• Proceedings of the KIEE Conference
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• 2006.07e
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• pp.61-62
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• 2006

Since the starting reactor used for reducing inrush current of high voltage induction motor applies an electric current only when it is at the stage of transition, it gets lots of electrical or mechanical stress. In this aspect, the reliability on the starting reactor is very important because the reactor-relating-accident takes 80% of all the accident concerned with high voltage motor starting panel. In this study, we conducted an insulation test of starting reactor of high voltage induction motor of intake pumping station to the Seoul area And the result from this study was used as data for determining whether it's still usable or not.

• Journal of Electrical Engineering and Technology
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• v.1 no.4
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• pp.496-502
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• 2006

In this paper, we studied the development of the electronic ballast for 250W MH (Metal-Halide) lamps. We were able to improve the input power factor by using a PFC IC. To provide the lamp with the rated voltage required, we used the buck-type dc-dc converter. The stress of the switching devices in the inverter could be reduced by this method. To eliminate the acoustic resonance phenomena of MH lamps, the voltage of the lamp added the high frequency sine-wave to the low frequency square-wave by using the full bridge typed inverter. We have developed a simple igniter using the L and C elements. We could control the dimness of the lamp by varying the output voltage of the buck converter. The buck converter output voltage could be controlled by using a microprocessor.

• The Transactions of the Korean Institute of Electrical Engineers
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• v.43 no.5
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• pp.761-769
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• 1994

VCB (Vacuum Circuit Breaker), with the strong arc extinction capability in switching the source of an induction motor, occurs the severe switching surge voltage which can cause the breakdown or the deterioration of motor insulation. Therefore, a method which reduces surge voltage across motor windings is necessary. So, it is analyzed that fast-rise-time surges resulting from VCB switching operations give rise to severe voltage stress on turn insulation. Additionally, the switching surge simulation algorithms using EMTP are developed, and C, R values of surge suppressor minimizing the steep-fronted stress in winding insulation surges are calculated.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.15 no.2
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• pp.190-197
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• 2002

In this thesis, ZnO varistors with various formulation, such as A∼E, were fabricated according to ceramic fabrication method. The microstructure, electrical properties, and surge characteristics of ZnO varistors were investigated according to ZnO varistors with various formulation. In the microstructure, A∼E\`s ZnO varistor ceramics sintered at 1130$\^{C}$ was consisted of ZnO grain(ZnO), spinel phase (Zn$\_$2.33/Sb$\_$0.67/O$\_$4/), Bi-rich phase(Bi$_2$O$_3$) and intergranuler phase, wholly. Lightning impulse residual voltage of A, B, C and E\`s ZnO varistors suited standard characteristics, below 12kV at current of 5kA. On the contrary, D\`s ZnO varistor exhibited high residual voltage as high reference voltage. In the accelerated aging test, leakage current and watt loss of B, C and D\`s ZnO varistors increases abruptly with stress time under the first a.c. stress(115$\^{C}$/3.213kV/300h). Consequently, C varistor exhibited a thermal run away. On the contrary, leakage current and watt loss of A and C\`s ZnO varistors which show low initial leakage current exhibited constant characteristics. After high current impulse test, A\`s ZnO varistor has broken the side of varistor but impulse current flowed. On the contrary, E\`s ZnO Varistor exhibited good discharge characteristics which the appearance of varistor was not wrong such as puncture, flashover, creaking and other significant damage. After long duration impulse current test, E\`s ZnO varistor exhibited good discharge characteristics which the appearance of varistor was not wrong such as puncture, flashover, creaking and other significant damage. After high current impulse test and long duration impulse current test, E\`s ZnO varistor exhibited very good characteristics which variation rate of residual voltage is 1.4% before and after test.

• JSTS:Journal of Semiconductor Technology and Science
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• v.14 no.5
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• pp.543-548
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• 2014

In this paper, the dielectric relaxation and reliability of high capacitance density metal-insulator-metal (MIM) capacitors using $Al_2O_3-HfO_2-Al_2O_3$ and $SiO_2-HfO_2-SiO_2$ sandwiched structure under constant voltage stress (CVS) are characterized. These results indicate that although the multilayer MIM capacitor provides high capacitance density and low dissipation factor at room temperature, it induces greater dielectric relaxation level (in ppm). It is also shown that dielectric relaxation increases and leakage current decreases as functions of stress time under CVS, because of the charge trapping effect in the high-k dielectric.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.11a
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• pp.369-370
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• 2008

This paper describes the electric field distribution of high voltage polymer bushing with inner field shaper designs. The field control can be achieved by means of the designs of such internal field shaper. But high electric stress occurred between field shaper and central conductor by the closely space. In accordance, the floating and ring shield designs was importance for electric stress grading at critical parts of the bushing. The bushing has a central conductor, and internal ring shield or floating shield, gaps are formed between field shaper and ring shield. Accordance equipotential lines extend through gaps. Maxwell 2D simulator based on the boundary element method was also introduced in order to verify the reliability of the polymer bushing.

• Proceedings of the KIEE Conference
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• 2006.07b
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• pp.1065-1066
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• 2006

The multi-resonant converter minimizes the parasitic oscillations using the resonant tank circuit absorbed parasitic reactances in a converter. So the converter can be operated at a high frequency and it provides a high efficiency because the switching power losses are reduced effectively. However, the high resonant voltage stress of semiconductors leads to the conduction loss. In this paper, it is proposed the novel flyback multi-resonant converter. The converter input is divided by two series input capacitors. And also the resonant stress is reduced to 2-3 times input voltage without any complexity and it provides the various circuit schemes in lots of applications. The proposed converters are verified through simulation and experiment.

• Journal of Power Electronics
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• v.14 no.4
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• pp.621-631
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• 2014

To invigorate the tapped-inductor boost (TIB) topology in emerging high step-up applications for off-grid products, a lossless snubber consisting of two capacitors and three diodes is proposed. Since the switch voltage stress is minimized in the proposed circuit, it is allowed to use a device with a lower cost, higher efficiency, and higher availability. Moreover, since the leakage inductance is fully utilized, no effort to minimize it is required. This allows for a highly productive and cost-effective design of the tapped-inductor. The proposed circuit also shows a high step-up ratio and provides relaxation of the switching loss and diode reverse-recovery. In this paper, the operation is analyzed in detail, the steady-state equation is derived, and the design considerations are discussed. Some experimental results are provided to confirm the validity of the proposed circuit.

• Journal of Power Electronics
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• v.19 no.4
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• pp.846-857
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• 2019

Voltage step-down converters are very popular in distributed power systems, voltage regular modules, electric vehicles, etc. However, a high step-down voltage ratio is required in many applications to prevent the traditional buck converter from operating at extreme duty cycles. In this paper, a series capacitor interleaved buck converter with a soft switching technique is proposed. The DC voltage ratio of the proposed converter is half that of the traditional buck converter and the voltage stress across the one main switch and the diodes is reduced. Moreover, by paralleling the series connected auxiliary switch and the auxiliary inductor with the main inductor, zero voltage transition (ZVT) of the main switches can be obtained without increasing the voltage or current stress of the main power switches. In addition, zero current turned-on and zero current switching (ZCS) of the auxiliary switches can be achieved. Furthermore, owing to the presence of the auxiliary inductor, the turned-off rate of the output diodes can be limited and the reverse-recovery switching losses of the diodes can be reduced. Thus, the efficiency of the proposed converter can be improved. The DC voltage gain ratio, soft switching conditions and a design guideline for the critical parameters are given in this paper. A loss analysis of the proposed converter is shown to demonstrate its advantages over traditional converter topologies. Finally, experimental results obtained from a 100V/10V prototype are presented to verify the analysis of the proposed converter.

• Korean Journal of Materials Research
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• v.24 no.6
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• pp.326-337
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• 2014

The use of solar energy generation is steadily increasing, and photovoltaic modules are connected in series to generate higher voltage and power. However, solar panels are exposed to high-voltage stress (up to several hundreds of volts) between grounded module frames and the solar cells. Frequent high-voltage stress causes a power-drop in the modules, and this kind of degradation is called potential induced degradation (PID). Due to PID, a significant loss of power and performance has been reported in recent years. Many groups have suggested how to prevent or reduce PID, and have tried to determine the origin and mechanism of PID. Even so, the mechanism of PID is still unclear. This paper is focused on understanding the PID of crystalline-silicon solar cells and modules. A background for PID, as well as overviews of research on factors accelerating PID, mechanisms involving sodium ions, PID test methods, and possible solutions to the problem of PID, are covered in this paper.