• Title/Summary/Keyword: field emission microscopy

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Deposition of Carbon Thin Film using Laser Ablation and Its Field Emission Properties (레이저 증착법에 의한 탄소계 박막의 구조 및 전계방출특성)

  • ;Kenjiro Oura
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.15 no.7
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    • pp.634-639
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    • 2002
  • Using laser ablation technique carbon thin films were deposited on Si(100) substrate as a function of substrate temperature. In this study, the surface morphologic, structural and field emission properties of these carbon thin films were investigated using Raman spectroscopy, scanning electron microscopy, and a diode technique, respectively. With increasing of the substrate temperature, the surface morphologies were changed significantly. Moreover, the intensity of D-band and the full width at half maximum of these bands were dependent on substrate temperatures. As the substrate temperature was increased, the field emission properties were improved. As the result, we find that the field emission properties of the films were changed significantly with the substrate temperature and structural features of carbon than films.

Epoxylite Influence on Field Electron Emission Properties of Tungsten and Carbon Fiber Tips

  • Alnawasreh, Shady S;Al-Qudah, Ala'a M;Madanat, Mazen A;Bani Ali, Emad S;Almasri, Ayman M;Mousa, Marwan S
    • Applied Microscopy
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    • v.46 no.4
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    • pp.227-237
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    • 2016
  • This investigation deals with the process of field electron emission from composite microemitters. Tested emitters consisted of a tungsten or carbon-fiber core, coated with a dielectric material. Two coating materials were used: (1) Clark Electromedical Instruments Epoxylite resin and (2) Epidian 6 Epoxy resin (based on bisphenol A). Various properties of these emitters were measured, including the current-voltage characteristics, which are presented as Fowler-Nordheim plots, and the corresponding electron emission images. A field electron microscope with a tip (cathode) to screen (anode) distance of 10 mm was used to electrically characterize the emitters. Measurements were carried out under ultra-high vacuum conditions with a base pressure of $10^{-6}$ Pascal ($10^{-8}$ mbar).

Switch-on Phenomena and Field Emission from Multi-Walled Carbon Nanotubes Embedded in Glass

  • Bani Ali, Emad S;Mousa, Marwan S
    • Applied Microscopy
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    • v.46 no.4
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    • pp.244-252
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    • 2016
  • This paper describes a new design of carbon nanotube tip. $Nanocly^{TM}$ NC 7000 Thin Multiwall Carbon Nanotubes of carbon purity (90%) and average diameter tube 9.5 nm with a high aspect-ratio (>150) were used. These tips were manufactured by employing a drawing technique using a glass puller. The glass microemitters with internal carbon nanotubes show a switch-on effect to a high current level (1 to $20{\mu}A$). A field electron microscope with a tip (cathode)-screen (anode) separation at ~10 mm was used to characterize the electron emitters. The system was evacuated down to a base pressure of ${\sim}10^{-9}$ mbar when baked at up to ${\sim}200^{\circ}C$ overnight. This allowed measurements of typical Field Electron Emission characteristics; namely the current-voltage (I-V) characteristics and the emission images on a conductive phosphorus screen (the anode). Fowler-Nordheim plots of the current-voltage characteristics show current switch-on for each of these emitters.

In-situ TEM of Carbon Nanotube Field Emitters and Improvement of Electron Emission from Nanotube Films by Laser Treatment

  • Saito, Yahachi;Seko, Kazuyuki;Kinoshita, Jun-ichi;Ishida, Toshiyuki;Yotani, Junko;Kurachi, Hiroyuki;Uemura, Sashiro
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07b
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    • pp.1081-1086
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    • 2005
  • Dynamic behavior of carbon nanotubes (CNTs) in an electric field is directly observed by in-situ transmission electron microscopy (TEM). The CNT field emitters examined by in-situ TEM are multiwalled, double-walled and single walled CNTs. Threshold fields for electron emission and sustainable emission currents depending on the structure of CNTs are presented, and degradation mechanism of the CNT field emitters is discussed. In addition to the microscopy studies on individual CNTs, our recent development in surface treatment of CNT layers grown by chemical vapor deposition, which brings about high density of emission current and high uniformity, is also presented.

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A Study on the Cathodoluminescence and Structure of Thin Film $ZnGa_2O_4:Mn$ Oxide Phosphor (박막형 $ZnGa_2O_4:Mn$ 산화물 형광체의 음극선루미느센스와 구조적 특성에 관한 연구)

  • Kim, Joo-Han;Holloway Paul H.
    • Journal of the Korean Vacuum Society
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    • v.15 no.5
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    • pp.541-546
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    • 2006
  • In this study we have investigated cathodoluminescence (CL) and structural properties of thin film $ZnGa_2O_4:Mn$ oxide phosphor by using field emission scanning electron microscopy (FESEM), atomic force microscopy (AFM), photoluminescence (PL), and cathodoluminescence. PL emission peaked at 506 nm was observed from the $ZnGa_2O_4:Mn$ phosphor target and it was attributed to the $^4T_1-^6A_1$ transition in $Mn^{2+}$ ion. The color coordinates of the emission were x = 0.09 and y = 0.67. The $ZnGa_2O_4:Mn$ films showed the excitation spectrum peaked at 294 nm by $Mn^{2+}$ ion absorption. It was found that the higher intensity of CL emission at 505 nm appears to result from the denser and closely-packed structure in $ZnGa_2O_4:Mn$ phosphor films deposited at lower pressures. The CL intensity did not show any systematic dependence on film surface roughness.

Field-emission properties of carbon nanotubes coated by zinc oxide films (산화아연막이 증착된 탄소 나노튜브의 전계방출 특성)

  • Kim, Jong-Pil;Noh, Young-Rok;Lee, Sang-Yeol;Park, Jin-Seok
    • Proceedings of the KIEE Conference
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    • 2009.07a
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    • pp.1270_1271
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    • 2009
  • In this research, gallium-incorporated zinc oxide (ZnO:Ga) thin films have been used as a coating material for enhancing the field-emission property of CNT-emitters. Multi-walled CNTs were directly grown on conical-type ($250{\mu}m$ in diameter) metal-tip substrates at $700^{\circ}C$ by inductively coupled plasma-chemical vapor deposition (ICP-CVD). The pulsed laser deposition (PLD) technique was used to produce 5wt% gallium-doped ZnO (5GZO) films with very low stress. The structural properties of ZnO and 5GZO coated CNTs were characterized by Raman spectroscopy. Field emission scanning electron microscopy (FESEM) and high-resolution transmission electron microscopy (HRTEM) were also used to monitor the variation in the morphology and microstructure of CNTs before and after 5GZO-coating. The measurement of the field emission characteristics showed that the emitter that coated the 5GZO (10nm) on CNTs exhibited the best performance: a maximum emission current of $325{\mu}A$, a threshold field of 2.2 V/${\mu}m$.

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Switch-on Phenomena and Field Emission from Single-Walled Carbon Nanotubes Embedded in Glass

  • Daradkeh, Samer I.;Mousa, Marwan S.
    • Applied Microscopy
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    • v.47 no.3
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    • pp.86-94
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    • 2017
  • In this study, we will describe a new design of carbon nanotubes tip. Single-walled carbon nanotubes produced using high-pressure CO over Fe particles (HiPCO) at CNI, Houston, TX used in this study. These tips were manufactured by employing a drawing technique using glass puller. Field electron microscopies with tips (cathode) to screen (Anode) separation of ~10 mm was used to characterize the electron emitters. The system was evacuated down to base pressure of (${\sim}10^{-8}$ mbar) when baked at up to (${\sim}200^{\circ}C$) over night. An electron field emission patterns, as well as current versus voltage characteristics and Fowler-Nordheim plots, are discussed.

Field Emission Characteristics of Deffctive Diamond Films

  • Koh, Ken-Ha;Park, Kyung-Ho;Lee, Soon-Il
    • Journal of the Korean Vacuum Society
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    • v.7 no.s1
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    • pp.160-166
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    • 1998
  • The field emission characteristics of defective diamond films grown by microwave plasma enhanced chemical vapor deposition (MPECVD) have been studied. X-ray diffraction, the poor crystal quality and/or small grain sizes of the diamond phase and the inclusion of the non-diamond carbon phases in these films have been condirmed by raman spectroscopy, scanning electron microscopy, atomic force microscopy, and the reflectance measurements. The degrees of the film defectiveness and the emission characteristics were dependent on the methane concentration. Current-versus-voltage measurements have demonstrated that the defective diamond films have good electron emission characteristics. characteristics strongly suggests the defect-related electron-emission mechanism. The defective diamond films deposited on Si substrates show the field emission current density of 1$\mu\textrm{A}/\textrm{cm}^2$ and 1mA/$\textrm{cm}^2$ have been measured at electric fields as low as 4.5V/$\mu\textrm{m}$ and 7.6V/$\mu\textrm{m}$, respectively. We also observed the similar emission characteristics from the defective diamond film deposited on Cr/Si substrate and could decrease the deposition temperature to $600^{\circ}C$.

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졸-겔 방법을 이용한 BaGd2TiO13 구조의 제작

  • Lee, Su-Hyeon;Ramana, D.K. Venkata;Yu, Jae-Su
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.424-424
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    • 2013
  • Ce3+, Sm3+, Eu3+, Tb3+ 등 희토류를 도핑한 여러 종류의 형광체는 백색 LED (white light-emitting diode), 전계방출표시소자(field emission display), 플라즈마디스플레이패널(plasma display panel), 약물 운송(drug delivery) 등 다양한 분야에서 응용되고 있다. 최근에는 졸-겔 방법(sol-gel method)을 이용하여Y2SiO5, Y3-XGdxAl5O12, SrAl2O4 등 여러 종류의 호스트 물질을 합성하여 형광체의 특성을 분석하는 연구가 활발히 진행되고 있다. 이러한 졸-겔 방법은 비교적 낮은 온도에서 간단한 공정으로 좋은 균질성과 높은 생산성을 갖도록 형광체를 제작할 수 있는 장점을 가지고 있다. 이에 본 연구에서는 졸-겔 방법을 이용하여 BaGd2TiO13구조를 제작하였고, 이러한 구조적, 광학적 특성을 분석하기 위하여 열분석기(thermal analyzer), 전계방출형주사전자현미경(field emission scanning electron microscopy), 투과전자현미경(field emission transmission electron microscopy)을 이용하였다. 이러한 졸-겔 방법을 이용하여 제작한 BaGd2TiO13 구조의 형광체 적용 연구를 통한 디스플레이 및 백색 LED 응용에 유용할 것으로 기대된다.

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