Low current ripple and high accuracy are obtained by linear regulator while high efficiency is achieved by digital switching converter. Experimental results show that proposed method has 0.1% ripple and 90% efficiency at an output current of 1A for a battery voltage of 4V.

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A Minimization Study of Consuming Current and Torque Ripple of Low Voltage BLDC Motor (저전압용 BLDC 전동기의 소비전류 및 토크리플 최소화 연구)

  • Kim, Han-Deul;Shin, Pan Seok
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.66 no.12
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    • pp.1721-1724
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    • 2017
  • This paper presents a numerical optimization technique to reduce input current and torque ripple of the low voltage BLDC motor using core, coil and switching angle optimization. The optimization technique is employed using the generalized response surface method(RSM) and sampling minimization technique with FEM. A 50W 24V BLDC motor is used to verify the proposed algorithm. As optimizing results, the input current is reduced from 2.46 to 2.11[A], and the input power is reduced from 59 [W] to 51 [W] at the speed of 1000 [rpm]. Also, applied the same optimization algorithm, the torque ripple is reduced about 7.4 %. It is confirmed that the proposed technique is a reasonably useful tool to reduce the consuming current and torque ripple of the low voltage BLDC motor for a compact and efficient design.

Sampler Model of P-type Current Mode Control Utilizing Low Pass Filter (저역 통과 필터를 사용하는 P-type 전류모드제어의 샘플러 모델)

  • Jung, Young-Seok
    • The Transactions of the Korean Institute of Power Electronics
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    • v.17 no.5
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    • pp.388-392
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    • 2012
  • In this paper, a sampler model for the P-type current mode control employing low pass filter is proposed. Even though the frequency response of the compensator used in a P-type current mode control employing low pass filter is similar to that of P-type compensator, the sampler model has to be obtained from the method used in PI-type current mode control. In order to show the usefulness of the proposed method, prediction results of the proposed model are compared to those from the circuit level simulator, PSIM.

A Low Voltage Bandgap Current Reference with Low Dependence on Process, Power Supply, and Temperature

  • Cheon, Jimin
    • Journal of Advanced Information Technology and Convergence
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    • v.8 no.2
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    • pp.59-67
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    • 2018
  • The minimum power supply voltage of a typical bandgap current reference (BGCR) is limited by operating temperature and input common mode range (ICMR) of a feedback amplifier. A new BGCR using a bandgap voltage generator (BGVG) is proposed to minimize the effect of temperature, supply voltage, and process variation. The BGVG is designed with proportional to absolute temperature (PTAT) characteristic, and a feedback amplifier is designed with weak-inversion transistors for low voltage operation. It is verified with a $0.18-{\mu}m$ CMOS process with five corners for MOS transistors and three corners for BJTs. The proposed circuit is superior to other reported current references under temperature variation from $-40^{\circ}C$ to $120^{\circ}C$ and power supply variation from 1.2 V to 1.8 V. The total power consumption is $126{\mu}W$ under the conditions that the power supply voltage is 1.2 V, the output current is $10{\mu}A$, and the operating temperature is $20^{\circ}C$.