• Journal of the Korean Data and Information Science Society
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• v.7 no.1
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• pp.37-46
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• 1996

In this paper, we introduce the goodness of fit test procedure for lifetime distribution using step stress accelerated lifetime data. Using the nonpapametric estimate of acceleration factor, we prove the strong consistence of empirical distribution function under null hypothesis. The critical vailues of Kolmogorov-Smirnov, Anderson-Darling, Cramer-von Mises statistics are computed when the lifetime distibution is assumed to be exponential and Weibull. The power of test statistics are compared through Monte-Cairo simulation study.

• Journal of Korean Institute of Industrial Engineers
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• v.14 no.2
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• pp.91-97
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• 1988

In accelerated life testing, a relationship is usually assumed between the stress and a parameter of the lifetime distribution. However, the true relationship is not usually known, and therefore, the experimenter may wish to provide protections against the likely departures from the assumed relationship. This paper considers an accelerated life test in which two stress levels are involved, and the lifetime of each test item at a stress level is assumed to have an independent, identical, exponential distribution. For the case where a first order relationship is assumed while the true one is quadratic, a procedure is developed for allocating test items to stress levels such that the bias and/or the variance of the estimated(log-transformed) mean lifetime at the use condition is minimized.

• Journal of Applied Reliability
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• v.7 no.3
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• pp.119-126
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• 2007

This paper deals with (s, S) spare part inventory model. Maintaining appropriate spare parts is one of the most important military affairs related to the readiness of military forces. In the problem under consideration, a military unit possesses n equipments and all the n equipments should be in operational readiness for the military purpose. The lifetime distribution of a part has been assumed to be exponential. This paper suggests the reorder point and order quantity under the assumption that the lifetime distribution of a part is weibull.

• Communications for Statistical Applications and Methods
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• v.24 no.3
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• pp.227-240
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• 2017

In this paper, we introduce the inverted exponentiated Weibull (IEW) distribution which contains exponentiated inverted Weibull distribution, inverse Weibull (IW) distribution, and inverted exponentiated distribution as submodels. The proposed distribution is obtained by the inverse form of the exponentiated Weibull distribution. In particular, we explain that the proposed distribution can be interpreted by Marshall and Olkin's book (Lifetime Distributions: Structure of Non-parametric, Semiparametric, and Parametric Families, 2007, Springer) idea. We derive the cumulative distribution function and hazard function and calculate expression for its moment. The hazard function of the IEW distribution can be decreasing, increasing or bathtub-shaped. The maximum likelihood estimation (MLE) is obtained. Then we show the existence and uniqueness of MLE. We can also obtain the Bayesian estimation by using the Gibbs sampler with the Metropolis-Hastings algorithm. We also give applications with a simulated data set and two real data set to show the flexibility of the IEW distribution. Finally, conclusions are mentioned.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.30 no.9
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• pp.551-557
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• 2017

It is extremely important to improve methodologies for the lifetime assessment of porcelain insulators. While there has been a considerable amount of work regarding the phenomena of lifetime distributions, most of the studies assume that aging distributions follow the Weibull distribution. However, the true underlying distribution is unknown, giving rise to unrealistic inferences, such as parameter estimations. In this article, we review several distributions that are commonly used in reliability and survival analysis, such as the exponential, Weibull, log-normal, and gamma distributions. Some properties, including the characteristics of failure rates of these distributions, are presented. We use a Bayesian approach for model selection and parameter estimation procedures. A well-known measure, called the Bayes factor, is used to find the most plausible model among several contending models. The posterior mean can be used as a parameter estimate for unknown parameters, once a model with the highest posterior probability is selected. Extensive simulation studies are performed to demonstrate our methodologies.

• Journal of the Korean Data and Information Science Society
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• v.5 no.2
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• pp.75-85
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• 1994

In this paper, I introduce the goodness-of-fit test statistics for exponential distribution using accelerated life test data. The ALT lifetime data were obtained by assuming step-stress ALT model, specially TRV model introduced by DeGroot and Goel(1979). The critical values are obtained for proposed test statistics, Kolmogorov-Smirnov, Kuiper, Watson, Cramer-von Mises, Anderson-Darling type, under various sample sizes and significance levels. The powers of the five test statistic are compared through Monte-Cairo simulation technique.

• Journal of Korean Society for Quality Management
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• v.23 no.4
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• pp.13-27
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• 1995

This paper considers the design of life test sampling plans based on Type II censored accelerated life tests. The lifetime distribution of products is assumed to be exponential. An estimator of acceleration factor between use condition stress and an accelerated level of stress higher than use condition stress is assumed to be known. The critical value for lot acceptance and the number of failure before censoring which satisfy the producer's and consumer's risk requirements are determined. The properties of the proposed life test sampling plans are investigated.

• Journal of the Korean Statistical Society
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• v.23 no.2
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• pp.421-444
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• 1994

Reliability acceptance sampling is concerned with whether to accept or reject a collection of items based upon the information obtained from life testing. Although various reliability acceptance sampling plans have been developed, little is known about their relatvie performances. This paper compares reliability acceptance sampling plans under Type II censoring, Hybrid censoring, and Time-Truncated Type II censoring assuming that the lifetimes of items in a lot follow an exponential distribution. The three plans are compared in terms of the power, the expected number of failures, and the expected time required to reach a decision. Computational experiments are conducted and the results are tabulated to provide guidelines for selecting an appropriate plan for a given situation.

• Journal of Korean Institute of Industrial Engineers
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• v.17 no.1
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• pp.95-108
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• 1991

For the case where the lifetime at a constant stress level has exponential distribution, optimal accelerated life test plans are developed under the assumptions of intermittent inspection and Type I censoring. In a optimal plan, the low and high stress levels, the proportion of test units allocated and the inspection times at each stress are determined such that the asymptotic variance of the maximum likelihood estimator of logarithmic transformed mean at the use condition is minimized. In addition to the optimal plan in which numerical technique to solve the set of nonlinear equations must be employed to determine inspection times at each stress level, we also propose another plans which employ equally-spaced or equal probability inspection schemes at two overstress levels of corresponding optimal one. For both optimal and proposed plans, computational results indicate that the asymptotic variance of the estimated mean at the use stress is insensitive to number of inspections at overstress levels for the range of parameter values considered.

• Journal of the Korean Data and Information Science Society
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• v.21 no.4
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• pp.813-818
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• 2010

The least squares estimation method for model parameters under failure step-stress accelerated life tests is studied and a numerical example will be given to illustrate the proposed inferential procedures under the compound linear plans proposed as an alternative to the optimal quadratic plan, assuming that the exponential distribution with a quadratic relationship between stress and log-mean lifetime. The proposed compound linear plan for constant stress accelerated life tests and 4:2:1 plan are compared for various situations. Even though the compound linear plan was proposed under constant stress accelerated life tests, we found that this plan did well relatively in failure step-stress accelerated life tests.