• 대한의용생체공학회:의공학회지
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• 제27권6호
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• pp.332-336
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• 2006

In this study, we have fabricated a fiber-optic radiation sensor using an organic scintillator for high energy electron beam therapy. The intensities of scintillating light from a fiber-optic radiation sensor are measured with different field size, electron beam energy and monitor unit of a clinical linear accelerator. To obtain percent depth dose(PDD), the amount of scintillating light is measured at different depth of polymethylmethacrylate(PMMA) phantom. Also the intensity of Cerenkov light is measured and characterized as a function of incident angle of electron beam and a subtraction method is investigated using a background optical fiber to remove a Cerenkov light.

• 한국정밀공학회지
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• 제18권11호
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• pp.51-57
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• 2001

A light beam reflected from a machined surface generally containes information concerning about its surface roughness. This study examines and proposes a surface roughness measurement technique for on-machine measurement of machined surfaces. The technique is based on the measurement of a reflected laser beam pattern and the statistical analysis of its light intensity distribution. The surface roughness was found to be closely related to the standard deviation of the light intensity on the primary axis of the reflected pattern. An image acquisition device is made up of a laser diode, a half mirror, a screen, and a CCD camera. The exact image with the primary and secondary axes of a reflected laser beam pattern is calculated through such image processing algorithm as thresholding, edge detection, image rotation, segmentation, etc. A median filter and a surrounding light correction algorithm are improve the image quality and reduce the measuring error. Using the developed measuring device the effect of screen materials and workpiece and workpiece materials was investigated. Experimental results regarding to relatively high-quality surfaces machined by grinding, polishing, lapping processes have shown the measurement error is within 10% in the range of $0.1{mu}m~0.8{\mu}m R_q.$Therefore, the proposed method is thought to be effectively used when quick measurements is needed with workpieces fixed on the machine.

• 한국재료학회지
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• 제23권3호
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• pp.194-198
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• 2013

In this paper, we studied a p-type reflector based on indium tin oxide (ITO) for vertical-type ultraviolet light-emitting diodes (UV LEDs). We investigated the reflectance properties with different deposition methods. An ITO layer with a thickness of 50 nm was deposited by two different methods, sputtering and e-beam evaporation. From the measurement of the optical reflection, we obtained 70% reflectance at a wavelength of 382 nm by means of sputtering, while only 30% reflectance resulted when using the e-beam evaporation method. Also, the light output power of a $1mm{\times}1mm$ vertical chip created with the sputtering method recorded a twofold increase over a chip created with e-beam evaporation method. From the measurement of the root mean square (RMS), we obtained a RMS value 1.3 nm for the ITO layer using the sputtering method, while this value was 5.6 nm for the ITO layer when using the e-beam evaporation method. These decreases in the reflectance and light output power when using the e-beam evaporation method are thought to stem from the rough surface morphology of the ITO layer, which leads to diffused reflection and the absorption of light. However, the turn-on voltage and operation voltage of the two samples showed identical results of 2.42 V and 3.5 V, respectively. Given these results, we conclude that the two ITO layers created by different deposition methods showed no differences in the electric properties of the ohmic contact and series resistance.

• 대한전기학회논문지:시스템및제어부문D
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• 제55권7호
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• pp.313-318
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• 2006

An automatic sample centering system is underway at the protein crystallography beam line of the Pohang Light Source to improve the efficiency of the crystal screening process. A sample pin which contains a protein crystal is mounted on a goniometer head. Then the crystal should be moved to the center of X-ray beam by controlling the motorized goniometer to obtain diffraction data. Since the X-ray beam is located at the center of the image obtained from the CCD camera when the image of the sample pin is in focus, an auto-focusing algorithm is a very important part in the auto-sample-centering system. However the results of applying several well-known auto focusing algorithms directly to the images are not satisfactory owing to the following factors: misalignment of CCD camera, non-uniform cryo-stream in the background of the image and the supporter of the loop. The performance of an auto-focusing algorithm can be increased if the algorithm is applied to only the loop region identified. Non-uniform cryo-stream and a various illumination condition and a stain, which is shown in the image, are main obstacles to loop region identification. In this paper, a simple loop region identification algorithm, which can solve these problems, is proposed and the effective ness of the proposed scheme is shown by applying the auto-focusing algorithm to the loop region identified.

• 전자공학회논문지CI
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• 제38권6호
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• pp.70-81
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• 2001

본 논문에서는 한 개의 카메라와 한 대의 환등기(LCD 환등기 혹은 슬라이드 환등기)를 이용하여 2차원 얼굴 영상으로부터 3차원 얼굴 형상을 모델링하는 방법을 제안한다. 환등기를 이용하여 사람 얼굴에 라이트 빔을 투영하고 이를 조금씩 이동시키며 영상을 획득한 뒤 각 2차원 영상의 지역적 정보와 영상들 사이의 시간적 정보를 함께 이용하여 3차원 형상을 복원하는 방법을 채택하였다. 제안된 방법에서는 특정이 서로 다른 영역들의 효과적인 3차원 좌표 모델링을 위해 영상을 그림자 부분 얼굴 부분 그리고 머리카락 부분으로 나누어 처리하는 지역 분할(region segmentation) 기법을 도입하였고, 2차원 얼굴 영상 획득 시간을 줄이고 고속 3차원 스캔을 위하여 한 영상 안에 다수의 라이트 빔(multiple light beams)을 이용하였다. 또 한 라이트 빔의 경계를 정확하게 검출하기 위하여 라이트 빔 캘리브레이션(light beam calibration) 기법을 제안하여 사용하였다. 실험 결과 제안한 방법을 통해서 머리카락 부분을 포함한 전체 얼굴 영역에서 향상된 3차원 모델링 결과를 얻을 수 있었다.

• 전자공학회논문지
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• 제52권4호
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• pp.156-163
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• 2015

본 논문은 광패턴 조사를 통한 능동형 수위 및 거리 측정 기법을 제안한다. 기존 압력식, 부자식, 초음파식, 레이더식 등의 수위측정기법과 달리 최근에는 수위측정의 정확성과 모니터링 편리성을 강조한 영상기반 수위측정기법이 활용되고 있다. 본 논문에서는 참조용 광패턴을 교각이나 제방 등에 동적으로 조사(照射)하고, 카메라 장치로부터 조사된 광패턴 영상을 실시간 분석 처리하여 자동 수위측정 및 조사(照射) 대상물까지의 거리측정을 위한 새로운 방법을 제시한다. 기존 방법이 교각에 기(旣) 부착된 수위표나 마커 인식을 위해 수동적으로 영상데이터를 분석하는 것이었다면, 본 기법은 교각 설치 환경에 대응하여 능동적으로 참조 광패턴을 생성하여 사용함으로써, 난시야(難視野) 환경 및 잡음 대응에 효과적이고, 포터블 형태로 주야간 이용이 가능하며, 별도 조명 설치를 요구하지 않는 등의 강건한 수위 측정을 지원한다. 본 실험은 실내 시험 환경을 구성하여 시뮬레이션 하였으며, 0.4-1.4m 거리 13.5-32.5cm 높이에서 수위 및 거리 측정을 수행하였다.

• 조명전기설비학회논문지
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• 제20권9호
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• pp.1-10
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• 2006

In this paper, a new high resolution XGA-SLM is implemented through modification of a commercial TFT-LCD beam projector and its optical modulation characteristics as a spatial light modulator(SLM) is also analyzed. First, the optics module, projection lamp and fans are removed from a commercial beam projector and instead some electric circuits to compensate their removal are manufactured and then, by inserting them into the beam projector, a new XGA-SLM is finally implemented. Second, from some optical experimental results, this TFT-SLM is found to have a good optical linearity in amplitude and phase modulation characteristics as a function of the input gray levels. Especially, through implementation of a binary phase-type correlator such as BPEJTC by using the suggested TFT-LCD panel, the implemented SLM is proposed as a new relatively low-cost and high resolution SLM for optical information processing.

• 한국정밀공학회지
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• 제14권6호
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• pp.128-134
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• 1997

Holographic interferometry is a useful whole-field nondestructive tesing method for measuring deformations and vibrations of engineering structure. In practical way most holographic interferometer uses a diverging beam, a point light source. When an oject is relatively small, the optical arrangement using a collimated light source has no difficulty technically but for a large object the collimated beam connot be applied anymore practically. In this paper we calculate the error of measured displacement from the sensi- tivity vector dominated by the geometry of optical arrangement for holographic interferometer and show the result with 2-D plots. A plane surface and a cylindrical surface were chosen as objects to be measured and the results from the cases of a diverging and a collimated beams were compared and analyzed.

• 한국항해항만학회:학술대회논문집
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• 한국항해항만학회 2000년도 추계학술대회논문집
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• pp.36-39
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• 2000

A small electrical potential difference which appears on any solid body when subjected to illumination by a modulated light beam generated by laser is called photocharge voltage(PCV)[1,2]. This voltage is proportional to the induced change in the surface electrical charge and is capacitatively measured on various materials such as conductors, semiconductors, ceramics, dielectrics and biological objects. The amplitude of the detected signal depends on the type of material under investigation, and on the surface properties of the sample. In photocharge voltage spectroscopy measurements[3], the sample is illuminated by both a steady state monochromatic bias light and the pulsed laser. The monochromatic light is used to created a variation in the steady state population of trap levels in the surface and space charge region of semiconductor samples which does result in a change in the measured voltage. Using this technique the spatial variation of PCV can be utilized to evalulate the surface conditions of the sample and the variation of the PCV due to the monochromatic bias light are utilized to charactrize the surface states. A qualitative analysis of the proposed measuremen is present along with experimental results performed on amorphous silicon samples. The deposition temperature was varied in order to obtain samples with different structural, optical and electronic properties and measurements are related to the defect density in amorphous thin film.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 추계학술대회 논문집
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• pp.36-39
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• 2000

A small electrical potential difference which appears on any solid body when subjected to illumination by a modulated light beam generated by laser is called photocharge voltage(PCV)[1,2]. This voltage is proportional to the induced change in the surface electrical charge and is capacitatively measured on various materials such as conductors, semiconductors, ceramics, dielectrics and biological objects. The amplitude of the detected signal depends on the type of material under investigation, and on the surface properties of the sample. In photocharge voltage spectroscopy measurements[3], the sample is illuminated by both a steady state monochromatic bias light and the pulsed laser. The monochromatic light is used to created a variation in the steady state population of trap levels in the surface and space charge region of semiconductor samples which does result in a change in the measured voltage. Using this technique the spatial variation of PCV can be utilized to evaluate the surface conditions of the sample and the variation of the PCV due to the monochromatic bias light are utilized to characterize the surface states. A qualitative analysis of the proposed measurement is present along with experimental results performed on amorphous silicon samples. The deposition temperature was varied in order to obtain samples with different structural, optical and electronic properties and measurements are related to the defect density in amorphous thin film.