• Title/Summary/Keyword: in-circuit test

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Development of Smart ICT-Type Electronic External Short Circuit Tester for Secondary Batteries for Electric Vehicles (전기자동차용 2차전지를 위한 스마트 ICT형 전자식 외부 단락시험기 개발)

  • Jung, Tae-Uk;Shin, Byung-Chul
    • Journal of the Korean Society of Industry Convergence
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    • v.25 no.3
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    • pp.333-340
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    • 2022
  • Recently, the use of large-capacity secondary batteries for electric vehicles is rapidly increasing, and accordingly, the demand for technologies and equipment for battery reliability evaluation is increasing significantly. The existing short circuit test equipment for evaluating the stability of the existing secondary battery consists of relays, MCs, and switches, so when a large current is energized during a short circuit, contact fusion failures occur frequently, resulting in high equipment maintenance and repair costs. There was a disadvantage that repeated testing was impossible. In this paper, we developed an electronic short circuit test device that realizes stable switching operation when a large-capacity power semiconductor switch is energized with a large current, and applied smart ICT technology to this electronic short circuit stability test system to achieve high speed and high precision through communication with the master. It is expected that the inspection history management system based on data measurement, database format and user interface will be utilized as essential inspection process equipment.

Fault detection of logic circuit by use of M-sequence correlation method

  • Miyata, Chikara;Kashiwagi, Hiroshi
    • 제어로봇시스템학회:학술대회논문집
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    • 1993.10b
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    • pp.24-29
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    • 1993
  • In this paper, the estimation of the structure of a logic circuit under test is made from the observation of the input-output correlation function by use of M-sequence, from which we can estimate whether or not any fault exist in the logic circuit. Especially, investigation was made in case of the 2_stage logic circuit. We checked theoretically the sequence of correlation function, and we have shown that the correlation function is a function of period of M-sequence only, land the appearing number of correlation function in a period is a constant value depending on the logic circuit only. And by computer simulations we have shown that the structure of the circuit under test can be estimated from the observation of sequence of correlation function.

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Analysis and Alternative Circuit Design of Pneumatic Circuit for An Automotive Air Suspension (자동차 공기현가 공압회로 해석 및 대체회로 설계)

  • Lee, J.C.
    • Transactions of The Korea Fluid Power Systems Society
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    • v.5 no.4
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    • pp.17-25
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    • 2008
  • This study presents an analytical model of the pneumatic circuit of an air suspension system to analyze the characteristics of vehicle height control. The analytical model was developed through the co-simulation of Simulink(air spring) and HyPneu(pneumatic circuit). Variant effective area of air spring and flow coefficients of pneumatic valves were estimated experimentally prior to the system test, and utilized in simulation. One-comer test apparatus was established using the components of commercial air suspension products. The results of simulation and experiment were so close that the proposed analytical model in this study was validated. However the frictional loss of conduit and heat dissipation which were ignored in this study need to be considered in future study. As an application example of proposed analytical model, an alternative pneumatic circuit of air suspension to conventional WABCO circuit was evaluated. The comparison of simulation results of WABCO circuit and alternative circuit show that proposed analytical model of co-simulation in this study is useful for the study of pneumatic system of automotive air suspension.

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Fabrication and Characteristics of 30〔kVA〕 Superconducting Generator (30(kVA) 초전도발전기 제작 및 특성)

  • ;;;;;;;I. Muta;I. Hoshino
    • Progress in Superconductivity and Cryogenics
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    • v.3 no.2
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    • pp.32-38
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    • 2001
  • A 30[kVA] superconducting generator (SCG) is built and tested at Korea Electrotechnology Research Institute (KERI) in Korea. This superconducting generator has an air-gap winding instead of the typical steel teeth structure. The rotor has 4 field coils of race-track type with NbTi superconducting wired. The rotor is composed of two dampers and a liquid helium composed of two dampers and a liquid helium container in which the field poles reside. The space between the outermost damper and the container is vacuum insulated. A ferrofluid seal is used between the stationary part connected to the couping and the rotor. A helium transfer coupling(HTC) has 3 passages of the recovered heilum gas and a gas flow control system. The open circuit test and sustained short circuit test are preformed to obtain the open circuit characteristics (OCC) and short circuit characteristics (SCC) Also. the test results usder the light load (up to 3.6[kW]) are given. The structure, manufacturing and basis test of the 30[kVA]SCG are discussed.

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Design of a Built-in Current Sensor for Current Testing Method in CMOS VLSI (CMOS 회로의 전류 테스팅를 위한 내장형 전류감지기 설계)

  • 김강철;한석붕
    • Journal of the Korean Institute of Telematics and Electronics B
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    • v.32B no.11
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    • pp.1434-1444
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    • 1995
  • Current test has recently been known to be a promising testing method in CMOS VLSI because conventional voltage test can not make sure of the complete detection of bridging, gate-oxide shorts, stuck-open faults and etc. This paper presents a new BIC(built-in current sensor) for the internal current test in CMOS logic circuit. A single phase clock is used in the BIC to reduce the control circuitry of it and to perform a self- testing for a faulty current. The BIC is designed to detect the faulty current at the end of the clock period, so that it can test the CUT(circuit under test) with much longer critical propagation delay time and larger area than conventional BICs. The circuit is composed of 18 devices and verified by using the SPICE simulator.

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The defect detection circuit of an electronic circuit through impedance change detection that induces a change in S-parameter (S-parameter의 변화를 유도하는 임피던스 변화 감지를 통한 전자회로의 결함검출회로)

  • Seo, Donghwan;Kang, Tae-yeob;Yoo, Jinho;Min, Joonki;Park, Changkun
    • Journal of IKEEE
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    • v.25 no.4
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    • pp.689-696
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    • 2021
  • In this paper, in order to apply Prognostics and Health Management(PHM) to an electronic system or circuit, a circuit capable of detecting and predicting defect characteristics inside the system or circuit is implemented, and the results are described. In the previous study, we demonstrated that the frequency of the amplitude of S-parameter changed as the circuit defect progressed. These characteristics were measured by network analyser. but in this study, even if the same defect detection method is used, a circuit is proposed to check the progress of the defect, the remaining time, and the occurrence of the defect without large measurement devices. The circuit is designed to detect the change in impedance that generates changes of S-parameter, and it is verified through simulation using the measurement results of Bond-wires.

Dead Operation Characteristics of Earth Leakage Circuit Breaker Caused by Impulse Voltages (임펄스전압에 대한 누전차단기의 부동작 특성)

  • Lee, Bok-Hee;Chang, Sug-Hun;Lee, Seung-Chil
    • Proceedings of the KIEE Conference
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    • 1997.07e
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    • pp.1715-1717
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    • 1997
  • This paper deals with the dead operation characteristics of the earth leakage circuit breaker(ELB) caused by impulse voltages. The surge protective devices for electronic circuit and AC power lines are becoming more widely used. It is possible to give rise to the malfunction of ELB due to the operation of surge protective devices, and the interruption of AC power lines brings about several disadvantages such as low reliability of electronic and informational systems, economical loss, and etc. The dead operation characteristics of the ELB from impulse voltages were measured under the conditions of KS C 4613 and the test circuit with a varistor. As a result, the peak current value of the zero-phase sequence circuit of the ELB is increased as the surge voltage and stray capacitance increase. All of the ELBs used in this work were satisfied with the lightning impulse dead operation test condition defined in KS C 4613. However one specimen only did not cause dead operation in the condition of the test circuit with a varistor. There is high possibility that a large portion of the ELBs connected with the AC power lines having the surge protective devices bring about the dead operation.

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Artificial line for short-line fault test (근거리선로고장전류 차단시험용 Artificial line)

  • Park, Seung-Jae;Rhyou, Hyeong-Kee;Kang, Young-Sik;Koh, Heui-Seog
    • Proceedings of the KIEE Conference
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    • 2001.07c
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    • pp.1783-1785
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    • 2001
  • With the 4-MJ synthetic testing facilities completed, KERI can perform the circuit breaker testing up to 420 kV, 50 kA ratings. The short-line fault test is one of the necessary test items which are required for the circuit breaker, and in order to perform the short-line fault test KERI(Korea Electrotechnology Institute) has used the "new artificial line" which has small dimension and is easy to generate the saw-tooth wave. This paper describes the following items of the new artificial line. -Description of 4-kinds of artificial lines and determination of the circuit parameter of artificial line. -TRV characteristics of saw-tooth waves for each circuit. -KERI's artificial line.

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Short-term Run and Short-circuit Test of 6.6㎸/200A DC reactor Type Superconducting Fault Current Limiter (6.6㎸/200A급 DC 리액터헝 초전도한류기의 단시간운전 및 단락시험)

  • 안민철;이승제;강형구;배덕권;윤용수;고태국
    • Proceedings of the Korea Institute of Applied Superconductivity and Cryogenics Conference
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    • 2003.10a
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    • pp.10-13
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    • 2003
  • 6.6㎸rms/200Arms DC reactor type superconducting fault current limiter (SFCL) has been developed. This paper deals with the manufacture and short-circuit test of the SFCL. DC reactor was the HTS solenoid coil whose inductance was 84mH. AC/DC power converter was performed as the dual-mode operation. The short-term run(1 sec) and short-circuit test of this SFCL was performed successfully. The experimental results have a similar tendency to the simulation results. In short-circuit test, at 2 cycles after the fault, fault current limitation rate was about 30%.

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Design of Built-In Self Test Circuit (내장 자가 검사 회로의 설계)

  • 김규철;노규철
    • Proceedings of the IEEK Conference
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    • 1999.06a
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    • pp.723-728
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    • 1999
  • In this paper, we designed a Circular Path Built-In Self Test circuit and embedded it into a simple 8-bit microprocessor. Register cells of the microprocessor have been modified into Circular Path register cells and each register cells have been connected to form a scan chain. A BIST controller has been designed for controlling BIST operations and its operation has been verified through simulation. The BIST circuit described in this paper has increased size overhead of the microprocessor by 29.8% and delay time in the longest delay path from clock input to output by 2.9㎱.

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