Electrical and Reliability properties of MOS capacitors with $N_{2}O$ oxides
($N_{2}O$ 산화막을 갖는 MOS 캐패시터의 전기적 및 신뢰성 특성)
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- Journal of the Korean Institute of Telematics and Electronics A
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- v.31A no.6
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- pp.117-127
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- 1994