• Journal of Information Technology Applications and Management
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• 제28권4호
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• pp.13-20
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• 2021

In this paper, I was applied the life distribution following linear failure rate distribution, Lindley distribution and Burr-Hatke exponential distribution extensively used in the arena of software reliability and were associated the reliability possessions of the software using the nonhomogeneous Poisson process with finite failure. Furthermore, the average value functions of the life distribution are non-increasing form. Case of the linear failure rate distribution (exponential distribution) than other models, the smaller the estimated value estimation error in comparison with the true value. In terms of accuracy, since Burr-Hatke exponential distribution and exponential distribution model in the linear failure rate distribution have small mean square error values, Burr-Hatke exponential distribution and exponential distribution models were stared as the well-organized model. Also, the linear failure rate distribution (exponential distribution) and Burr-Hatke exponential distribution model, which can be viewed as an effectual model in terms of goodness-of-fit because the larger assessed value of the coefficient of determination than other models. Through this study, software workers can use the design of mean square error, mean value function as a elementary recommendation for discovering software failures.

• Journal of the Korean Data and Information Science Society
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• 제14권2호
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• pp.143-152
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• 2003

A data set having missing observations is often completed by using imputed values. In this paper, performances and accuracy of five imputation procedures are evaluated when missing values exist only on the response variable in the exponential regression model. Our simulation results show that adjusted exponential regression imputation procedure can be well used to compensate for missing data, in particular, compared to other imputation procedures. An illustrative example using real data is provided.

• 한국전자통신학회논문지
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• 제17권4호
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• pp.641-648
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• 2022

본 연구에서는 지수 형태의 분포(Exponential Basic, Inverse Exponential, Lindley, Rayleigh) 특성을 갖는 NHPP 소프트웨어 신뢰성 모형의 성능을 비교 분석하였고, 이를 근거로 최적의 신뢰성 모형도 함께 제시하였다. 소프트웨어 고장 현상을 분석하기 위하여 시스템 운영 중 수집된 고장 시간 데이터를 사용하였고, 모수 추정은 최우 추정 법을 적용하여 해결하였다. 다양한 비교 분석(평균제곱오차(MSE) 분석, 평균값 함수의 참값 예측력 분석, 강도 함수의 평가, 임무 시간을 적용한 신뢰도를 평가)을 통하여 Lindley 모형이 가장 우수한 성능을 가진 효율적인 모형임을 알 수 있었다. 본 연구를 통하여 기존 연구사례가 없는 지수 형태의 특성을 갖는 분포의 신뢰도 성능을 새롭게 파악하였고, 이를 통하여 소프트웨어 개발자들이 초기 단계에서 활용할 수 있는 기본적인 설계 데이터를 제시할 수 있었다.

• Ocean Systems Engineering
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• 제1권2호
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• pp.121-130
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• 2011

One of the prevailing models that describe the stress corrosion is represented by an exponential dependence between rate of corrosion and stress, suggested by Gutman, Zainullin and Zuripov. This study revisits the exponential model and derives analytical expressions for the structures' durability which is postulated as the time for stress level to reach its yield value. Comparison is conducted with other possible models, namely with linear, quadratic or cubic cases.

• Journal of the Korean Data and Information Science Society
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• 제16권4호
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• pp.923-931
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• 2005

The two parameter generalized exponential distribution was recently introduced by Gupta and Kundu (1999). It is observed that the generalized exponential distribution can be used quite effectively to analyze skewed data set. This paper develops the accelerated life test model using generalized exponential distribution and considers maximum likelihood estimation of parameters under the tampered random variable model. To show the performance of proposed maximum likelihood estimates, some simulation will be performed. Using a real data set, an example will be given.

• 반도체디스플레이기술학회지
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• 제19권1호
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• pp.61-66
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• 2020

Threshold voltage shift occurring during operation is implemented in a SPICE simulation tool. Among the shift models the stretched-exponential function model, which is frequently observed from both single-crystal silicon and thin-film transistors regardless of the nature of causes, is selected, adapted to transient simulation, and added to BSIM4 developed by BSIM Research Group at the University of California, Berkeley. The adaptation method used in this research is to select degradation and recovery models based on the comparison between the gate and threshold voltages. The threshold voltage shift is extracted from SPICE transient simulation and shows the stretched-exponential time dependence for both degradation and recovery situations. The implementation method developed in this research is not limited to the stretched-exponential function model and BSIM model. The proposed method enables to perform transient simulation with threshold voltage shift in situ and will help to verify the reliability of a circuit.

• 상하수도학회지
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• 제16권6호
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• pp.710-716
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• 2002

A General Pipe Break Prediction Model that incorporates linear and exponential models in its form is developed. The model is capable of fitting pipe break trends that have linear, exponential or in between of linear and exponential trend by using a weighting factor. The weighting factor is adjusted to obtain a best model that minimizes the sum of squared errors of the model. The model essentially plots a best curve (or a line) passing through "cumulative number of pipe breaks" versus "break times since installation of a pipe" data points. Therefore, it prevents over-predicting future number of pipe breaks compared to the conventional exponential model. The optimal replacement time equation is derived by using the Threshold Break Rate equation by Loganathan et al. (2002).

• 통합자연과학논문집
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• 제10권4호
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• pp.249-257
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• 2017

The main focus when developing software is to improve the reliability and stability of a software system. We are enjoying a very comfortable life thanks to modern civilization, however, comfort is not guaranteed to us. Once software systems are introduced, the software systems used in the field environments are the same as or close to those used in the development-testing environment; however, the systems may be used in many different locations. Development of software system is a difficult and complex process. Generally, existing software reliability models are applied to software testing data and then used to make predictions on the software failures and reliability in the field. In this paper, we present an improved exponential NHPP software reliability model in different development environments, and examine the goodness-of-fit of improved exponential model and other model based on two datasets. The results show that the proposed model fits significantly better than other NHPP software reliability model.

• 정보학연구
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• 제10권2호
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• pp.47-64
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• 2007

Finite failure NHPP models presented in the literature exhibit either constant, monotonic increasing or monotonic decreasing failure occurrence rates per fault. Accurate predictions of software release times, and estimation of the reliability and availability of a software product require quantification of a critical element of the software testing process : test coverage. This model called enhanced non-homogeneous poission process(ENHPP). In this paper, exponential coverage and S-coverage model was reviewed, proposes the exponentiated exponential coverage reliability model, which maked out efficiency substituted for gamma and Weibull model(2 parameter shape illustrated by Gupta and Kundu(2001). In this analysis of software failure data, algorithm to estimate the parameters used to maximum likelihood estimator and bisection method, model selection based on SSE statistics for the sake of efficient model, was employed.

• 응용통계연구
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• 제23권6호
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• pp.1125-1145
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• 2010

For modeling(skewed) semicircular data, we derive a new exponential family of distributions. We extend it to the l-axial exponential family of distributions by a projection for modeling any arc of arbitrary length. It is straightforward to generate samples from the l-axial exponential family of distributions. Asymptotic result reveals that the linear exponential family of distributions can be used to approximate the l-axial exponential family of distributions. Some trigonometric moments are also derived in closed forms. The maximum likelihood estimation is adopted to estimate model parameters. Some hypotheses tests and confidence intervals are also developed. The Kolmogorov-Smirnov test is adopted for a goodness of t test of the l-axial exponential family of distributions. Samples of orientations are used to demonstrate the proposed model.