• 제목/요약/키워드: interface edge crack

검색결과 40건 처리시간 0.023초

적층복합재의 자유단 박리에 대한 모드별 스트레인 에너지해방률의 간이계산법 (A Simplified Method for Determining Modal Strain Energy Release Rate of Free-Edge Delaminations in Laminated Composite)

  • 김택현;오택열;김인권
    • 대한기계학회논문집A
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    • 제21권3호
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    • pp.423-429
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    • 1997
  • A simplified method for determining the mode components of the strain energy release rate of free-edge delaminations in laminated composite is proposed. The interlaminar stresses are evaluated as an interface moment and interface shear forces that are obtained from the equilibrium equations at the interface between the adjacent layers. Deformation of an edge-delaminated laminate is calculated by using a generalized quasi-three dimensional classical laminated plate theory developed by the authors. The analysis provides closed-form expression for the three components of the strain energy release rate. Comparison of results with a finite element solution using the virtual crack closure technique shows good agreement. In the present study, laminated composite with stacking sequences of [30/-30/90]$_{s}$ were examined. The simple nature of the method makes it suitable for primary design analysis for the delaminations of laminated composite.e.

A 2-D four-noded finite element containing a singularity of order λ

  • Abdel Wahab, M.M.;de Roeck, G.
    • Structural Engineering and Mechanics
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    • 제3권4호
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    • pp.383-390
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    • 1995
  • A 2-D four-noded finite element which contains a ${\lambda}$ singularity is developed. The new element is compatible with quadratic standard isoparametric elements. The element is tested on two different examples. In the first example, an edge crack problem is analyzed using two different meshes and different integration orders. The second example is a crack perpendicular to the interface problem which is solved for different material properties and in turn different singularity order ${\lambda}$. The results of those examples illustrate the efficiency of the proposed element.

반도체 패키지의 층간박리 파괴역학인자 해석 및 균열진전경로 예측 (Analyses of Fracture Parameters and Prediction of Crack Propagation Path on Delamination in the LSI Package)

  • 정남용;박철희
    • 한국생산제조학회지
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    • 제18권4호
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    • pp.401-409
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    • 2009
  • This paper presents a method of calculating the stress intensity factor (K) and crack propagation direction (${\theta}_0$) at the crack-tip that is associated with delamination in the large scale integration(LSI) package. To establish a reasonable strength evaluation method and life prediction, it is necessary to assess fracture parameters under various fracture conditions. Therefore, we conducted quantitative stress singularity analysis considering thermal stress simulating the changes of crack length (a), (h) and (v) in delamination using the 2-dimensional elastic boundary element method (BEM), and from these results predicted crack propagation direction and path.

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경계요소법에 의한 반도체 패키지의 균열진전경로 예측 (Prediction of crack propagation path in IC package by BEM)

  • 송춘호;정남용
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2001년도 춘계학술대회논문집A
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    • pp.286-291
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    • 2001
  • Applications of bonded dissimilar materials such as IC package, ceramic/metal and resin/metal bonded joints, are very increasing in various industry fields. It is very important to analyze the thermal stress and stress singularity at interface edges in bonded joints of dissimilar materials. In orer to understand the package crack emanating from the edge of Die pad and Resin, fracture mechanics of bonded dissimilar materials and material properties are obtained. In this paper, the thermal stress and its singularity index for the IC package were analyzed using 2-dimensional elastic boundary element method. Crack propagation angle and path by thermal stress were numerically simulated with boundary element method.

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Interfacial Crack Propagation Under Various Mode-Mixes

  • Park, Byung-Sun;Chai, Young-Suck
    • Journal of Mechanical Science and Technology
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    • 제16권1호
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    • pp.39-45
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    • 2002
  • Initiation and propagation of interfacial crack along bimaterial interface are considered in this study. A biaxial loading device for a single specimen is used for obtaining a wide range of mode-mixities. The specimen is an edge-cracked bimaterial strip of glass and epoxy; the biaxial loading device, being capable of controlling displacements in two perpendicular directions, is developed. A series of interfacial crack initiation and Propagation experiments are conducted using the biaxial loading device for various mixed modes. Normal crack opening displacement (NCOD) is measured near crack front by a crack opening interferometry and used for extracting fracture parameters. From mixed mode interfacial crack initiation experiments, large increase in toughness with shear components is observed. The behavior of interfacial crack propagation analyzed as a function of mode-mix shows that initial crack propagation is delayed with increase of mode-mixity, and its velocity is increased with positive mode-mixity but decreased with negative case. However, it is found that crack propagation is less accelerated with positive mode-mixity than the negative mode-mixity, which may be caused by contact and/or effects of friction between far field and near-tip Held along the interfacial crack.

Multiple unequal cracks between an FGM orthotropic layer and an orthotropic substrate under mixed mode concentrated loads

  • M. Hassani;M.M. Monfared;A. Salarvand
    • Structural Engineering and Mechanics
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    • 제86권4호
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    • pp.535-546
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    • 2023
  • In the present paper, multiple interface cracks between a functionally graded orthotropic coating and an orthotropic half-plane substrate under concentrated loading are considered by means of the distribution dislocation technique (DDT). With the use of integration of Fourier transform the problem is reduced to a system of Cauchy-type singular integral equations which are solved numerically to compute the dislocation density on the surfaces of the cracks. The distribution dislocation is a powerful method to calculate accurate solutions to plane crack problems, especially this method is very good to find SIFs for multiple unequal cracks located at the interface. Hence this technique allows considering any number of interface cracks. The primary objective of this paper is to investigate the effects of the interaction of multiple interface cracks, load location, material orthotropy, nonhomogeneity parameters and geometry parameters on the modes I and II SIFs. Numerical results show that modes I/II SIFs decrease with increasing the nonhomogeneity parameter and the highest magnitude of SIF occurs where distances between the load location and crack tips are minimal.

경계요소법을 이용한 응력세기계수의 해석법 (Analysis of Stress Intensity Factor Using Boundary Element Method)

  • 조희찬;김희송
    • 한국자동차공학회논문집
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    • 제1권2호
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    • pp.117-124
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    • 1993
  • This study is concerned with an application of the boundary element method on the crack problem. The stable and efficient analysis method of two dimensional elastostatic stress intensity factor on the mode I deformations is established from the result o stress analysis for the center cracked plates. In order to precisely analyse, The subelements of quadratic element, singular elements on the crack tip and interface and division into regions are applied to elastic stress. The usefulness of the method has been tested with a center cracked plates, a double edge cracked plate and a single edge cracked plate, and the results have turned out to be fairly satisfactory.

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반도체 패키지의 칩셋과 다른 설계변수와의 연관성 평가 (Estimate on related to Chip Set and the other Various Parameter in Electronic Plastic Package)

  • 권용수
    • 한국산업융합학회 논문집
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    • 제2권2호
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    • pp.131-137
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    • 1999
  • Package crack caused by the soldering process in the surface mounting plastic package is evaluated by applying the energy release rate criterion. The package crack formation depend on various parameters such as chip set, chip size, package thickness, package width, material properties and the moisture content etc. The effects of chip set and the other parameters were estimated during the analysis of package cracks which were located in the edge of the upper interface of the chip and the lower interlace of the die pad. From the results, it could be obtained that the more significant parameters to effect the chip set are chip width.

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전단하중하의 반도체 칩 접착계면의 특이응력 해석 (Analysis of Singular Stresses at the Bonding Interface of Semiconductor Chip Subjected to Shear Loading)

  • 이상순
    • 마이크로전자및패키징학회지
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    • 제7권4호
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    • pp.31-35
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    • 2000
  • 반도체 칩과 리드프레임을 접착하고 있는 얇은 접착제층에 전단하중이 가해질 때 발생하는 응력상태를 조사하고 있다. 계면 응력상태를 해석하기 위해서 경계요소법이 사용되고 있다. 선형 탄성이론을 적용하여 해석하면, 강체와 접착제의 계면이 자유 경 계면과 만나는 부분에서 $\gamma^{\lambda=1}$(0<1<1) 형태의 응력 특이성이 존재한다. 이러한 특이성으로 인해, 모서리 균열이나 계면 박리가 발생할 수 있다.

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